公开(公告)号：US10191396B2

公开(公告)日：2019-01-29

申请号：US15316526

申请日：2015-05-21

Applicant: ASML NETHERLANDS B.V.

Inventor： Paul Corné Henri De Wit ,  Stijn Willem Boere ,  Youssef Karel Maria De Vos ,  Peter Paul Hempenius ,  Nicolaas Rudolf Kemper ,  Robertus Mathijs Gerardus Rijs ,  Frits Van Der Meulen

IPC: G03F7/20 ,  G03F9/00

Abstract: A temperature conditioning system for a lithographic apparatus. Temperature variations in an object cause object deformation which prevents the object being accurately positioned. Temperature condition systems use conduit systems, provided with fluid, in or on the object to control the temperature of the object to reduce object deformation. In this way, parts of the object can be more accurately positioned. However, acceleration of the object and the temperature conditioning system induces variation in pressure within the fluid inside the conduit system on or in the object, which may also cause object deformation. To provide an improved conduit system, the lithographic apparatus further includes a control system which is used to control the movement of the object based on measurements indicating pressure variation in the conduit.

公开(公告)号：US11003098B2

公开(公告)日：2021-05-11

申请号：US16687535

申请日：2019-11-18

Applicant: ASML Netherlands B.V.

Inventor： Frits Van Der Meulen ,  Maarten Mathijs Marinus Jansen ,  Jorge Manuel Azeredo Lima ,  Derk Servatius Gertruda Brouns ,  Marc Bruijn ,  Jeroen Dekkers ,  Paul Janssen ,  Ronald Harm Gunther Kramer ,  Matthias Kruizinga ,  Robert Gabriël Maria Lansbergen ,  Martinus Hendrikus Antonius Leenders ,  Erik Roelof Loopstra ,  Gerrit Van Den Bosch ,  Jérôme François Sylvain Virgile Van Loo ,  Beatrijs Louise Marie-Joseph Katrien Verbrugge ,  Angelo Cesar Peter De Klerk ,  Jacobus Maria Dings ,  Maurice Leonardus Johannes Janssen ,  Roland Jacobus Johannes Kerstens ,  Martinus Jozef Maria Kester ,  Michel Loos ,  Geert Middel ,  Silvester Matheus Reijnders ,  Frank Johannes Christiaan Theuerzeit ,  Anne Johannes Wilhelmus Van Lievenoogen

IPC: G03F7/20 ,  G03F1/64

Abstract: Tooling for a mask assembly suitable for use in a lithographic process, the mask assembly comprising a patterning device; and a pellicle frame configured to support a pellicle and mounted on the patterning device with a mount; wherein the mount provides a releasably engageable attachment between the patterning device and the pellicle frame.

公开(公告)号：US10747127B2

公开(公告)日：2020-08-18

申请号：US16326948

申请日：2017-08-11

Applicant: ASML Netherlands B.V.

Inventor： Frits Van Der Meulen ,  Erik Johan Arlemark ,  Hendrikus Herman Marie Cox ,  Martinus Agnes Willem Cuijpers ,  Joost De Hoogh ,  Gosse Charles De Vries ,  Paul Comé Henri De Wit ,  Sander Catharina Reinier Derks ,  Ronald Cornelis Gerardus Gijzen ,  Dries Vaast Paul Hemschoote ,  Christiaan Alexander Hoogendam ,  Adrianus Hendrik Koevoets ,  Raymond Wilhelmus Louis Lafarre ,  Alain Louis Claude Leroux ,  Patrick Willem Paul Limpens ,  Jim Vincent Overkamp ,  Christiaan Louis Valentin ,  Koos Van Berkel ,  Stan Henricus Van Der Meulen ,  Jacobus Cornelis Gerardus Van Der Sanden ,  Harmen Klaas Van Der Schoot ,  David Ferdinand Vles ,  Evert Auke Rinze Westerhuis

IPC: G03F7/20

Abstract: A lithographic apparatus comprising a projection system configured to project a patterned radiation beam to form an exposure area on a substrate held on a substrate table, the lithographic apparatus further comprising a cooling apparatus for cooling the substrate, wherein the cooling apparatus comprises a cooling element located above the substrate table and adjacent to the exposure area, the cooling element being configured to remove heat from the substrate.

公开(公告)号：US20200012204A1

公开(公告)日：2020-01-09

申请号：US16572156

申请日：2019-09-16

Applicant: ASML Netherlands B.V.

Inventor： Frits Van Der Meulen ,  Maarten Mathijs Marinus Jansen ,  Jorge Manuel Azeredo Lima ,  Derk Servatius Gertruda Brouns ,  Marc Bruijn ,  Jeroen Dekkers ,  Paul Janssen ,  Ronald Harm, Gunther Kramer ,  Matthias Kruizinga ,  Robert Gabriël Maria Lansbergen ,  Martinus Hendrikus Antonius Leenders ,  Erik Roelof Loopstra ,  Gerrit Van Den Bosch ,  Jérôme François Sylvain Virgile Van Loo ,  Beatrijs Louise Marie-Joseph Katrien Verbrugge ,  Angelo Cesar Peter De Klerk ,  Jacobus Maria Dings ,  Maurice Leonardus Johannes Janssen ,  Roland Jacobus Johannes Kerstens ,  Martinus Jozef Maria Kesters ,  Michel Loos ,  Geert Middel ,  Silvester Matheus Reijnders ,  Frank Johannes Christiaan Theuerzeit ,  Anne Johannes Wilhelmus Van Lievenoogen

IPC: G03F7/20 ,  G03F1/22 ,  G03F1/64

Abstract: Tooling for a mask assembly suitable for use in a lithographic process, the mask assembly comprising a patterning device; and a pellicle frame configured to support a pellicle and mounted on the patterning device with a mount; wherein the mount provides a releasably engageable attachment between the patterning device and the pellicle frame.

公开(公告)号：US10466595B2

公开(公告)日：2019-11-05

申请号：US15790287

申请日：2017-10-23

Applicant: ASML NETHERLANDS B.V.

Inventor： Bob Streefkerk ,  Johannes Jacobus Matheus Baselmans ,  Henrikus Herman Marie Cox ,  Antonius Theodorus Anna Maria Derksen ,  Sjoerd Nicolaas Lambertus Donders ,  Christiaan Alexander Hoogendam ,  Joeri Lof ,  Erik Roelof Loopstra ,  Jeroen Johannes Sophia Maria Mertens ,  Frits Van Der Meulen ,  Johannes Catharinus Hubertus Mulkens ,  Gerardus Petrus Matthijs Van Nunen ,  Klaus Simon ,  Bernardus Antonius Slaghekke ,  Alexander Straaijer ,  Jan-Gerard Cornelis Van Der Toorn ,  Martijn Houkes

IPC: G03F7/20

Abstract: In a lithographic apparatus, a localized area of the substrate surface under a projection system is immersed in liquid. The height of a liquid supply system above the surface of the substrate can be varied using actuators. A control system uses feedforward or feedback control with input of the surface height of the substrate to maintain the liquid supply system at a predetermined height above the surface of the substrate.