公开(公告)号：US10663742B2

公开(公告)日：2020-05-26

申请号：US15906728

申请日：2018-02-27

Applicant: nLIGHT, Inc.

Inventor： Ken Gross ,  Scott Karlsen ,  Dahv A. V. Kliner ,  Roger Farrow

IPC: G02B27/09 ,  H01S3/067 ,  G02B6/028 ,  B23K26/06 ,  G02B6/255 ,  B23K26/073 ,  G02B6/036 ,  B23K26/57 ,  B23K26/064 ,  B23K26/062 ,  G02B6/14 ,  B23K26/38 ,  H01S3/00 ,  G02B6/26

Abstract: Disclosed herein are methods, apparatus, and systems for perturbing a laser beam propagating within a first length of fiber to adjust one or more beam characteristics of the laser beam in the first length of fiber or a second length of fiber or a combination thereof, coupling the perturbed laser beam into a second length of fiber and maintaining at least a portion of one or more adjusted beam characteristics within a second length of fiber having.

公开(公告)号：US20190250398A1

公开(公告)日：2019-08-15

申请号：US16388613

申请日：2019-04-18

Applicant: nLIGHT, Inc.

Inventor： Jay Small ,  Ken Gross ,  Vito P. Errico

IPC: G02B26/10 ,  G01B11/00

CPC classification number: G02B26/105 ,  G01B11/005 ,  G02B26/101

Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.

公开(公告)号：US20170205623A1

公开(公告)日：2017-07-20

申请号：US15410612

申请日：2017-01-19

Applicant: nLIGHT, Inc.

Inventor： Jay Small ,  Ken Gross ,  Vito P. Errico

IPC: G02B26/10 ,  G01B11/00

CPC classification number: G02B26/105 ,  G01B11/005 ,  G02B26/101

Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.

公开(公告)号：US20170189992A1

公开(公告)日：2017-07-06

申请号：US15396738

申请日：2017-01-02

Applicant: nLIGHT, Inc.

Inventor： Adam Dittli ,  Ken Gross

IPC: B23K26/0622 ,  B23K26/00 ,  B23K26/352 ,  B41M5/00 ,  H01S3/00 ,  H01S3/23 ,  H01S3/094 ,  B41M5/26 ,  B23K26/082 ,  H01S3/067

CPC classification number: B23K26/0624 ,  B23K26/0006 ,  B23K26/0648 ,  B23K26/082 ,  B23K26/083 ,  B23K26/352 ,  B23K26/359 ,  B23K2101/35 ,  B23K2103/10 ,  B23K2103/166 ,  B23K2103/172 ,  B41M5/0052 ,  B41M5/0058 ,  B41M5/262 ,  B41M2205/04 ,  H01S3/0071 ,  H01S3/067 ,  H01S3/06754 ,  H01S3/094076 ,  H01S3/0941 ,  H01S3/2308

Abstract: A method includes generating a plurality of pulse bursts with a predetermined quantity of intra-burst pulses in each pulse burst and a temporal spacing between the intra-burst pulses, and with a pulse burst frequency, and scanning the pulse bursts across an anodized target at a scan rate so that the pulse bursts overlap at the anodized target by an amount that is above an overlap damage threshold and the intra-burst pulses provide a peak power and peak fluence that are below an ablation threshold of the anodized target so as to produce a laser mark on the anodized target with an L value of less than or equal to 30 and without a damage to an anodized layer of the anodized target.