High quality factor embedded resonator wafers

    公开(公告)号:US11209398B2

    公开(公告)日:2021-12-28

    申请号:US16597615

    申请日:2019-10-09

    Abstract: Embodiments disclosed herein include diagnostic substrates and methods of using such substrates. In an embodiment, a diagnostic substrate comprises a substrate, and a device layer over the substrate. In an embodiment, the diagnostic substrate further comprises a resonator in the device layer. In an embodiment, the resonator comprises a cavity, a cover layer over the cavity, and electrodes within the cavity for driving and sensing resonance of the cover layer. In an embodiment, the diagnostic substrate further comprises a reflector surrounding a perimeter of the resonator.

    MICRO RESONATOR ARRAY SYSTEM
    22.
    发明申请

    公开(公告)号:US20190265288A1

    公开(公告)日:2019-08-29

    申请号:US16283371

    申请日:2019-02-22

    Abstract: Embodiments include systems and methods for determining a processing parameter of a processing operation utilizing micro resonator sensors. Some embodiments include a diagnostic substrate comprising a substrate, a circuit layer over the substrate, a cavity in the circuit layer, a capping layer over the circuit layer, a resonating body in or over the cavity, one or more electrodes in the cavity, and circuitry for driving and sensing the resonant frequency of the resonating body. In an embodiment, the circuitry comprises a biasing circuitry block configured to provide a bias voltage to the one or more electrodes, a frequency generator circuitry block configured to provide a signal with a varying frequency to the one or more electrodes, and a sensing circuitry block configured to detect a value correlated to oscillation of the resonating body.

    SURFACE ACOUSTIC WAVE SENSOR ASSEMBLY

    公开(公告)号:US20220113208A1

    公开(公告)日:2022-04-14

    申请号:US17068733

    申请日:2020-10-12

    Inventor: Chuang-Chia Lin

    Abstract: A sensor assembly that includes a surface acoustic wave (SAW) sensor. The SAW sensor is adapted to measure a first environmental condition in response to receiving an RF signal. The SAW sensor includes a substrate having a layer of piezoelectric material. The SAW sensor further includes a interdigitated transducer (IDT) formed on the piezoelectric material. The IDT includes two comb-shaped electrodes having interlocking conducting digits in a first arrangement. The interlocking conducting digits in the first arrangement generates a first signal modulation of an RF signal received by the first IDT. The first signal modulation identifies the first SAW sensor.

    OPTICAL WALL AND PROCESS SENSOR WITH PLASMA FACING SENSOR

    公开(公告)号:US20210140824A1

    公开(公告)日:2021-05-13

    申请号:US16682616

    申请日:2019-11-13

    Abstract: Embodiments disclosed herein include an optical sensor system for use in plasma processing tools. In an embodiment, the optical sensor system, comprises an optically clear body with a first surface and a second surface facing away from the first surface. In an embodiment, the optically clear body further comprises a third surface that is recessed from the second surface. In an embodiment, the optical sensor system further comprises a target over the third surface and a first reflector to optically couple the first surface to the target.

    HIGH QUALITY FACTOR EMBEDDED RESONATOR WAFERS

    公开(公告)号:US20210080431A1

    公开(公告)日:2021-03-18

    申请号:US16597615

    申请日:2019-10-09

    Abstract: Embodiments disclosed herein include diagnostic substrates and methods of using such substrates. In an embodiment, a diagnostic substrate comprises a substrate, and a device layer over the substrate. In an embodiment, the diagnostic substrate further comprises a resonator in the device layer. In an embodiment, the resonator comprises a cavity, a cover layer over the cavity, and electrodes within the cavity for driving and sensing resonance of the cover layer. In an embodiment, the diagnostic substrate further comprises a reflector surrounding a perimeter of the resonator.

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