摘要:
An impedance adjusting circuit includes: a first calibration resistor circuit configured to be calibrated with an external resistor and generate a first calibration code; a second calibration resistor circuit configured to be calibrated with the first calibration resistor circuit and generate a second calibration code, the second calibration resistor circuit being connected to a first node; and a transmission line circuit configured to be responsive to a control signal to connect the first node to a pin of a system employing the impedance adjusting circuit.
摘要:
A semiconductor memory device has a simple layout pattern of a sub hole region. The semiconductor memory device includes a segment input/output line, a first local input/output line and a second local input/output line corresponding to the segment input/output line, an input/output switch configured to selectively connect the segment input/output line and the first local input/output line in response to a first switch control signal, and a dummy input/output switch which is connected to a second local input/output line but is not connected to the segment input/output line.
摘要:
An internal voltage generator according to the present invention stably supplies an internal voltage regardless a level of power voltage input from a source external to a semiconductor memory device. The present invention includes a dead zone controller to generate a reference voltage, a high reference voltage and a low reference voltage based on an inputted power voltage; and an internal power generator to generate an internal power based on the reference voltage by comparing the internal power with the high reference voltage and the low reference voltage.
摘要:
A circuit for outputting temperature data of a semiconductor memory apparatus includes a temperature detecting circuit that generates a temperature voltage corresponding to a change in temperature and outputs the temperature voltage, an A/D converter that converts the temperature voltage into a first temperature code and outputs it, and a temperature data correcting unit that outputs a second temperature code obtained by correcting an error of the first temperature code using a correction code.
摘要翻译:用于输出半导体存储装置的温度数据的电路包括温度检测电路,其产生与温度变化相对应的温度电压并输出温度电压; A / D转换器,其将温度电压转换为第一温度代码,并输出 以及温度数据校正单元,其输出通过使用校正代码校正第一温度代码的误差而获得的第二温度代码。
摘要:
A semiconductor memory device includes a bank, a data transfer line, a precharge control circuit, and a precharge line. The bank includes a multiplicity of cell mats arranged in a matrix form. Each of the cell mats has a plurality of unit cells. The data transfer line arranged between the cell mats transfers a data signal outputted from a selected cell mat among the cell mats. The precharge control circuit disposed on the edge of the bank controls the precharge of the data transfer line. The precharge line arranged between first and second cell mats transfers a precharge voltage to the precharge control circuit. The first and the second cell mats are disposed in the center of the bank.
摘要:
An internal voltage generator for stably generating an internal voltage includes a latch unit for outputting a first and a second driving signals based on a periodic signal; a first pump block for generating the internal voltage in response to the first driving signal; and a second pump block for generating the internal voltage in response to the second driving signal.
摘要:
An internal voltage generator for stably generating an internal voltage includes a latch unit for outputting a first and a second driving signals based on a periodic signal; a first pump block for generating the internal voltage in response to the first driving signal; and a second pump block for generating the internal voltage in response to the second driving signal.
摘要:
A semiconductor device includes a plurality of pads configured to receive a plurality of external signals, an internal circuit configured to perform a predetermined internal operation in response to one of the external signals that is inputted through one of the plurality of pads, and a signal transferring unit configured to receive the external signal, output the external signal to an internal circuit an output signal during a normal mode, and output a fixed signal regardless of changes in the external signal to the internal circuit in a test mode.
摘要:
A semiconductor device includes a plurality of pads configured to receive a plurality of external signals, an internal circuit configured to perform a predetermined internal operation in response to one of the external signals that is inputted through one of the plurality of pads, and a signal transferring unit configured to receive the external signal, output the external signal to an internal circuit an output signal during a normal mode, and output a fixed signal regardless of changes in the external signal to the internal circuit in a test mode.
摘要:
Embodiments of the present invention are directed to provide an internal voltage generator of a semiconductor memory device for generating a predetermined stable level of an internal voltage. The semiconductor memory device includes a control signal generator, an internal voltage generator and an internal voltage compensator. The control signal generator generates a reference signal and a compensating signal which are corresponding to voltage level of the reference signal. The internal voltage generator generates an internal voltage in response to the reference signal. The internal voltage compensator compensates the internal voltage in response to the compensating signal.