High Frequency Deflection Measurement of IR Absorption with a Modulated IR Source
    22.
    发明申请
    High Frequency Deflection Measurement of IR Absorption with a Modulated IR Source 有权
    用调制红外光源进行红外吸收的高频偏转测量

    公开(公告)号:US20130036521A1

    公开(公告)日:2013-02-07

    申请号:US13236115

    申请日:2011-09-19

    IPC分类号: G01Q70/08

    CPC分类号: G01Q30/02 G01N21/35 G01Q60/32

    摘要: A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.

    摘要翻译: 从样品表面获得亚微米分辨率IR吸收数据的方法。 探针显微镜探针与样品表面相互作用,而可调谐的红外辐射源照射样品尖端相互作用区域。 源以基本上与探针的谐振频率重叠的频率被调制,并且当探针与样品表面接触时可以以探针的接触共振频率调制源。 调制频率被连续地调整以考虑由于采样或其它变化引起的探头谐振频率的偏移。 使用各种技术来观察这种转移并以快速的方式完成调整。

    Closed loop controller and method for fast scanning probe microscopy
    23.
    发明申请
    Closed loop controller and method for fast scanning probe microscopy 有权
    闭环控制器和快速扫描探针显微镜的方法

    公开(公告)号:US20080277582A1

    公开(公告)日:2008-11-13

    申请号:US11800679

    申请日:2007-05-07

    IPC分类号: G21K7/00 G01B5/28

    摘要: A method of operating a metrology instrument includes generating relative motion between a probe and a sample at a scan frequency using an actuator. The method also includes detecting motion of the actuator using a position sensor that exhibits noise in the detected motion, and controlling the position of the actuator using a feedback loop and a feed forward algorithm. In this embodiment, the controlling step attenuates noise in the actuator position compared to noise exhibited by the position sensor over the scan bandwidth. Scan frequencies up to a third of the first scanner resonance frequency or greater than 300 Hz are possible.

    摘要翻译: 操作测量仪器的方法包括使用致动器在扫描频率下产生探针和样品之间的相对运动。 该方法还包括使用在检测到的运动中呈现噪声的位置传感器来检测致动器的运动,以及使用反馈回路和前馈算法来控制致动器的位置。 在该实施例中,与位置传感器在扫描带宽上显示的噪声相比,控制步骤衰减了致动器位置的噪声。 扫描频率高达第一扫描仪共振频率的三分之一或大于300 Hz是可能的。

    Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging
    24.
    发明申请
    Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging 有权
    使用谐波共振成像获得异质样品的材料性质信息的方法和装置

    公开(公告)号:US20080127722A1

    公开(公告)日:2008-06-05

    申请号:US11606695

    申请日:2006-11-30

    IPC分类号: G01B5/28

    CPC分类号: G01Q60/32 G01Q30/04

    摘要: A method and apparatus for its practice are provided of differentiating at least one component of a heterogeneous sample from other component(s) using harmonic resonance imaging and of obtaining information regarding the sample from the differentiation. In a preferred embodiment, an image is created of a property of a harmonic or a combination of a harmonics producing a response having a contrast factor between the sample's constituent components. The desired harmonic(s) can be identified either in a preliminary data acquisition procedure on the sample or, if the sample's constituent components are known in advance, predetermined. The desired harnonic(s) may be identified directly by the user or automatically through, e.g., pattern recognition. A compositional map may then be generated and displayed and/or additional information about the sample may be obtained.

    摘要翻译: 提供了一种用于其实践的方法和装置,其使用谐波共振成像将异质样品的至少一个组分与其他组分区分开,并且从差异化获得关于样品的信息。 在优选实施例中,产生具有谐波特性或谐波的组合的图像,产生具有样品组成成分之间的对比度因子的响应。 可以在样品的初步数据采集程序中识别所需的谐波,或者如果样品的组成成分预先已知,则预先确定。 期望的哈密顿可以由用户直接识别或通过例如模式识别自动识别。 然后可以生成和显示组成图,和/或可以获得关于样本的附加信息。

    Cantilever array sensor system
    25.
    发明申请
    Cantilever array sensor system 审中-公开
    悬臂阵列传感器系统

    公开(公告)号:US20050121615A1

    公开(公告)日:2005-06-09

    申请号:US10975792

    申请日:2004-10-28

    摘要: An integrated cantilever sensor array system that accurately detects and measures the presence of target substances in various environmental conditions. The integrated cantilever sensor array system comprises a cantilever sensor measurement head, a cantilever sensor system for measuring the oscillatory properties of the cantilevers and a measurement chamber. The measurement head includes a cantilever array having at least one cantilever, a light source and a detector positioned to detect incoming light reflected by the cantilevers within the cantilever array. The cantilever sensor system measures the oscillatory properties generated by the cantilevers within the cantilever array. The system includes the cantilever array and a detection system that measures a signal related to the bending of the cantilever. In addition, optional components such as a high frequency clock, Q-Control, may be added to more accurately measure the oscillation of the cantilevers within the cantilever array. The measurement chamber includes a flow cell, a cantilever sensor array mounted within the flow cell. The flow cell is designed to minimize dead volume and unwanted air bubbles within the cell, which may reduce accuracy of measurement.

    摘要翻译: 集成的悬臂传感器阵列系统,能够准确地检测和测量各种环境条件下目标物质的存在。 集成的悬臂传感器阵列系统包括悬臂传感器测量头,用于测量悬臂的振荡特性的悬臂传感器系统和测量室。 测量头包括悬臂阵列,其具有至少一个悬臂,光源和检测器,定位成检测由悬臂阵列内的悬臂反射的入射光。 悬臂传感器系统测量由悬臂阵列内的悬臂产生的振荡特性。 该系统包括悬臂阵列和测量与悬臂弯曲有关的信号的检测系统。 此外,可以添加诸如高频时钟Q-Control等可选组件以更准确地测量悬臂阵列内的悬臂的振荡。 测量室包括流动池,安装在流动池内的悬臂传感器阵列。 流动池被设计成使细胞内的死体积和不需要的气泡最小化,这可能降低测量精度。

    Universal, microfabricated probe for scanning probe microscopes
    26.
    发明授权
    Universal, microfabricated probe for scanning probe microscopes 失效
    通用扫描探针显微镜的微波探测器

    公开(公告)号:US5166520A

    公开(公告)日:1992-11-24

    申请号:US701404

    申请日:1991-05-13

    摘要: A universal probe which can be used with many different types of scanning probe microscopes is disclosed. The probe is mounted on a flexible base. The flexible base may either be a flexible cantilevered beam or a flexible membrane. The probe is a sharply tapered probe and forms in general a squat hollow pyramid or cone. The apex of the pyramid or cone has an aperture defined therethrough with a small controlled diameter of the order of 10 to 50,000 Angstroms. The hollow within the probe is filled with a material chosen according to the type of the scanning probe microscope used and the underlying surface. A signal is coupled to the material in the tip of the probe from the scanning probe microscope to interact with the underlying surface.

    摘要翻译: 公开了可以与许多不同类型的扫描探针显微镜一起使用的通用探针。 探头安装在柔性基座上。 柔性基座可以是柔性悬臂梁或柔性膜。 探头是一个尖锐的锥形探头,通常形成一个蹲式空心金字塔或锥形。 金字塔或锥体的顶点具有通过其定义的孔,其直径约为10至50000埃。 探针内的中空填充有根据所使用的扫描探针显微镜类型和下表面选择的材料。 信号从扫描探针显微镜耦合到探针的尖端中的材料以与下面的表面相互作用。

    Method and apparatus for infrared scattering scanning near-field optical microscopy
    27.
    发明授权
    Method and apparatus for infrared scattering scanning near-field optical microscopy 有权
    用于红外散射扫描近场光学显微镜的方法和装置

    公开(公告)号:US09372154B2

    公开(公告)日:2016-06-21

    申请号:US14322768

    申请日:2014-07-02

    申请人: Craig Prater

    发明人: Craig Prater

    IPC分类号: G01Q30/02 G01N21/47 G01Q60/22

    CPC分类号: G01N21/47 G01Q30/02 G01Q60/22

    摘要: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation. Combined with frequency selective demodulation techniques, the near-field scattered light can be efficiently and accurately discriminated from background scattered light. These goals are achieved via a range of improvements including a large dynamic range detector, careful control of relative beam intensities, and high bandwidth demodulation techniques. In other embodiments, phase and amplitude stability are improved with a novel s-SNOM configuration.

    摘要翻译: 本发明涉及通过近场光学显微镜(s-SNOM)附近的红外散射扫描测量具有亚微米空间分辨率的材料的光学性质。 具体地,本发明通过实现高信噪比,高测量速度和高的光学幅度和相位精度来提供比现有技术更大的改进。 另外,在一些实施例中,它消除了对原位参考以计算光学相位或吸收光谱的波长相关光谱的需要。 这些目标通过改进的不对称干涉测量来实现,其中近场散射光被干涉仪中的参考光束干扰。 本发明通过布置比背景散射辐射强得多的参考光束来实现背景抑制的显着改进。 结合频率选择解调技术,可以高效,准确地区分近场散射光与背景散射光。 这些目标通过一系列改进实现,包括大型动态范围检测器,仔细控制相对光束强度和高带宽解调技术。 在其他实施例中,利用新颖的s-SNOM配置来提高相位和幅度稳定性。

    Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy
    28.
    发明申请
    Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy 审中-公开
    纳米级红外光谱与多频原子力显微镜

    公开(公告)号:US20150034826A1

    公开(公告)日:2015-02-05

    申请号:US13956156

    申请日:2013-07-31

    IPC分类号: G01Q60/30 G01N21/35

    摘要: Described are techniques for obtaining spectroscopic information from sub-micron regions of a sample using a probe microscope. The current invention uses the response of an AFM cantilever at a plurality of frequencies to substantially reduce the impact of background absorption away from the sub-micron region of interest. This innovation substantially improves the quality of spectra for top down illumination of samples that are not suitable for bottoms up illumination of the prior art.

    摘要翻译: 描述的是使用探针显微镜从样品的亚微米区域获得光谱信息的技术。 本发明使用AFM悬臂在多个频率下的响应基本上减少背景吸收远离感兴趣的亚微米区域的影响。 该创新大大提高了不适用于现有技术的底部照明的样品的自顶向下照射的光谱质量。

    High frequency deflection measurement of IR absorption with a modulated IR source
    29.
    发明授权
    High frequency deflection measurement of IR absorption with a modulated IR source 有权
    用调制IR光源进行红外吸收的高频偏转测量

    公开(公告)号:US08680467B2

    公开(公告)日:2014-03-25

    申请号:US13236115

    申请日:2011-09-19

    IPC分类号: G01J5/00 G01Q70/08 G01L9/00

    CPC分类号: G01Q30/02 G01N21/35 G01Q60/32

    摘要: A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.

    摘要翻译: 从样品表面获得亚微米分辨率IR吸收数据的方法。 探针显微镜探针与样品表面相互作用,而可调谐的红外辐射源照射样品尖端相互作用区域。 源以基本上与探针的谐振频率重叠的频率被调制,并且当探针与样品表面接触时可以以探针的接触共振频率调制源。 调制频率被连续地调整以考虑由于采样或其它变化引起的探头谐振频率的偏移。 使用各种技术来观察这种转移并以快速的方式完成调整。