Abstract:
An image sensor and a method for manufacturing an image sensor that has an increased aspect ratio. An image sensor and a method for manufacturing an image sensor that have a relatively large process margin (e.g. even in high level pixels), which may reduce and/or eliminate restrictions in downscaling an image sensor. An image sensor may include at least one of a first unit pixel including a first transfer transistor, a second unit pixel including a second drive transistor, and a contact electrically connecting a floating diffusion region of the first unit pixel with the second drive transistor of the second unit pixel. A method of manufacturing an image sensor including at least one of forming a first unit pixel including a first transfer transistor, forming a second unit pixel including a second drive transistor, and forming a contact electrically connecting a floating diffusion region of the first unit pixel with the second drive transistor of the second unit pixel.
Abstract:
A thermal type image forming apparatus is provided for printing images on both sides of a medium, which are a first surface and a second surface of the medium. A thermal print head (TPH) is rotated about a platen roller to a first position facing the first surface of the medium and to a second position facing the second surface of the medium. The thermal type image forming apparatus includes a transfer unit for transferring the medium in a first direction to supply the medium to a space between the platen roller and the thermal print head and in a second direction substantially opposite to the first direction to perform printing. A control member controls motion of the platen roller in the second direction to align a printing nip formed by the platen roller and the TPH with a heating line of the thermal print head. The platen roller is elastically biased in a direction to contact the control member.
Abstract:
Provided are an electronic cooling device and a fabrication method thereof. The method may include forming an insulating layer on a semiconductor substrate, forming first and second silicide layers on the insulating layer, forming separate paired p-type and n-type semiconductors on each of the first and second silicide layers, forming a first interlayer dielectric (ILD) layer on the p-type and n-type semiconductors, exposing top surfaces of the n-type and p-type semiconductors, forming a third silicide layer on one semiconductor on each of the first and second silicide layers, forming a second ILD layer on the third silicide layer, and etching the second and first ILD layers to form contact holes exposing top surfaces of the first and second silicide layers.
Abstract:
A CMOS image sensor and a method for fabricating the same are disclosed, in which the boundary between an active region and a field region is not damaged by ion implantation. The method for fabricating a CMOS image sensor includes forming a trench in a first conductive type semiconductor substrate, forming a first conductive type heavily doped impurity ion region in the semiconductor substrate at both sides of the trench, forming a device isolation film by interposing an insulating film between the trench and the device isolation, sequentially forming a gate insulating film and a gate electrode on the semiconductor substrate, and forming a second conductive type impurity ion region for a photodiode in the semiconductor substrate between the gate electrode and the device isolation film.
Abstract:
A lead frame type stack package in which a lead of the package is well connected to a semiconductor module, and a method of fabricating the same are provided. A lead of an upper package and a lead of a lower package are connected using laser soldering. Since leads of the upper and lower packages are connected by solder balls without the use of a soldering pot, loss of a plating layer of the lead due to solder dipping is prevented and the leads are well connected without soldering defects when connecting the lead of the lower package to a connection pad of a semiconductor module substrate.
Abstract:
A backlight unit includes a lamp to generate and radiate an ultraviolet ray, a light guide plate including a light receiving portion to receive the ultraviolet ray, an optical sheet disposed on the light guide plate to change the ultraviolet ray into a visible ray, the optical sheet including a fluorescent material, and a reflective sheet arranged under the light guide plate.
Abstract:
A backlight unit and a liquid crystal display having the backlight are provided. The backlight unit includes a plurality of light emitting diode (LED) chips, a light guide plate for converting light generated from the LED chips into surface light, and a plurality of optical guide modules corresponding to the respective LED chips and disposed between the LED chips and the light guide plate.
Abstract:
A camera including a lens protection cap is provided. The camera includes a case, a lens, a power switch, and the lens protection cap. The lens is located inside the case and exposed toward a front side. The power switch is provided on the outer surface of the case, for turning the power on/off, and the lens protection cap is provided to prevent damage of the lens by shielding the lens when the power is turned off. The power switch and the lens protection cap are directly connected with each other to allow the lens protection cap to expose/shield the lens when the power switch is on/off-operated.
Abstract:
A CMOS image sensor and a manufacturing method thereof, wherein the gates of several transistors of the CMOS image sensor are formed in an active region defined by an isolation region for a unit pixel of the CMOS image sensor, and a passivation layer composed of insulating layer is formed on the semiconductor substrate. Impurities are ion-implanted into the active region to form one or more diffusion regions of a photo diode of the CMOS image sensor, wherein the passivation layer prevents a boundary portion of the active region from being ion-implanted. Thus, damages by ion implantation at the boundary portion between the diffusion region for the photo diode and the isolation region are prevented, and the dark current of the CMOS image sensor is reduced.
Abstract:
A flash memory cell and fabrication method thereof are disclosed. An example fabrication method deposits a pad oxide layer and a pad nitride layer on a semiconductor substrate, patterns the pad nitride layer, implants ions into the substrate to form an ion implant region, forms spacers on sidewalls of the pad nitride layer pattern, removes some part of the pad oxide layer and the top portion of the substrate through an etching process using the spacers as a mask to form a trench that divides the ion implant region into two parts. The example fabrication method also forms a gap filling insulating layer over the resulting substrate, and forms a trench isolation layer and junction regions simultaneously by removing the spacers, the pad nitride layer pattern, the pad oxide layer, and the top portion of the gap filling insulating layer.