Method of making superhard tips for micro-probe microscopy and field
emission
    21.
    发明授权
    Method of making superhard tips for micro-probe microscopy and field emission 失效
    制作超微观尖端的方法,用于微探针显微镜和场发射

    公开(公告)号:US5393647A

    公开(公告)日:1995-02-28

    申请号:US92780

    申请日:1993-07-16

    摘要: Forming micro-probe tips for an atomic force microscope, a scanning tunneling microscope, a beam electron emission microscope, or for field emission, by first thinning a tip of a first material, such as silicon. The tips are then reacted with a second material, such as atoms from an organic or ammonia vapor, at a temperature of about 1000.degree. C..+-.200.degree. C. and vacuum conditions for several minutes. Vapors such as methane, propane or acetylene will be converted to SiC or WC while ammonia will be converted to Si.sub.3 N.sub.4. The converted material will have different physical, chemical and electrical properties. For example, a SiC tip will be superhard, approaching diamond in hardness. Electrically conductive tips are suitable for field emission.

    摘要翻译: 通过首先使诸如硅的第一材料的尖端变薄,形成用于原子力显微镜,扫描隧道显微镜,束电子发射显微镜或用于场发射的微探针尖端。 然后将尖端与第二种材料(例如来自有机或氨蒸汽的原子)在约1000℃±200℃的温度和真空条件下反应数分钟。 蒸气如甲烷,丙烷或乙炔将转化为SiC或WC,而氨将转化为Si3N4。 转换的材料将具有不同的物理,化学和电学性能。 例如,SiC尖端将是超硬的,接近金刚石的硬度。 导电尖端适用于场发射。