Methods and apparatus for integrated, automatic pseudo localization of software
    21.
    发明授权
    Methods and apparatus for integrated, automatic pseudo localization of software 有权
    用于软件的集成,自动伪定位的方法和装置

    公开(公告)号:US08615732B2

    公开(公告)日:2013-12-24

    申请号:US11516023

    申请日:2006-09-05

    IPC分类号: G06F9/44

    CPC分类号: G06F8/71 G06F9/454

    摘要: Methods and articles of manufacture for integrated, automatic pseudo localization of software applications are disclosed herein. A pseudo localization process, comprised of one or more utility applications, is integrated into a build cycle for a developing software application to generate pseudo-translated user-interface code as part of a build process. A build application may then generate a pseudo-language build of the developing software application and/or development database to enable testing and identification of internationalization defects that would prevent effective localization of the software product for the international market.

    摘要翻译: 本文公开了用于软件应用的集成的,自动伪定位的方法和制造。 将一个或多个实用程序应用程序组成的伪定位过程集成到开发软件应用程序的构建周期中,以生成伪翻译的用户界面代码作为构建过程的一部分。 然后,构建应用程序可以生成开发的软件应用程序和/或开发数据库的伪语言构建,以便能够测试和识别将阻止软件产品在国际市场上的有效定位的国际化缺陷。

    Semiconductor device and method for manufacturing the same

    公开(公告)号:US08310005B2

    公开(公告)日:2012-11-13

    申请号:US13317781

    申请日:2011-10-28

    IPC分类号: H01L29/78

    摘要: A semiconductor device includes a semiconductor layer, a first diffused region formed in the semiconductor layer, a second diffused region formed in the first diffused region, a trench formed in the semiconductor layer, a gate electrode disposed in the trench, a top surface of the gate electrode being lower than a top surface of the semiconductor layer and sagging downwards in a center thereof, a non-doped silicate glass film disposed in the trench and formed over the gate electrode, a top surface of the silicate glass film sagging downwards in a center thereof, an oxide film disposed in the trench and formed over the non-doped silicate glass film, a top surface of the oxide film sagging downwards in a center, and a source electrode formed over the semiconductor layer so that the source electrode contacts the first and second diffusion regions, and the oxide film at the top surface thereof.

    Semiconductor device having trench gate structure
    24.
    发明授权
    Semiconductor device having trench gate structure 失效
    具有沟槽栅结构的半导体器件

    公开(公告)号:US07956409B2

    公开(公告)日:2011-06-07

    申请号:US12232074

    申请日:2008-09-10

    摘要: The present invention provides a vertical MOSFET which has striped trench gate structure which can secure avalanche resistance without increasing Ron. A vertical MOSFET 100 comprises a plurality of gate trenches 7 which is arranged in stripes, an array which is sandwiched with the plurality of gate trenches 7 and includes N+ source regions 4N+ and P+ base contact regions 5P+, and a diode region (anode region 6P+) which is formed so as to contact with two gate trenches 7. The N+ source regions 4N+ and the base contact regions 5P+ are alternately arranged along a longitudinal direction of the gate trench 7. Size of the diode region (anode region 6P+) corresponds to at least one of the N+ source regions 4N+ and two of the P+ base contact regions 5P+.

    摘要翻译: 本发明提供了一种具有条纹沟槽栅极结构的垂直MOSFET,其可以在不增加Ron的情况下确保雪崩电阻。 垂直MOSFET100包括多个栅极沟槽7,栅极沟槽7被布置成阵列,该阵列夹在多个栅极沟槽7之间并包括N +源极区域4N +和P +基极接触区域5P +,二极管区域(阳极区域6P + )形成为与两个栅极沟槽7接触.N +源极区域4N +和基极接触区域5P +沿着栅极沟槽7的纵向方向交替排列。二极管区域(阳极区域6P +)的尺寸对应于 N +源极区域4N +和P +基极接触区域5P + +中的至少一个。

    Semiconductor device having zener diode and method for manufacturing the same
    25.
    发明申请
    Semiconductor device having zener diode and method for manufacturing the same 审中-公开
    具有齐纳二极管的半导体器件及其制造方法

    公开(公告)号:US20080142799A1

    公开(公告)日:2008-06-19

    申请号:US11984796

    申请日:2007-11-21

    申请人: Atsushi Kaneko

    发明人: Atsushi Kaneko

    IPC分类号: H01L27/06 H01L21/8234

    摘要: Disclosed herewith is a semiconductor device comprising a trench gate electrode and a zener diode, as well as a method for manufacturing the same. The trench gate electrode is formed in a semiconductor body and includes a first polycrystalline silicon layer doped with impurities of a first conductivity type at a first concentration. An extended gate electrode is elongated over the semiconductor body in contact with the trench gate electrode, and includes a second polycrystalline silicon layer doped with impurities of the first conductivity type at a second concentration that is lower than the first concentration. The zener diode is formed over the semiconductor body and includes a third polycrystalline silicon layer of a first conductivity type and a fourth polycrystalline silicon layer of a second conductivity type. The first polycrystalline silicon of the trench gate electrode is formed independently while the second polycrystalline silicon of the extended gate electrode and the third polycrystalline silicon of the zener diode are formed simultaneously, thereby the number of manufacturing processes is suppressed from increasing while the designing freedom of the zener diode is improved.

    摘要翻译: 本发明公开了一种包括沟槽栅电极和齐纳二极管的半导体器件及其制造方法。 沟槽栅电极形成在半导体本体中,并且包括以第一浓度掺杂有第一导电类型的杂质的第一多晶硅层。 延伸的栅电极在与沟槽栅电极接触的半导体本体上延伸,并且包括掺杂有低于第一浓度的第二浓度的第一导电类型的杂质的第二多晶硅层。 齐纳二极管形成在半导体本体上,并且包括第一导电类型的第三多晶硅层和第二导电类型的第四多晶硅层。 沟槽栅电极的第一多晶硅独立形成,同时形成扩展栅电极的第二多晶硅和齐纳二极管的第三多晶硅,从而抑制制造工艺的数量增加,同时设计自由度 齐纳二极管得到改进。

    Semiconductor device and method for manufacturing the same
    26.
    发明申请
    Semiconductor device and method for manufacturing the same 有权
    半导体装置及其制造方法

    公开(公告)号:US20080135921A1

    公开(公告)日:2008-06-12

    申请号:US11984043

    申请日:2007-11-13

    IPC分类号: H01L29/788 H01L21/76

    摘要: An epitaxial layer is formed on an n+ semiconductor substrate by epitaxial growth. A gate trench is formed to the surface of gate trench so that the bottom of gate trench reaches middle of the epitaxial layer. A gate insulator is formed on the inner wall of gate trench and a polysilicon is formed in the gate trench with the gate insulator interposed therebetween. An HTO film is formed on the surface of the polysilicon and the n− epitaxial layer. At this time, an ion plantation is performed to the epitaxial layer through the HTO film. Hence, a p diffused base layer, an n+ diffused source layer, an n+ diffused source layer is formed. A CVD oxide film is formed on the HTO film. After a BPSG having flowability is deposited on the CVD oxide film, the BPSG film is planarized with a heat treatment of 900-1100 degree Celsius.

    摘要翻译: 通过外延生长在n +半导体衬底上形成外延层。 栅极沟槽形成在栅极沟槽的表面,使得栅极沟槽的底部到达外延层的中间。 栅极绝缘体形成在栅极沟槽的内壁上,并且栅极沟槽中形成多晶硅,栅极绝缘体插入其间。 在多晶硅和n外延层的表面上形成HTO膜。 此时,通过HTO膜对外延层进行离子种植。 因此,形成p扩散基极层,n +扩散源极层,n +扩散源极层。 在HTO膜上形成CVD氧化膜。 在具有流动性的BPSG沉积在CVD氧化物膜上之后,通过900-1100℃的热处理将BPSG膜平坦化。

    Solid adhesive
    28.
    发明授权
    Solid adhesive 失效
    固体粘合剂

    公开(公告)号:US6042940A

    公开(公告)日:2000-03-28

    申请号:US988556

    申请日:1997-11-12

    摘要: A solid adhesive having adhesive resins, benzylidene sorbitol, isothyazoline preservatives, organic solvents, and about 25-60% water, the components being balanced such that the solid adhesive has good formability or shapability. A stick-shaped solid adhesive product made from the solid adhesive has a unique combination of shape-maintainability, bending strength, and crush strength.

    摘要翻译: 具有粘合树脂的固体粘合剂,亚苄基山梨醇,异噻唑啉防腐剂,有机溶剂和约25-60%的水,所述组分是平衡的,使得固体粘合剂具有良好的成形性或成形性。 由固体粘合剂制成的棒状固体粘合剂产品具有形状可维持性,弯曲强度和压碎强度的独特组合。

    SHAFT SEAL APPARATUS
    29.
    发明申请
    SHAFT SEAL APPARATUS 有权
    轴封装置

    公开(公告)号:US20140232070A1

    公开(公告)日:2014-08-21

    申请号:US13983331

    申请日:2012-05-18

    IPC分类号: F16J15/34

    摘要: A pumping ring 46 producing an axial flow of sealed flow is secured to a rotary shaft 6 at an axial position different from a rotary ring 56 so that the sealed fluid positioned in the sealed space 33 flows along the axial direction of the rotary shaft 6. A discharge hole 14 is formed on an inner circumferential surface of a seal cover 8 positioned in the downstream side of the axial flow of the sealed fluid resulting from a rotation of the pumping ring 46. An inflow hole 15 is formed in the upstream side of the axial flow of the sealed fluid resulting from the rotation of the pumping ring 46, so that the sealed fluid discharged from the discharge hole 14 returns to the inside of the sealed space from the inflow hole 15. On the inner circumferential surface of the seal cover 8 provided with the discharge hole 14, a baffle member 18 is provided so that it protrudes radially inward in order to block the flow of the sealed fluid along the rotating direction of a retainer 52 and orient the sealed fluid toward the discharge hole 14.

    摘要翻译: 产生密封流动的轴向流动的泵送环46在不同于旋转环56的轴向位置处固定到旋转轴6,使得位于密封空间33中的密封流体沿着旋转轴6的轴向流动。 在位于密封流体的轴向流动的下游侧的密封盖8的内周面上形成有排出孔14,该密封流体由泵送环46的旋转而产生。在流入孔15的上游侧形成有流入孔15 密封流体由泵送环46的旋转引起的轴向流动,使得从排出孔14排出的密封流体从流入孔15返回到密封空间的内部。在密封件的内周面上 设置有排放孔14的盖8设置有挡板构件18,以便径向向内突出,以阻挡密封流体沿着保持器52的旋转方向的流动, 密封流体朝向排出孔14。