Lithographic apparatus and a device manufacturing method
    25.
    发明授权
    Lithographic apparatus and a device manufacturing method 有权
    光刻设备和器件制造方法

    公开(公告)号:US07126664B2

    公开(公告)日:2006-10-24

    申请号:US10888513

    申请日:2004-07-12

    IPC分类号: G03B27/52 G03B27/42 G03B27/62

    CPC分类号: G03F7/70841

    摘要: A lithographic apparatus is disclosed. The apparatus includes a support constructed to support a patterning device, the patterning device being capable of imparting a radiation beam with a pattern in its cross-section to form a patterned radiation beam. A projection system is configured to project the patterned radiation beam onto a target portion of a substrate. A first vacuum environment contains the projection system, a second vacuum environment contains the patterning device support, and a separator separates the first and second vacuum environments. The separator includes an aperture for passing the projection beam from the first vacuum environment towards the patterning device and/or vice-versa. The patterning device forms at least part of a seal for substantially sealing the aperture of the separator.

    摘要翻译: 公开了一种光刻设备。 该装置包括构造成支撑图案形成装置的支撑件,该图案形成装置能够在其横截面中赋予具有图案的辐射束以形成图案化的辐射束。 投影系统被配置为将图案化的辐射束投影到基板的目标部分上。 第一真空环境包含投影系统,第二真空环境包含图案形成装置支撑件,分离器分离第一和第二真空环境。 分离器包括用于使投影束从第一真空环境朝向图案形成装置传递的孔,和/或反之亦然。 图案形成装置形成用于基本上密封隔膜的孔的密封件的至少一部分。

    Lithographic apparatus and device manufacturing method
    26.
    发明授权
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US07061579B2

    公开(公告)日:2006-06-13

    申请号:US10735847

    申请日:2003-12-16

    IPC分类号: G03B27/42 G03B27/58 G03B27/62

    摘要: A lithographic apparatus is disclosed. The apparatus includes an illumination system that provides a beam of radiation, and a support structure that supports a patterning structure. The patterning structure is configured to impart the beam of radiation with a pattern in its cross-section. The apparatus also includes a substrate support that supports a substrate, a projection system that projects the patterned beam onto a target portion of the substrate, and a reference frame that provides a reference surface with respect to which a position of at least one of the substrate and the patterning structure is measured. The reference frame includes a material that has a coefficient of thermal expansion of greater than about 2.9×10−6/K.

    摘要翻译: 公开了一种光刻设备。 该装置包括提供辐射束的照明系统和支撑图形结构的支撑结构。 图案形成结构被配置为在其横截面中赋予辐射束图案。 该装置还包括支撑基板的基板支撑件,将图案化的光束投影到基板的目标部分上的投影系统以及提供参考表面的参考框架,基准面相对于基板的至少一个基板 并且测量图案结构。 参考框架包括具有大于约2.9×10 -6 / K的热膨胀系数的材料。