MULTIPLE WRITE PROGRAMMING FOR A SEGMENT OF A MEMORY DEVICE

    公开(公告)号:US20250077416A1

    公开(公告)日:2025-03-06

    申请号:US18781838

    申请日:2024-07-23

    Abstract: A memory device can include a memory array including memory cells arranged in one or more pages. The memory array can be coupled to control logic to receive a first request to write first data to a page of the one or more pages and program the first data to the page of the one or more pages at a first time responsive to receiving the first request. The control logic is further to receive a second request to write second data to the page of the one or more pages, read the page of the one or more pages, and program the second data to the page of the one or more pages at a second time responsive to receiving the second request. The control logic can also receive an erase request to erase the one or more pages after the second time.

    MEMORY PROGRAMMING USING CONSECUTIVE COARSE-FINE PROGRAMMING OPERATIONS OF THRESHOLD VOLTAGE DISTRIBUTIONS

    公开(公告)号:US20230360705A1

    公开(公告)日:2023-11-09

    申请号:US18138551

    申请日:2023-04-24

    CPC classification number: G11C16/12 G11C16/08

    Abstract: A method includes causing a first set of memory cells, associated with a first wordline of a memory array, to be programmed with a first set of threshold voltage distributions; causing a second set of memory cells, associated with a second wordline adjacent to the first wordline, to be programmed with a second set of threshold voltage distributions; after programming the second set of cells, causing the first set of memory cells to be coarse programmed with an intermediate third set of threshold voltage distributions that is at least twice in number compared to the first set; and causing the first set of memory cells to be fine programmed with a final third set of threshold voltage distributions. At least some threshold voltage distributions of the final third set of threshold voltage distributions have wider read window margins than those of the intermediate third set of threshold voltage distributions.

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