公开(公告)号：US20210057198A1

公开(公告)日：2021-02-25

申请号：US16965437

申请日：2019-01-16

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masahiro KOTANI ,  Takayuki OHMURA

IPC: H01J49/00 ,  H01J49/16

Abstract: A sample support body is for ionization of a sample. The sample support body includes a substrate including a first surface and a second surface on sides opposite to each other, and a conduction layer provided at least on the first surface. A plurality of through-holes opening on the first surface and the second surface are formed in an effective region of the substrate, the effective region being for ionizing components of the sample. A width of a second opening on the second surface side is larger than a width of a first opening on the first surface side in each of the plurality of through-holes.

公开(公告)号：US20210050202A1

公开(公告)日：2021-02-18

申请号：US16966950

申请日：2019-01-30

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masahiro KOTANI ,  Takayuki OHMURA

IPC: H01J49/04 ,  H01J49/16

Abstract: An ionization method includes: a first process of preparing a sample support that includes a substrate formed with a plurality of through-holes opening to a first surface and a second surface and a conduction layer provided on at least the first surface; a second process of dropping a solution including a sample to the second surface in a state in which the sample support is supported such that the second surface is located above; a third process of moving components of the sample from a side of the second surface into the plurality of through-holes in the state in which the sample support is supported such that the second surface is located above, and drying the components of the sample; and a fourth process of applying a laser beam to the first surface while applying a voltage to the conductive layer, and thus ionizing the components of the sample.

公开(公告)号：US20210050201A1

公开(公告)日：2021-02-18

申请号：US16966930

申请日：2018-11-30

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masahiro KOTANI ,  Takayuki OHMURA ,  Takamasa IKEDA

IPC: H01J49/04

Abstract: A sample support body is a sample support body for ionizing a sample, including: a substrate having an irregular porous structure formed to communicate a first surface and a second surface opposite to each other; and a conductive layer provided at least on the first surface.

公开(公告)号：US20210028002A1

公开(公告)日：2021-01-28

申请号：US16966122

申请日：2018-12-12

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Miu TAKIMOTO ,  Takayuki OHMURA ,  Masahiro KOTANI

IPC: H01J49/04 ,  H01J49/16

Abstract: A sample support body for ionizing a sample, including: a first layer formed with a plurality of first through holes; a conductive layer provided on a surface of the first layer; and a second layer provided on the first layer on a side opposite to the conductive layer and formed with a plurality of second through holes, in which the plurality of first through holes and the plurality of second through holes extend in a thickness direction of the first layer and the second layer, each of the plurality of second through holes is communicated with one or more first through holes of the plurality of first through holes, a width of the first through hole is smaller than a width of the second through hole, and an opening rate of the first through hole is less than an opening rate of the second through hole.

公开(公告)号：US20200013608A1

公开(公告)日：2020-01-09

申请号：US16489753

申请日：2018-03-01

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Yasuhide NAITO ,  Masahiro KOTANI ,  Takayuki OHMURA

IPC: H01J49/26 ,  H01J49/16 ,  G01N1/28

Abstract: A mass spectrometry device according to one aspect of the invention includes: a sample stage on which a sample is placed and on which a sample support having a substrate, in which a plurality of through-holes passing from one surface thereof to the other surface thereof are provided, and a conductive layer, which covers at least a portion of the one surface which is not provided with the through-holes, is placed such that the other surface faces the sample; a laser beam application unit that controls application of a laser beam such that the laser beam is applied to an imaging target region on the one surface; and a detector that detects the sample ionized by the application of the laser beam in a state where a positional relation of the sample in the imaging target region is maintained.

公开(公告)号：US20170358436A1

公开(公告)日：2017-12-14

申请号：US15540579

申请日：2016-08-26

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Yasuhide NAITO ,  Masahiro KOTANI ,  Takayuki OHMURA

IPC: H01J49/04 ,  B01L3/00 ,  G01N27/62

CPC classification number: H01J49/0418 ,  B01L3/5027 ,  B01L2300/0819 ,  G01N27/62

Abstract: A sample support according to an aspect is a sample support for a surface-assisted laser desorption/ionization method, and includes: a substrate in which a plurality of through-holes passing from one surface thereof to the other surface thereof are provided; and a conductive layer that is formed of a conductive material and covers at least the one surface. The through-holes have a width of 1 to 700 nm, and the substrate has a thickness of 1 to 50 μm.

公开(公告)号：US20250095977A1

公开(公告)日：2025-03-20

申请号：US18728112

申请日：2022-09-05

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takamasa IKEDA ,  Masahiro KOTANI ,  Takayuki OHMURA

IPC: H01J49/04 ,  H01J49/00

Abstract: A sample support includes: a substrate having a first surface, a second surface opposite to the first surface, and a porous structure opening at least to the first surface; a protective layer provided to cover a surface of the porous structure; and a conductive layer provided so as to cover a portion of the protective layer at least provided on the first surface.

公开(公告)号：US20240404816A1

公开(公告)日：2024-12-05

申请号：US18687528

申请日：2022-06-22

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masahiro KOTANI ,  Takayuki OHMURA

IPC: H01J49/04 ,  H01J49/16 ,  H01J49/26

Abstract: The support unit includes a first support body and a second support body. The first support body includes an ionization substrate. The second support body is disposed to face the first support body. The second support body includes a support substrate and an adhesive layer. A placement surface of the support substrate has a first region and a second region. The first region overlaps the measurement region when viewed in a Z-axis direction. The second region has conductivity and includes a region configured not to overlap the first support body when viewed in the Z-axis direction. The adhesive layer has a first portion and a second portion. The first portion is provided in the first region. The second portion has conductivity and electrically connects the second region and the conductive layer of the first support body.

公开(公告)号：US20230290625A1

公开(公告)日：2023-09-14

申请号：US18018314

申请日：2021-06-01

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takamasa IKEDA ,  Masahiro KOTANI ,  Akira TASHIRO ,  Takayuki OHMURA

IPC: H01J49/04 ,  H01J49/16 ,  H01J49/00

CPC classification number: H01J49/0409 ,  H01J49/165 ,  H01J49/0031 ,  H01J49/26

Abstract: A sample support is a sample support for ionizing a sample. The sample support includes a substrate that includes a first surface having electrical insulating property, a second surface opposite to the first surface, and an irregular porous structure that opens to at least the first surface.

公开(公告)号：US20230114331A1

公开(公告)日：2023-04-13

申请号：US17908105

申请日：2021-01-15

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masahiro KOTANI ,  Takayuki OHMURA ,  Akira TASHIRO

IPC: H01J49/04 ,  H01J49/16

Abstract: A sample support used for ionizing a component of a sample includes: a substrate having a first surface, a second surface opposite the first surface, and a plurality of through-holes that are open on the first surface and on the second surface; a conductive layer provided on at least the first surface; and an anionizing agent provided in the plurality of through-holes to anionize the component.