System and method for uniformity correction
    22.
    发明授权
    System and method for uniformity correction 有权
    用于均匀校正的系统和方法

    公开(公告)号:US07525641B2

    公开(公告)日:2009-04-28

    申请号:US11295517

    申请日:2005-12-07

    IPC分类号: G03B27/72 G03B27/42

    摘要: A system and method for uniformity correction is provided. The system includes a plurality of winged correction elements inserted into the illumination field in a defined configuration. Adjacent winged correction elements are overlapped to minimize induced uniformity ripple. Each winged correction element has a first protrusion on a longitudinal edge of the correction element and a second protrusion on the opposite longitudinal edge. The slope of a sloped edge of the first protrusion and the slope of a sloped edge of the second protrusion are tied to the slope of a gradient in the non-uniformity profile of the illumination field. In addition, the angles defined by the flat tip of the correction element and the sloped edge of the first and second protrusions are tied to the angle of a gradient of the illumination field.

    摘要翻译: 提供了一种用于均匀性校正的系统和方法。 该系统包括以限定的构造插入到照明场中的多个翼状校正元件。 相邻的有翼校正元件被重叠以最小化诱导的均匀性纹波。 每个翼状校正元件在校正元件的纵向边缘上具有第一突出部,并且在相对的纵向边缘上具有第二突起。 第一突起的倾斜边缘的斜率和第二突起的倾斜边缘的斜率与照明场的不均匀轮廓中的梯度的斜率相关联。 此外,由校正元件的平坦尖端和第一和第二突起的倾斜边缘限定的角度与照明场的梯度的角度相关联。

    MEASUREMENT APPARATUS AND METHOD
    26.
    发明申请
    MEASUREMENT APPARATUS AND METHOD 审中-公开
    测量装置和方法

    公开(公告)号:US20100020300A1

    公开(公告)日:2010-01-28

    申请号:US12506481

    申请日:2009-07-21

    IPC分类号: G03B27/54

    摘要: According to an aspect of the present invention, a method of controlling a measurement apparatus for determining a property of an individually controllable element of an array of individually controllable elements, the array of individually controllable elements being capable of controlling a distribution of a beam of radiation, is disclosed. The method includes, for a sequence of a plurality of individually controllable elements: directing a measurement beam of radiation at an individually controllable element of the plurality of individually controllable elements; and detecting the measurement beam once it has been re-directed by the individually controllable element, wherein the sequence in which the method is undertaken for the plurality of individually controllable elements is related to the orientation of the plurality of individually controllable elements when the plurality of individually controllable elements are oriented to control a distribution of a beam of radiation.

    摘要翻译: 根据本发明的一个方面,一种控制测量装置的方法,所述测量装置用于确定独立可控元件阵列的独立可控元件的特性,所述独立可控元件的阵列能够控制辐射束的分布 ,被披露。 该方法包括:对于多个独立可控元件的序列:将测量光束射向多个独立可控元件的独立可控元件; 并且一旦所述测量光束被所述可独立控制的元件重新引导,就检测所述测量光束,其中,所述多个独立可控元件进行所述方法的顺序与所述多个独立可控元件的取向相关, 独立可控元件被定向成控制辐射束的分布。

    Lithographic apparatus and device manufacturing method
    28.
    发明申请
    Lithographic apparatus and device manufacturing method 有权
    光刻设备和器件制造方法

    公开(公告)号:US20080186468A1

    公开(公告)日:2008-08-07

    申请号:US12000092

    申请日:2007-12-07

    IPC分类号: G03B27/54

    摘要: A method for configuring an illumination source of a lithographic apparatus is presented. The method includes dividing the illumination source into pixel groups, each pixel group including one or more illumination source points; selecting an illumination shape to expose a pattern, the illumination shape formed with at least one pixel group; iteratively calculating a lithographic metric as a result of a change of state of a pixel group in the illumination source, the change of the state of the pixel group creating a modified illumination shape; and adjusting the illumination shape based on the iterative results of calculations.

    摘要翻译: 提出了一种用于配置光刻设备的照明源的方法。 该方法包括将照明源分为像素组,每个像素组包括一个或多个照明源点; 选择照射形状以露出图案,所述照明形状由至少一个像素组形成; 作为照明源中的像素组的状态变化的结果,创建修改的照明形状的像素组的状态的变化,迭代地计算光刻度量; 并根据迭代计算结果调整照明形状。

    Lithographic apparatus and device manufacturing method
    29.
    发明授权
    Lithographic apparatus and device manufacturing method 有权
    光刻设备和器件制造方法

    公开(公告)号:US07397535B2

    公开(公告)日:2008-07-08

    申请号:US11312649

    申请日:2005-12-21

    IPC分类号: G03B27/42 G03B27/54

    CPC分类号: G03F7/70141 G03F7/70091

    摘要: Lithographic apparatus includes an illumination system for conditioning a radiation beam, a support for supporting a patterning device for imparting a cross-sectional pattern to the radiation beam to form a patterned radiation beam, and a substrate table for holding a substrate. A projection system is provided for projecting the patterned radiation beam onto a target portion of the substrate. Conditioning optics and an adjustable aperture are provided to condition the radiation beam from the illumination system, and a detector is provided to detect the size and divergence of the radiation beam propagated through the aperture and to provide a feedback signal in dependence thereon. An actuator serves to effect adjustment of at least one of the optics and the aperture to vary at least one optical characteristic of the radiation beam, and a control device is provided to control the actuator in response to the feedback signal from the detector.

    摘要翻译: 平版印刷设备包括用于调节辐射束的照明系统,用于支撑用于赋予辐射束以形成图案化辐射束的横截面图案的图案形成装置的支撑件以及用于保持衬底的衬底台。 提供了一种投影系统,用于将图案化的辐射束投影到基板的目标部分上。 提供调理光学元件和可调节孔径以调节来自照明系统的辐射束,并且提供检测器以检测通过孔传播的辐射束的尺寸和发散度,并根据其提供反馈信号。 致动器用于实现至少一个光学元件和孔径的调节以改变辐射束的至少一个光学特性,并且提供控制装置以响应于来自检测器的反馈信号来控制致动器。

    Mirror array for lithography
    30.
    发明申请
    Mirror array for lithography 有权
    用于光刻的镜阵列

    公开(公告)号:US20070285638A1

    公开(公告)日:2007-12-13

    申请号:US11448152

    申请日:2006-06-07

    IPC分类号: G03B27/42

    摘要: A mirror array apparatus includes a carrier configured to support a plurality of individually adjustable reflective elements. At least one actuator is associated with each reflective element, the actuator being configured to adjust the orientation or position of the associated reflective element. The apparatus further includes a liquid in contact with at least a portion of the reflective elements.

    摘要翻译: 镜阵列装置包括被配置为支撑多个可单独调节的反射元件的载体。 至少一个致动器与每个反射元件相关联,致动器被配置成调节相关联的反射元件的取向或位置。 该装置还包括与至少一部分反射元件接触的液体。