Optical system for measurement of optical constant
    21.
    发明申请
    Optical system for measurement of optical constant 失效
    用于测量光学常数的光学系统

    公开(公告)号:US20040008346A1

    公开(公告)日:2004-01-15

    申请号:US10255940

    申请日:2002-09-27

    Inventor: Etsuo Kawate

    Abstract: There is provided an optical system for measurement of optical constant capable of measuring the absolute reflectance and the absolute transmittance for determining the optical constant of a substance with excellent accuracy without replacing the optical system during the measurement by using a different system for measuring the absolute reflectance and the absolute transmittance of the sample, comprising an incoming side beam switching mirror for selectively switching the direction of the light from a light source to a first or second converged light reflecting means side, first and second converged light reflecting means for projecting the light from the beam switching mirror so as to be converged in an intersecting manner at the position of a sample holder, the sample bolder capable of selectively positioning a sample fitting hole or a through hole at the converging position by the converged light reflecting means by advancing/retracting the sample fitting hole or the through hole, first and second received light reflecting means which are disposed on the optical path of the light reflected by or transmitted through a sample set in the sample fitting hole on the sample holder or the through hole, and direct the light toward a single exiting side beam switching mirror, and the exiting side beam switching mirror capable of switching the direction of the light projected via the received light reflecting means toward a single detector, and the absolute reflectance and the absolute transmittance for the face side incidence and the back side incidence of the sample.

    Abstract translation: 提供了一种用于测量绝对反射率和绝对透射率的光学常数的光学系统,其用于确定物质的光学常数,而不用在测量期间使用不同的系统来测量绝对反射率 以及样品的绝对透射率,包括用于选择性地将来自光源的光的方向切换到第一或第二会聚光反射装置侧的入射侧光束切换镜,第一和第二会聚光反射装置,用于将光从 所述光束切换镜以在所述样品保持器的位置处相交的方式会聚,所述样品检测器能够通过所述会聚光反射装置通过前进/后退选择性地定位在会聚位置的样品嵌合孔或通孔 样品安装孔或通孔, 第一和第二接收光反射装置,其设置在由样本保持器或通孔上的样本装配孔中反射或透过的样本的光路上,并将光引导到单个离开侧光束切换 反射镜和能够将经由接收的光反射装置投射的光的方向朝向单个检测器切换的出射侧光束切换镜,以及样品的正面入射和背面入射的绝对反射率和绝对透射率 。

    Method of production of lactam
    23.
    发明申请
    Method of production of lactam 失效
    内酰胺的生产方法

    公开(公告)号:US20030088093A1

    公开(公告)日:2003-05-08

    申请号:US10285571

    申请日:2002-11-01

    CPC classification number: C07D201/04 Y02P20/582

    Abstract: A method for producing a lactam by using an organic solvent as a substrate solution, which makes it possible to introduce a high-concentration oxime into flowing high-temperature and high-pressure water, thereby allowing the high-concentration lactam to be synthesized with a high efficiency. With this method, the lactam is continuously synthesized at a high rate from the oxime under high-temperature and high-pressure water mixture conditions within a temperature range of no less than 250null C. and a pressure range of no less than 15 MPa.

    Abstract translation: 通过使用有机溶剂作为底物溶液制备内酰胺的方法,可以将高浓度肟引入流动的高温高压水中,从而使高浓度的内酰胺与 高效率。 通过该方法,在不低于250℃的温度范围和不低于15MPa的压力范围内,在高温和高压水混合条件下,从肟连续合成内酰胺。

    Method and apparatus for inspecting multilayer masks for defects
    24.
    发明申请
    Method and apparatus for inspecting multilayer masks for defects 有权
    检查多层掩模缺陷的方法和装置

    公开(公告)号:US20030067598A1

    公开(公告)日:2003-04-10

    申请号:US10263699

    申请日:2002-10-04

    Inventor: Toshihisa Tomie

    Abstract: A method for inspecting multilayer masks to detect any defects includes illuminating a pixel region on a mask to be inspected, using illuminating light having a peak wavelength that is close to that of light reflected by the mask. The illuminating light specularly reflected by the mask is blocked Scattered reflected illuminating light is collected and used to form an enlarged image. An image detector having a large plurality of pixels is used to observe the enlarged image to detect whether there are defects on the mask. The method is implemented using an mask inspection apparatus including a plasma light source for generating radiant rays, an illuminating light collecting optical system that collects radiated light from the light source for enlarged image formation illumination of a subject inspection region, a Schwarzschild optical system including convex and concave mirrors for collecting scattered light from the subject inspection region and forming an enlarged image of the inspection region, an image detector having a large plurality of pixels for recording the enlarged image that is obtained, and an analyzer that analyzes the images obtained to determine whether there is a defect.

    Abstract translation: 用于检查多层掩模以检测任何缺陷的方法包括使用具有接近由掩模反射的光的峰值波长的照明光照射待检查的掩模上的像素区域。 由掩模镜面反射的照明光被遮蔽散射的反射照明光被收集并用于形成放大的图像。 使用具有大量多个像素的图像检测器来观察放大图像以检测掩模上是否存在缺陷。 该方法使用包括用于产生辐射线的等离子体光源的掩模检查装置来实现,收集来自光源的辐射光以用于对象检查区域的放大图像形成照明的照明聚光光学系统,包括凸起的施瓦茨光学系统 以及用于收集来自被检查区域的散射光并形成检查区域的放大图像的凹面镜,具有用于记录所获得的放大图像的大量多个像素的图像检测器,以及分析器,其分析所获得的图像以确定 是否存在缺陷。

    Manufacturing method of semiconductor devices
    25.
    发明申请
    Manufacturing method of semiconductor devices 有权
    半导体器件的制造方法

    公开(公告)号:US20030013266A1

    公开(公告)日:2003-01-16

    申请号:US10101318

    申请日:2002-03-20

    CPC classification number: H01L21/049 H01L29/045 H01L29/1608 Y10S438/931

    Abstract: A semiconductor device is manufactured using a SiC substrate. On a semiconductor region a region formed of SiC having an (11-20) face orientation is formed. A gate insulation layer is a gate oxidation layer. The surface of the semiconductor region is cleaned, and the gate insulation layer is formed in an atmosphere containing hydrogen or water vapor After the gate insulation layer has been formed, the substrate is heat-treated in an atmosphere containing hydrogen or water vapor. This reduces the interface-trap and the semiconductor region.

    Abstract translation: 使用SiC衬底制造半导体器件。 在半导体区域形成由具有(11-20)面取向的SiC形成的区域。 栅极绝缘层是栅极氧化层。 半导体区域的表面被清洁,并且在包含氢或水蒸气的气氛中形成栅极绝缘层。在形成栅极绝缘层之后,将衬底在含有氢或水蒸气的气氛中进行热处理。 这减少了界面陷阱和半导体区域。

    Polygon-type semiconductor detector for use in high-speed X-ray CT, and manufacturing method therefor
    26.
    发明申请
    Polygon-type semiconductor detector for use in high-speed X-ray CT, and manufacturing method therefor 审中-公开
    用于高速X射线CT的多边形半导体检测器及其制造方法

    公开(公告)号:US20020123187A1

    公开(公告)日:2002-09-05

    申请号:US10058416

    申请日:2002-01-30

    Inventor: Masaki Misawa

    CPC classification number: G01T1/2985

    Abstract: The polygon-type semiconductor detector for use in a high-speed X-ray CT according to the present invention enables a high resolution, and allows the time and cost for manufacturing to be significantly reduced, by virtue of the detection pixel group thereof having mutually homogeneous characteristics. First, X-ray modules are each constructed by arranging a plurality of X-ray detection pixels (4) formed by means of photolithography in a line on a single planar semiconductor substrate constituted of CdTe. Then, by polygonally arranging a plurality of these X-ray modules on the circumference of a measuring section around a measuring area, this polygon-type semiconductor detector is formed. Thereby, when a multiphase fluid having mutually different densities flows in the measuring area (10), this polygon-type semiconductor detector can acquire the projection data of internal density distributions at a high speed.

    Abstract translation: 根据本发明的用于高速X射线CT的多边形半导体检测器能够实现高分辨率,并且由于具有相互的检测像素组,可以显着地减少制造的时间和成本 均质特性。 首先,通过在由CdTe构成的单个平面状半导体基板上的一行中配置通过光刻形成的多个X射线检测像素(4)来构成X射线模块。 然后,通过在测量区域周围的测量区域的圆周上多个排列多个X射线模块,形成该多边形半导体检测器。 因此,当在测量区域(10)中流动具有相互不同的密度的多相流体时,该多边形半导体检测器可以高速获取内部密度分布的投影数据。

    Suspend and resume method of computer job
    27.
    发明申请
    Suspend and resume method of computer job 审中-公开
    暂停和恢复计算机工作的方法

    公开(公告)号:US20040194086A1

    公开(公告)日:2004-09-30

    申请号:US10101100

    申请日:2002-03-20

    Inventor: Kuniyasu Suzaki

    CPC classification number: G06F9/4856

    Abstract: This invention provides a method of suspending and resuming software execution that enables a software execution state to be saved and, as required, transferred to another computer and execution resumed. This is done by including a step of running a second computer program in a real or virtual computer system that emulates functions of a real or virtual computer configured using a first computer program that can save a snapshot of a computer system operation state at a specified time; a step of saving a snapshot of the virtual computer system, or a transmission step; a step of loading the saved or transmitted snapshot on a computer system that substantially corresponds to the real or virtual computer system; and a step of starting operations on a computer system that substantially corresponds to the real or virtual computer system.

    Abstract translation: 本发明提供一种暂停和恢复软件执行的方法,其使得能够保存软件执行状态,并且根据需要将其传送到另一计算机并恢复执行。 这通过包括在实际或虚拟计算机系统中运行第二计算机程序的步骤来完成,该系统模拟使用可以在指定时间保存计算机系统操作状态的快照的第一计算机程序配置的实际或虚拟计算机的功能 ; 保存虚拟计算机系统的快照的步骤或传输步骤; 将保存或发送的快照加载到基本上对应于实际或虚拟计算机系统的计算机系统上的步骤; 以及在基本上对应于真实或虚拟计算机系统的计算机系统上开始操作的步骤。

    Multifunctional energy efficient window coating
    28.
    发明申请
    Multifunctional energy efficient window coating 审中-公开
    多功能节能窗户涂层

    公开(公告)号:US20030054177A1

    公开(公告)日:2003-03-20

    申请号:US10101360

    申请日:2002-03-20

    Inventor: Ping Jin

    CPC classification number: C03C17/3417 C03C17/3423 C03C2217/71 G02F1/0147

    Abstract: The present invention provides a multifunctional high-performance automatic chromogenic window coating material in which a vanadium dioxide based thermochromic material is coated by sputtering or the like onto a transparent substrate such as a piece of window glass, and a titanium dioxide based photocatalytic material that also acts as an antireflection film is coated thereon as an outermost layer.

    Abstract translation: 本发明提供了一种多功能高性能自动显色窗用涂料,其中基于二氧化钒的热变色材料通过溅射等涂覆在透明基材如一片窗玻璃上,以及二氧化钛基光催化材料 作为防反射膜作为最外层涂覆。

    Fixed-point cell, thermometer calibration method and fixed-point temperature realizing apparatus
    30.
    发明申请
    Fixed-point cell, thermometer calibration method and fixed-point temperature realizing apparatus 有权
    定点电池,温度计校准方法和定点温度实现装置

    公开(公告)号:US20020122457A1

    公开(公告)日:2002-09-05

    申请号:US10086684

    申请日:2002-03-04

    CPC classification number: G01K15/002

    Abstract: A thermometer calibration method and fixed-point temperature realizing apparatus uses a fixed-point cell including a crucible of carbon and a fixed-point material enclosed in the crucible. The fixed-point material is a eutectic structure of carbide and carbon. The fixed-point cell is placed in a furnace for increasing and decreasing the environmental temperature of the cell. A thermometer to be calibrated is used to measure temperature variations in the cell and calibrated based on the temperature variations thus measured.

    Abstract translation: 温度计校准方法和定点温度实现装置使用包括碳坩埚和包含在坩埚中的定点材料的定点电池。 定点材料是碳化物和碳的共晶结构。 将定点电池置于炉中以增加和降低电池的环境温度。 要校准的温度计用于测量电池中的温度变化,并根据所测量的温度变化进行校准。

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