Abstract:
A calibrated measurement circuit, with a first node, a second node, a circuit element coupled between the first node and the second node, and a reference circuit element. The calibrated measurement circuit also comprises circuitry for directing a first current and a second current between the first node and the second node and to the reference circuit element. The calibrated measurement circuit also comprises circuitry for measuring voltage across the circuit element in response to the first and second currents, and circuitry for measuring voltage across the reference circuit element in response to the first and second currents. A calibration factor is also determined for calibrating measured voltages across the circuit element, in response to a relationship between the first voltage, the second voltage, and the reference circuit element.
Abstract:
A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
Abstract:
A system, method and apparatus for tuning an internal oscillator to a desired frequency F1 is shown and uses an RC delay element that comprises a resistor, a capacitor and a comparator. The method includes receiving a clock signal from an oscillator to be tuned, triggering charging of the RC delay element, and N clock cycles after triggering the charging, the method determines whether the charge on the precision RC delay element is higher than or lower than a reference voltage. Correction to the clock frequency is based on the results.
Abstract:
A system, method and apparatus for tuning an internal oscillator to a desired frequency F1 is shown and uses an RC delay element that comprises a resistor, a capacitor and a comparator. The method includes receiving a clock signal from an oscillator to be tuned, triggering charging of the RC delay element, and N clock cycles after triggering the charging, the method determines whether the charge on the precision RC delay element is higher than or lower than a reference voltage. Correction to the clock frequency is based on the results.
Abstract:
An example apparatus includes: digitally locked loop (DLL) circuitry coupled to a clock terminal and configured to generate a plurality of delayed clocks at a plurality of delayed clock terminals based on a reference clock of the clock terminal; first retimer circuitry coupled to the plurality of delayed clock terminals, a first data terminal, and a second data terminal, the first retimer circuitry configured to delay and serialize data of the first data terminal and the second data terminal using at least one of the delayed clocks of the plurality of delayed clock terminals; and second retimer circuitry coupled to the plurality of delayed clock terminals, a third data terminal, and a fourth data terminal, the second retimer circuitry configured to delay and serialize data of the third data terminal and the fourth data terminal.
Abstract:
A system includes an oscillator comprising a first switch, a current source, a capacitor, and a comparator, the capacitor and the comparator coupled at a node. The system includes one or more delay buffers coupled to the comparator. The system includes a first inverter coupled to the one or more delay buffers. The system includes a first buffer coupled to the one or more delay buffers. The system includes a first coupling capacitor coupled to the first inverter and the first buffer via second and third switches, respectively. The system includes a second inverter coupled to the one or more delay buffers. The system includes a second buffer coupled to the one or more delay buffers. The system includes a second coupling capacitor coupled to the second inverter and the second buffer via fourth and fifth switches, respectively. The first and second coupling capacitors are coupled to the oscillator.
Abstract:
A system includes an oscillator comprising a first switch, a current source, a capacitor, and a comparator, the capacitor and the comparator coupled at a node. The system includes one or more delay buffers coupled to the comparator. The system includes a first inverter coupled to the one or more delay buffers. The system includes a first buffer coupled to the one or more delay buffers. The system includes a first coupling capacitor coupled to the first inverter and the first buffer via second and third switches, respectively. The system includes a second inverter coupled to the one or more delay buffers. The system includes a second buffer coupled to the one or more delay buffers. The system includes a second coupling capacitor coupled to the second inverter and the second buffer via fourth and fifth switches, respectively. The first and second coupling capacitors are coupled to the oscillator.
Abstract:
A system, method and apparatus for tuning an internal oscillator to a desired frequency F1 is shown and uses an RC delay element that comprises a resistor, a capacitor and a comparator. The method includes receiving a clock signal from an oscillator to be tuned, triggering charging of the RC delay element, and N clock cycles after triggering the charging, the method determines whether the charge on the precision RC delay element is higher than or lower than a reference voltage. Correction to the clock frequency is based on the results.
Abstract:
A system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.
Abstract:
A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.