ZINC OXIDE SULFUR SENSOR
    21.
    发明申请
    ZINC OXIDE SULFUR SENSOR 有权
    ZINC氧化硫传感器

    公开(公告)号:US20110012625A1

    公开(公告)日:2011-01-20

    申请号:US12817936

    申请日:2010-06-17

    IPC分类号: G01R27/08 G01N27/04

    CPC分类号: G01N33/287

    摘要: Sulfur sensors are formed by coating a conductive substrate with ZnO microstructures that are reactive with sulfur in liquids, such as fuel, using MOCVD. The ZnO is changed to ZnS over time and causes the voltage across the sensors to change under a constant current by at least about 25%. The time required for such saturation to occur can then be correlated to a sulfur concentration in the liquid.

    摘要翻译: 硫传感器通过使用MOCVD将具有与液体中的硫反应的ZnO微结构涂覆在导电基底上而形成。 ZnO随时间变化为ZnS,导致传感器两端的电压在恒定电流下变化至少约25%。 所以发生饱和所需的时间可以与液体中的硫浓度相关。

    Hybrid Process for Forming Metal Gates
    22.
    发明申请
    Hybrid Process for Forming Metal Gates 有权
    用于形成金属门的混合工艺

    公开(公告)号:US20110001194A1

    公开(公告)日:2011-01-06

    申请号:US12883241

    申请日:2010-09-16

    IPC分类号: H01L27/092

    摘要: A semiconductor structure and methods for forming the same are provided. The semiconductor structure includes a first MOS device of a first conductivity type and a second MOS device of a second conductivity type opposite the first conductivity type. The first MOS device includes a first gate dielectric on a semiconductor substrate; a first metal-containing gate electrode layer over the first gate dielectric; and a silicide layer over the first metal-containing gate electrode layer. The second MOS device includes a second gate dielectric on the semiconductor substrate; a second metal-containing gate electrode layer over the second gate dielectric; and a contact etch stop layer having a portion over the second metal-containing gate electrode layer, wherein a region between the portion of the contact etch stop layer and the second metal-containing gate electrode layer is substantially free from silicon.

    摘要翻译: 提供半导体结构及其形成方法。 半导体结构包括第一导电类型的第一MOS器件和与第一导电类型相反的第二导电类型的第二MOS器件。 第一MOS器件包括在半导体衬底上的第一栅极电介质; 在所述第一栅极电介质上的第一含金属的栅电极层; 以及位于第一含金属栅电极层上的硅化物层。 第二MOS器件包括半导体衬底上的第二栅极电介质; 在所述第二栅极电介质上方的第二含金属的栅电极层; 以及具有位于所述第二含金属栅电极层上的部分的接触蚀刻停止层,其中所述接触蚀刻停止层的所述部分和所述第二含金属栅电极层之间的区域基本上不含硅。

    Hybrid process for forming metal gates
    23.
    发明授权
    Hybrid process for forming metal gates 有权
    用于形成金属门的混合工艺

    公开(公告)号:US07812414B2

    公开(公告)日:2010-10-12

    申请号:US11656711

    申请日:2007-01-23

    IPC分类号: H01L29/78

    摘要: A semiconductor structure and methods for forming the same are provided. The semiconductor structure includes a first MOS device of a first conductivity type and a second MOS device of a second conductivity type opposite the first conductivity type. The first MOS device includes a first gate dielectric on a semiconductor substrate; a first metal-containing gate electrode layer over the first gate dielectric; and a silicide layer over the first metal-containing gate electrode layer. The second MOS device includes a second gate dielectric on the semiconductor substrate; a second metal-containing gate electrode layer over the second gate dielectric; and a contact etch stop layer having a portion over the second metal-containing gate electrode layer, wherein a region between the portion of the contact etch stop layer and the second metal-containing gate electrode layer is substantially free from silicon.

    摘要翻译: 提供半导体结构及其形成方法。 半导体结构包括第一导电类型的第一MOS器件和与第一导电类型相反的第二导电类型的第二MOS器件。 第一MOS器件包括在半导体衬底上的第一栅极电介质; 在所述第一栅极电介质上的第一含金属的栅电极层; 以及位于第一含金属栅电极层上的硅化物层。 第二MOS器件包括半导体衬底上的第二栅极电介质; 在所述第二栅极电介质上方的第二含金属的栅电极层; 以及具有位于所述第二含金属栅电极层上的部分的接触蚀刻停止层,其中所述接触蚀刻停止层的所述部分和所述第二含金属栅电极层之间的区域基本上不含硅。

    INTEGRATED CIRCUIT METAL GATE STRUCTURE AND METHOD OF FABRICATION
    24.
    发明申请
    INTEGRATED CIRCUIT METAL GATE STRUCTURE AND METHOD OF FABRICATION 有权
    集成电路金属结构和制造方法

    公开(公告)号:US20100044806A1

    公开(公告)日:2010-02-25

    申请号:US12264822

    申请日:2008-11-04

    IPC分类号: H01L29/78 H01L21/3205

    摘要: A method of forming a gate structure is provided. The method includes providing a metal layer in the gate structure, the metal layer includes an oxygen-gettering composition. The metal layer getters oxygen from the interface layer, which may decrease the thickness of the interface layer. The gettered oxygen converts the metal layer to a metal oxide, which may act as a gate dielectric for the gate structure. A multi-layer metal gate structure is also provided including a oxygen-gettering metal layer, an oxygen-containing metal layer, and a polysilicon interface metal layer overlying a high-k gate dielectric.

    摘要翻译: 提供一种形成栅极结构的方法。 该方法包括在栅极结构中提供金属层,金属层包括吸氧组合物。 金属层从界面层吸收氧气,这可能会降低界面层的厚度。 吸收的氧将金属层转化为金属氧化物,其可以用作栅极结构的栅极电介质。 还提供了多层金属栅极结构,其包括吸氧过程金属层,含氧金属层和覆盖在高k栅极电介质上的多晶硅界面金属层。

    Hybrid Process for Forming Metal Gates of MOS Devices
    25.
    发明申请
    Hybrid Process for Forming Metal Gates of MOS Devices 有权
    MOS器件金属门的混合工艺

    公开(公告)号:US20090230479A1

    公开(公告)日:2009-09-17

    申请号:US12047113

    申请日:2008-03-12

    IPC分类号: H01L27/092

    摘要: A semiconductor structure includes a first MOS device including a first gate, and a second MOS device including a second gate. The first gate includes a first high-k dielectric over a semiconductor substrate; a second high-k dielectric over the first high-k dielectric; a first metal layer over the second high-k dielectric, wherein the first metal layer dominates a work-function of the first MOS device; and a second metal layer over the first metal layer. The second gate includes a third high-k dielectric over the semiconductor substrate, wherein the first and the third high-k dielectrics are formed of same materials, and have substantially a same thickness; a third metal layer over the third high-k dielectric, wherein the third metal layer and the second metal layer are formed of same materials, and have substantially a same thickness; and a fourth metal layer over the third metal layer.

    摘要翻译: 半导体结构包括包括第一栅极的第一MOS器件和包括第二栅极的第二MOS器件。 第一栅极包括在半导体衬底上的第一高k电介质; 第一高k电介质上的第二高k电介质; 在所述第二高k电介质上的第一金属层,其中所述第一金属层支配所述第一MOS器件的功函数; 以及在所述第一金属层上的第二金属层。 第二栅极包括半导体衬底上的第三高k电介质,其中第一和第三高k电介质由相同的材料形成,并具有基本上相同的厚度; 在所述第三高k电介质上的第三金属层,其中所述第三金属层和所述第二金属层由相同的材料形成,并且具有基本相同的厚度; 以及在第三金属层上的第四金属层。

    METHOD AND APPARATUS FOR FAST 3D ULTRASOUND IMAGING
    26.
    发明申请
    METHOD AND APPARATUS FOR FAST 3D ULTRASOUND IMAGING 有权
    用于快速3D超声成像的方法和装置

    公开(公告)号:US20080262355A1

    公开(公告)日:2008-10-23

    申请号:US11875773

    申请日:2007-10-19

    IPC分类号: A61B8/00 G01S15/89 G06K9/00

    摘要: The present invention provides a method and apparatus for fast 3D ultrasound imaging. The method comprises data acquisition, desired data selection, data smoothing, table construction, ray casting, table look-up, ray synthesis and final result output. The apparatus comprises an acquisition module, a selection module, a smoothing module, a construction module, a ray casting module, a table look-up module, a synthesis module and an output module. The present invention can avoid a huge amount of unnecessary reconstruction calculations by smoothing preprocessing and constructing the reconstruction table and the gradient table as well as transforming coordinates of the points where necessary. The present invention has greater practical applicability, because the existing imaging technology demands that the radius for rotating the probe be identical to the radius of the probe.

    摘要翻译: 本发明提供一种用于快速3D超声成像的方法和装置。 该方法包括数据采集,所需数据选择,数据平滑,表格构建,射线投射,表查找,射线合成和最终结果输出。 该装置包括采集模块,选择模块,平滑模块,结构模块,射线投射模块,表查找模块,合成模块和输出模块。 本发明可以通过平滑预处理和构造重建表和梯度表以及必要的点的变换坐标来避免大量的不必要的重建计算。 本发明具有更大的实际应用性,因为现有的成像技术要求将探头旋转的半径与探头的半径相同。

    Browser-based user interface and control architecture with priority attributes

    公开(公告)号:US08458728B2

    公开(公告)日:2013-06-04

    申请号:US12809982

    申请日:2008-12-18

    申请人: Yong Tian Brian Chin

    发明人: Yong Tian Brian Chin

    IPC分类号: G06F9/44 G06F15/17

    CPC分类号: G06F9/542 G06F2209/543

    摘要: A browser-enabled device includes a browser-based user interface and control architecture, which has a browser core, a browser framework, and a user interface. The user interface is written using a markup language. In processing event registrations, the browser framework receives an event registration. The received event registration having a response unique resource identifier (URI) content and a priority field. The priority field of the received event registration is examined to determine priority of the received event registration. If the browser core is loading the response URI content of a prior event registration and if the priority of the received event registration is higher than the priority of the prior event registration, then the loading of the response URI content of the prior event registration is halted, and loading of the response URI content of the received event registration is begun.

    LED based precision approach path indicator
    30.
    发明授权
    LED based precision approach path indicator 失效
    基于LED的精密进近路径指示器

    公开(公告)号:US08434905B2

    公开(公告)日:2013-05-07

    申请号:US12590771

    申请日:2009-11-12

    IPC分类号: H05B37/00 F21V1/00 G01B11/26

    CPC分类号: G01B11/26 H05B33/0803

    摘要: A precision approach path indicator system (PAPI) including multiple LHA indicators and power sources. Each LHA indicator comprises several assembly modules, with each module made up of several red and white LEDs, several collimating lens, one optical combiner, and one projection lens set. From a side view of the module, the red LEDs are placed on top of white LEDs, with a collimating lens in front of each LED. The optical combiner is in front of both the red and white LEDs, slightly above the white LEDs in vertical placement. The optical combiner has a reflective coating on the bottom surface, and a red light filter coating on the projection surface. The combined beam of light is projected out through a projection lens at front of the assembly module.

    摘要翻译: 精密进场路径指示系统(PAPI),包括多个LHA指示灯和电源。 每个LHA指示器包括多个组装模块,每个模块由几个红色和白色LED组成,几个准直透镜,一个光学组合器和一个投影透镜组。 从模块的侧视图,红色LED放置在白色LED的顶部,每个LED前面有准直透镜。 光学组合器位于红色和白色LED的前面,垂直放置时略高于白色LED。 光学组合器在底表面上具有反射涂层,并且在投影表面上具有红色光过滤器涂层。 组合的光束通过组装模块前面的投影透镜突出出来。