公开(公告)号：US20250020569A1

公开(公告)日：2025-01-16

申请号：US18350690

申请日：2023-07-11

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater ,  Kevin Kjoller ,  Eoghan Dillon ,  Andrew Stuart

IPC: G01N15/14

Abstract: Detection of microplastics is accomplished using a combination of techniques. A position-detection technique such as crossed-polarization detection, autofluorescence detection, or photothermal infrared imaging is used to determine the locations of microplastics in a sample. Infrared absorption can be detected at those locations to characterize the microplastics. In this way the microplastic content can be located and characterized more quickly and accurately than using conventional techniques.

公开(公告)号：US20240353324A1

公开(公告)日：2024-10-24

申请号：US18300858

申请日：2023-04-14

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater ,  Derek Decker ,  David Grigg

IPC: G01N21/3563

CPC classification number: G01N21/3563

Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.

公开(公告)号：US11982621B2

公开(公告)日：2024-05-14

申请号：US17937447

申请日：2022-10-01

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater

IPC: G01N21/64

CPC classification number: G01N21/6456 ,  G01N21/6486 ,  G01N2201/062 ,  G01N2201/0636

Abstract: Methods and systems described herein detect autofluorescence of a sample. These methods and systems obviate the need for addition of fluorophores to samples to create IR absorption.

公开(公告)号：US20240118208A1

公开(公告)日：2024-04-11

申请号：US17937447

申请日：2022-10-01

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater

IPC: G01N21/64

CPC classification number: G01N21/6456 ,  G01N21/6486 ,  G01N2201/062 ,  G01N2201/0636

Abstract: Methods and systems described herein detect autofluorescence of a sample. These methods and systems obviate the need for addition of fluorophores to samples to create IR absorption

公开(公告)号：US20240060885A1

公开(公告)日：2024-02-22

申请号：US18385233

申请日：2023-10-30

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater ,  Derek Decker ,  Roshan Shetty

IPC: G01N21/3563 ,  G06T7/00 ,  G02B21/06 ,  G02B21/36 ,  C12M1/00 ,  C12M1/26 ,  C12M1/34 ,  C12M1/36 ,  C12N1/12 ,  H04N23/74 ,  H04N23/741

CPC classification number: G01N21/3563 ,  G06T7/97 ,  G02B21/06 ,  G02B21/365 ,  C12M21/02 ,  C12M29/00 ,  C12M29/04 ,  C12M29/22 ,  C12M33/00 ,  C12M39/00 ,  C12M41/12 ,  C12M41/26 ,  C12M41/34 ,  C12M41/36 ,  C12M41/44 ,  C12M41/48 ,  C12N1/12 ,  H04N23/74 ,  H04N23/741 ,  G01N2201/061 ,  G01N2201/062 ,  G06T2207/10048 ,  G06T2207/10056 ,  G06T2207/10152

Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.

公开(公告)号：US11879837B2

公开(公告)日：2024-01-23

申请号：US17250124

申请日：2019-05-31

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater ,  Derek Decker ,  Roshan Shetty

IPC: G01N21/3563 ,  G06T7/00 ,  G02B21/06 ,  G02B21/36 ,  C12M1/00 ,  C12M1/26 ,  C12M1/34 ,  C12M1/36 ,  C12N1/12 ,  H04N23/74 ,  H04N23/741

CPC classification number: G01N21/3563 ,  C12M21/02 ,  C12M29/00 ,  C12M29/04 ,  C12M29/22 ,  C12M33/00 ,  C12M39/00 ,  C12M41/12 ,  C12M41/26 ,  C12M41/34 ,  C12M41/36 ,  C12M41/44 ,  C12M41/48 ,  C12N1/12 ,  G02B21/06 ,  G02B21/365 ,  G06T7/97 ,  H04N23/74 ,  H04N23/741 ,  G01N2201/061 ,  G01N2201/062 ,  G06T2207/10048 ,  G06T2207/10056 ,  G06T2207/10152

Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.

公开(公告)号：US20230129884A1

公开(公告)日：2023-04-27

申请号：US17912794

申请日：2021-07-20

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater

IPC: G01N21/64 ,  G01N21/3563

Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.

公开(公告)号：US11519861B2

公开(公告)日：2022-12-06

申请号：US17381021

申请日：2021-07-20

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater

IPC: G01N21/64 ,  G01N21/359 ,  G01J3/02 ,  G01N21/35

Abstract: Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.

公开(公告)号：US20200309681A1

公开(公告)日：2020-10-01

申请号：US16366982

申请日：2019-03-27

Applicant: Photothermal Spectroscopy Corp.

Inventor： Craig Prater ,  Mustafa Kansiz

IPC: G01N21/27 ,  G01J3/10 ,  G01N21/35 ,  G06N20/00

Abstract: Properties of a sample that are dependent upon wavelength, such as IR absorption, can be detected and deconstructed into wavelets or other basis functions. These basis functions can be compared to determine which have a relatively high likelihood of being noise or signal, and an attenuation factor can be applied to each wavelet. A spectrum can be reconstructed from these wavelets that exhibits a significantly higher signal-to-noise ratio than raw data co-adding would produce in significantly less measurement time.

公开(公告)号：US20250003797A1

公开(公告)日：2025-01-02

申请号：US18886924

申请日：2024-09-16

Applicant: Photothermal Spectroscopy Corp.

Inventor： Derek Decker ,  Craig Prater

IPC: G01J3/02 ,  G01J3/10

Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.