公开(公告)号：US20150009484A1

公开(公告)日：2015-01-08

申请号：US13935465

申请日：2013-07-03

Applicant: Mitutoyo Corporation

Inventor： David William Sesko

IPC: G01B11/14

CPC classification number: G01B11/14 ,  G01B11/007 ,  G01B2210/50

Abstract: A system and method for a chromatic probe detachment sensor is provided. A detachment signal element is included in an interchangeable optics element of a probe. The detachment signal element is configured to substantially transmit a first set of wavelengths corresponding to a measuring range, and at least partially reflect a set of detachment element wavelengths. In one implementation, the detachment signal element comprises a thin film coating such as a sharp edge filter. The detection of a detachment condition can thus be achieved using the existing probe electronics without requiring the addition of other external sensors or wiring to the probe or coordinate measuring machine that utilizes the probe. The sensing of a detachment condition may be utilized to halt further movement of the probe to minimize damage in the event of a collision.

Abstract translation: 提供了一种用于彩色探针脱离传感器的系统和方法。 分离信号元件包括在探针的可互换光学元件中。 分离信号元件被配置为基本上传输对应于测量范围的第一组波长，并且至少部分地反映一组分离元件波长。 在一个实施方式中，分离信号元件包括诸如尖锐边缘滤波器的薄膜涂层。 因此，可以使用现有的探针电子设备来实现分离条件的检测，而不需要向探头或使用探针的坐标测量机添加其它外部传感器或布线。 分离条件的检测可用于停止探针的进一步运动，以使碰撞事件中的损伤最小化。

公开(公告)号：US20150003494A1

公开(公告)日：2015-01-01

申请号：US14295781

申请日：2014-06-04

Applicant: MITUTOYO CORPORATION

Inventor： Yuichiro YOKOYAMA ,  Takeshi HAGINO

IPC: G01N25/16 ,  G01N1/44

CPC classification number: G01N25/16 ,  G01N1/44

Abstract: A temperature-controlled bath capable of swiftly changing the temperature of a sample to a target temperature and maintaining the temperature of the sample at a fixed temperature after the temperature change is provided. A temperature-controlled bath includes a temperature changing means, a temperature-controlled chamber, a sample holding chamber, and connection cut-off means. The temperature changing means is disposed in the temperature-controlled chamber, and the temperature of the temperature-controlled chamber is adjusted by the temperature changing means. The sample holding chamber is separated from the temperature-controlled chamber by a thermally conducive wall, and contains a sample therein. The connection cut-off means change a connection between the temperature-controlled chamber and the sample holding chamber to a connected state or a cut-off state.

Abstract translation: 提供能够迅速将样品温度改变到目标温度并且在温度变化之后将样品温度保持在固定温度的温度控制浴。 温度控制浴包括温度改变装置，温度控制室，样品保持室和连接切断装置。 温度调节装置设置在温度控制室中，温度控制室的温度由温度变化装置调节。 样品保持室通过热导壁从温度控制室分离，并在其中包含样品。 连接切断装置将温度控制室和样品保持室之间的连接改变为连接状态或截止状态。

公开(公告)号：US20140368726A1

公开(公告)日：2014-12-18

申请号：US13917581

申请日：2013-06-13

Applicant: Mitutoyo Corporation

Inventor： Paul Gerard Gladnick

IPC: H04N5/232 ,  G06T7/00

CPC classification number: H04N5/23212 ,  G01B11/0608 ,  G06T7/0004

Abstract: A machine vision inspection system comprising an illumination source and an imaging system and a method for performing high-speed focus height measurement operations. The method comprises: placing a workpiece in a field of view of the machine vision inspection system; determining a region of interest for focus height measurement operations; operating the illumination source to illuminate the workpiece with strobed illumination; periodically modulating a focus position of the imaging system along a Z-height direction proximate to the workpiece; collecting an image stack, wherein each image of the image stack corresponds to an instance of strobed illumination matched with a phase of the modulated focus position corresponding to an appropriate Z height within the image stack; and determining a Z-height measurement for at least one portion of the region of interest.

Abstract translation: 一种包括照明源和成像系统的机器视觉检查系统以及用于执行高速聚焦高度测量操作的方法。 该方法包括：将工件放置在机器视觉检查系统的视野内; 确定焦点高度测量操作的感兴趣区域; 操作照明光源以通过选通照明照亮工件; 沿着靠近工件的Z高度方向周期地调制成像系统的焦点位置; 收集图像堆叠，其中图像堆叠的每个图像对应于与对应于图像堆叠内的适当Z高度的调制聚焦位置的相位匹配的选通照明的实例; 以及确定感兴趣区域的至少一部分的Z高度测量。

公开(公告)号：US20140367560A1

公开(公告)日：2014-12-18

申请号：US14284902

申请日：2014-05-22

Applicant: MITUTOYO CORPORATION

Inventor： Fujio MAEDA

IPC: G01D5/347

CPC classification number: G01D5/34707 ,  G01D5/34746

Abstract: A scale for a photoelectric encoder includes a scale substrate and a reflection film formed at a predetermined pitch on the scale substrate. A surface of the reflection film forms a reflection surface. A low-reflection surface is formed by etching the scale substrate between reflection films. Accordingly, a scale can be provided which is lower in cost and has favorable yield rates.

Abstract translation: 光电编码器的标尺包括刻度尺基板和在刻度尺基板上以预定间距形成的反射膜。 反射膜的表面形成反射面。 通过在反射膜之间蚀刻刻度尺基板来形成低反射面。 因此，可以提供成本较低并且具有良好收率的标尺。

公开(公告)号：US20140362383A1

公开(公告)日：2014-12-11

申请号：US14291710

申请日：2014-05-30

Applicant: MITUTOYO CORPORATION

Inventor： Han HAITJEMA ,  Johannes Anna QUAEDACKERS ,  Adriaan Tiemen ZUIDERWEG

IPC: G01B9/02 ,  G01J1/02

CPC classification number: G01J1/02 ,  G01B9/02012 ,  G01B9/02067 ,  G01B9/0209 ,  G02B27/10 ,  G02B27/283

Abstract: An interferometer system to generate an interference signal of a surface of a sample includes a broadband illuminator to provide a broadband illumination beam, a beam splitter to split the broadband illumination beam in a reference beam for reflection on a reference reflector and a measurement beam for reflection on the surface of the sample, and a detector to receive an interference radiation intensity created between the reference beam reflected from the reference reflector and the reflected measurement beam from the surface of the sample to generate an interference signal. The interferometer system having a continuous variable broadband reflector in the beam splitter and/or the reference reflector to adjust the broadband radiation intensity balance between the measurement beam and the reference beam.

Abstract translation: 用于产生样品表面的干涉信号的干涉仪系统包括宽带照明器以提供宽带照明光束，分束器将参考光束中的宽带照明光束分离以用于参考反射器上的反射和用于反射的测量光束 以及检测器，用于接收由参考反射器反射的参考光束与来自样品表面的反射测量光束之间产生的干涉辐射强度，以产生干涉信号。 干涉仪系统在分束器和/或参考反射器中具有连续的可变宽带反射器，以调整测量光束和参考光束之间的宽带辐射强度平衡。

公开(公告)号：US20140362203A1

公开(公告)日：2014-12-11

申请号：US13912116

申请日：2013-06-06

Applicant: Mitutoyo Corporation

Inventor： Mark Lawrence Delaney ,  Paul Gerard Gladnick

IPC: H04N5/235 ,  H04N5/225

CPC classification number: H04N5/2354 ,  G01N21/00 ,  G01N21/8806 ,  G01N2021/8829 ,  H04N5/2256

Abstract: A method for controlling a structured illumination pattern generating portion is provided for illuminating a workpiece during an image acquisition by a camera in a precision machine vision inspection system. A controllable spatial light modulator (e.g., a digital light processing projector) is part of the generating portion for generating the structured illumination pattern. The pattern may comprise an array of stripes including a sinusoidal gray level intensity variation across each stripe. An overall image exposure is increased by repeating a complete structured illumination pattern generation iteration, including gray level variation, a plurality of times during an image integration period. Structured illumination microscopy techniques for determining a workpiece surface profile may benefit, wherein multiple (e.g., 3 or 4) images are acquired at respective focus positions to be analyzed, by using the method to project a different phase of a structured light pattern for each of the multiple images.

Abstract translation: 提供了一种用于控制结构化照明图案生成部分的方法，用于在精密机器视觉检查系统中通过照相机在图像采集期间照亮工件。 可控空间光调制器（例如，数字光处理投影仪）是用于生成结构化照明图案的生成部分的一部分。 该图案可以包括条纹阵列，其包括横跨每个条带的正弦灰度级强度变化。 通过在图像积分期间重复多次，包括灰度级变化，重复完整的结构化照明图案生成迭代来增加整体图像曝光。 用于确定工件表面轮廓的结构化照明显微镜技术可以受益，其中在要分析的各个焦点位置处获取多个（例如3或4）图像，通过使用该方法来投射每个的结构光图案的不同相位 多个图像。

公开(公告)号：US08898923B2

公开(公告)日：2014-12-02

申请号：US13706225

申请日：2012-12-05

Applicant: Mitutoyo Corporation

Inventor： Michael Nahum ,  Joseph D. Tobiason ,  Casey E. Emtman

IPC: G01B5/14 ,  G01D21/02 ,  G01L1/00

CPC classification number: G01D21/02 ,  G01B3/205 ,  G01L1/00 ,  G01L1/044 ,  G01L1/2206 ,  G01L5/0038 ,  G01L5/009

Abstract: An electrically powered caliper is provided which includes a scale member, a slider, a displacement sensor, a force sensing arrangement and a signal processing portion. The signal processing portion is configured to receive a force signal and indicate a respective force corresponding to the respective position of the slider. Force data is acquired comprising a plurality of respective forces corresponding to respective positions of the slider. The signal processing portion defines an acceptable measurement force range defined by at least a minimum force threshold that is determined such that it exceeds a compensation force corresponding to at least one force component included in the force signal that is independent of user variations of the measurement force. It may analyze acquired force data to identify pre-contact data, and set the minimum force threshold for a current measurement procedure based on that pre-contact data.

Abstract translation: 提供一种电动卡钳，其包括刻度件，滑块，位移传感器，力感测装置和信号处理部分。 信号处理部分被配置为接收力信号并且指示对应于滑块的​​相应位置的相应力。 获取力数据，其包括对应于滑块的​​相应位置的多个相应的力。 信号处理部分限定由至少最小力阈值限定的可接受的测量力范围，该最小力阈值被确定为使得其超过对应于包括在力信号中的至少一个力分量的补偿力，该力分量独立于测量力的用户变化 。 它可以分析获取的力数据以识别预接触数据，并且基于该预接触数据设置当前测量过程的最小力阈值。

公开(公告)号：US20140347879A1

公开(公告)日：2014-11-27

申请号：US14278461

申请日：2014-05-15

Applicant: MITUTOYO CORPORATION

Inventor： Norihiko MASUDA ,  Masashi ISHIGE

IPC: F21V8/00

CPC classification number: G02B6/0006 ,  G02B6/4226 ,  G02B6/4298

Abstract: A light source apparatus includes a light source, an optical fiber, and a positioning mechanism. The positioning mechanism is configured with a planar position adjustment mechanism, an axial line position adjustment mechanism, and an orientation maintaining mechanism. The planar position adjustment mechanism adjusts a position of the optical fiber in a direction following the light-emitting surface. The axial line position adjustment mechanism adjusts the position of the optical fiber in a direction intersecting with the light-emitting surface. The orientation maintaining mechanism holds the optical fiber in a state where an axis direction of the optical fiber lies in a predetermined intersecting direction with respect to the light-emitting surface.

Abstract translation: 光源装置包括光源，光纤和定位机构。 定位机构配置有平面位置调整机构，轴线位置调整机构和取向保持机构。 平面位置调整机构在发光面附近调整光纤的位置。 轴线位置调整机构在与发光面交叉的方向上调整光纤的位置。 取向维持机构将光纤保持在光纤的轴向相对于发光面位于规定的交叉方向的状态。

公开(公告)号：US20140340694A1

公开(公告)日：2014-11-20

申请号：US14277351

申请日：2014-05-14

Applicant: MITUTOYO CORPORATION

Inventor： Shinji FUKUDA ,  Ryoichi IMAIZUMI

IPC: G01B11/08

CPC classification number: G01B11/08 ,  G01B11/2433

Abstract: An optical measuring apparatus includes a light emitter, a scanner, a polarizing plate, a photoreceiver, and a CPU. The light emitter emits a laser beam. The scanner uses the laser beam emitted from the light emitter and scans a measurement region where a work piece is placed. The polarizing plate allows passage for only a laser beam, among the laser beams fired by the scanner, directed orthogonally to an emission direction of the laser beam and an axis direction of the work piece. The photoreceiver receives the laser beam that has passed through the measurement region and the polarizing plate. The CPU calculates a dimension of the work piece from a pattern of light and dark in a scan direction, the pattern being obtained by the photoreceiver.

Abstract translation: 光学测量装置包括光发射器，扫描仪，偏振片，光接收器和CPU。 光发射器发射激光束。 扫描器使用从发光器发射的激光束并扫描放置工件的测量区域。 在由扫描仪发射的激光束中，偏振片仅允许通过激光束，该激光束与激光束的发射方向和工件的轴线方向垂直。 光接收器接收已经通过测量区域和偏振片的激光束。 CPU从扫描方向上的光和暗的图案计算工件的尺寸，该图案由光接收器获得。

公开(公告)号：US20140337775A1

公开(公告)日：2014-11-13

申请号：US14276976

申请日：2014-05-13

Applicant: Mitutoyo Corporation

Inventor： Ryan Northrup ,  Andy Ye ,  Iman Haryadi

IPC: G06F3/0486

CPC classification number: G06F8/34 ,  G06F3/0482 ,  G06F8/33

Abstract: A method is provided for copying and pasting a set of machine vision part program operations when editing a part program in a machine vision inspection system. The method includes: a) selecting at least a first instruction representation at a copy location in a displayed part program representation; b) performing copy operations by executing a first subset of modification operations directed to elements that are specific to a first operating context at the copy location, to thereby generate a partially modified selected instruction representation and/or its underlying instruction code; c) defining a paste location in the displayed part program representation; and d) performing paste operations by executing a second subset of modification operations directed to elements that are specific to a second operating context at the paste location, to thereby generate and paste onto the paste location a fully modified selected instruction representation and/or its underlying instruction code.

Abstract translation: 提供了一种在机器视觉检查系统中编辑零件程序时复制和粘贴一组机器视觉零件程序操作的方法。 该方法包括：a）在所显示的部分节目表现中的复制位置选择至少第一指令表示; b）通过执行针对复制位置处的第一操作上下文特有的元件的修改操作的第一子集来执行复制操作，从而生成部分修改的选择指令表示和/或其底层指令代码; c）在所显示的零件程序表示中定义粘贴位置; 以及d）通过执行针对所述粘贴位置处的第二操作上下文特有的元素的修改操作的第二子集执行粘贴操作，从而生成并粘贴到粘贴位置上完全修改的所选择的指令表示和/或其底层 指令码。