公开(公告)号：US20080091372A1

公开(公告)日：2008-04-17

申请号：US11948921

申请日：2007-11-30

申请人： Hideki Sato ,  Yukio Wakui ,  Masayoshi Omura

发明人： Hideki Sato ,  Yukio Wakui ,  Masayoshi Omura

IPC分类号： G01C17/38

CPC分类号： G01C17/38

摘要： In a compass sensor unit, an azimuth data computing method is carried out by the steps of: inputting a signal from a geomagnetic sensor to measure magnetic field; determining whether to store measurement data of the magnetic field based on a distance from the last stored measurement data; calculating an offset value based on the stored data; making a comparison for each component of a plurality of measurement data used for calculating the offset value, and judging the offset value to be valid when a difference between the maximum and minimum values of each component is a given value or more; updating the already stored offset value to the offset value judged to be valid; and correcting newly provided measurement data by the updated offset value to compute azimuth data.

摘要翻译： 在罗盘传感器单元中，通过以下步骤执行方位数据计算方法：输入来自地磁传感器的信号以测量磁场; 基于距离最后存储的测量数据的距离确定是否存储磁场的测量数据; 基于所存储的数据计算偏移值; 对用于计算偏移值的多个测量数据的每个分量进行比较，并且当每个分量的最大值和最小值之间的差是给定值或更大时，判断偏移值是有效的; 将已经存储的偏移值更新为判断为有效的偏移值; 并通过更新的偏移值对新提供的测量数据进行校正，以计算方位数据。

公开(公告)号：US20070279080A1

公开(公告)日：2007-12-06

申请号：US11661276

申请日：2005-09-12

申请人： Tsuyoshi Ohtsuki ,  Hideki Sato

发明人： Tsuyoshi Ohtsuki ,  Hideki Sato

IPC分类号： G01R31/26

CPC分类号： G01R31/2889 ,  H01L22/14

摘要： The present invention is a method for evaluating a semiconductor wafer by measuring an electric characteristic of the semiconductor wafer by using a mercury electrode, wherein when the semiconductor wafer is held on a wafer chuck that the mercury electrode is formed in a holding surface of so that a side of a surface to be measured of the semiconductor wafer is set to a side of the wafer chuck, the semiconductor wafer is held on the wafer chuck whose diameter forming an outermost periphery of the holding surface is smaller than a diameter forming an outermost periphery of the surface to be measured of the semiconductor wafer, and then, the electric characteristic is measured by contacting the mercury electrode with the surface to be measured of the wafer, and an evaluation apparatus. Thereby, there can be provided an evaluation method and an evaluation apparatus for a semiconductor wafer by which when the semiconductor wafer is evaluated by measuring an electric characteristic thereof by using a mercury electrode, the semiconductor wafer can be high-precisely and effectively evaluated by setting a size of a holding surface of a wafer chuck to be smaller than that of a surface to be measured of the semiconductor wafer that is an object to be measured.

摘要翻译： 本发明是一种通过使用水银电极测量半导体晶片的电特性来评估半导体晶片的方法，其中当将半导体晶片保持在晶片卡盘上时，将汞电极形成在保持表面上，使得 将半导体晶片的待测表面的一侧设置在晶片卡盘的一侧，将半导体晶片保持在形成保持表面的最外周的直径小于形成最外周的直径的晶片卡盘上 的半导体晶片的待测表面，然后通过使水银电极与晶片的待测表面接触来测量电特性，以及评估装置。 因此，可以提供一种用于半导体晶片的评估方法和评估装置，当通过使用汞电极测量半导体晶片的电特性来评估半导体晶片时，可以通过设置高精度有效地评估半导体晶片 晶片卡盘的保持表面的尺寸要小于作为被测量对象的半导体晶片的待测量表面的尺寸。

公开(公告)号：US20070204789A1

公开(公告)日：2007-09-06

申请号：US10594458

申请日：2005-03-11

申请人： Hideki Sato

发明人： Hideki Sato

IPC分类号： C30B15/00 ,  C30B23/00

CPC分类号： G01N1/32 ,  H01L21/30604

摘要： A method for evaluating crystal defects of a silicon wafer comprising: etching a surface of the silicon wafer by immersing the wafer in an etching solution; and observing etch pits formed on the etched surface of the wafer, wherein the silicon wafer of which crystal defects are evaluated has low electrical resistivity of 1 Ω·cm or less, and the etching solution is a mixture of hydrofluoric acid, nitric acid, acetic acid and water further including iodine or iodide, in which a volume ratio of nitric acid in the etching solution is the largest among volume ratios of hydrofluoric acid, nitric acid, acetic acid and water, and the etching solution is adjusted to have an etching rate of 100 nm/min or less for the silicon wafer. Thereby, there is provided a method for evaluating crystal defects of a silicon wafer with low electrical resistivity by using a chromium-free etching solution without toxic chromium with high capability of detecting defects.

摘要翻译： 一种用于评估硅晶片的晶体缺陷的方法，包括：通过将晶片浸入蚀刻溶液中来蚀刻硅晶片的表面; 并且观察在晶片的蚀刻表面上形成的蚀刻凹坑，其中评估晶体缺陷的硅晶片具有低于1Ω·cm或更小的电阻率，并且蚀刻溶液是氢氟酸，硝酸，乙酸的混合物 另外还含有碘或碘化物的酸和水，其中蚀刻溶液中的硝酸的体积比在氢氟酸，硝酸，乙酸和水的体积比中最大，并且蚀刻溶液被调节为具有蚀刻速率 对于硅晶片为100nm / min以下。 因此，提供了一种通过使用无铬铬的无铬蚀刻溶液来评价具有低电阻率的硅晶片的晶体缺陷的方法，所述无铬蚀刻溶液具有高检测缺陷的能力。

公开(公告)号：US20070099349A1

公开(公告)日：2007-05-03

申请号：US11593588

申请日：2006-11-07

申请人： Hiroshi Adachi ,  Hiroshi Saitoh ,  Kenichi Shirasaka ,  Hideki Sato ,  Masayoshi Omura

发明人： Hiroshi Adachi ,  Hiroshi Saitoh ,  Kenichi Shirasaka ,  Hideki Sato ,  Masayoshi Omura

IPC分类号： H01L21/00

CPC分类号： G01R33/0206 ,  G01C17/30 ,  H01L21/565 ,  H01L23/49575 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L2224/451 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49171 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01019 ,  H01L2924/01021 ,  H01L2924/01029 ,  H01L2924/01039 ,  H01L2924/01047 ,  H01L2924/01051 ,  H01L2924/01078 ,  H01L2924/014 ,  H01L2924/14 ,  H01L2924/181 ,  Y10T29/49121 ,  Y10T29/49169 ,  Y10T29/49174 ,  H01L2924/00014 ,  H01L2924/00 ,  H01L2924/00012

摘要： A magnetic sensor is constituted using magnetic sensor chips mounted on stages supported by interconnecting members and a frame having leads in a lead frame. Herein, the stages are inclined upon plastic deformation of the interconnecting members. When the frame is held in a metal mold and the stages are pressed, the interconnecting members are elastically deformed, so that the magnetic sensor chips are bonded onto the stages placed substantially in the same plane and are then wired with the leads. Thereafter, the stages are released from pressure, so that the interconnecting members are restored from the elastically deformed states thereof. When the magnetic sensor chips are combined together to realize three sensing directions, it is possible to accurately measure three-dimensional bearings of magnetism, and the magnetic sensor can be reduced in dimensions and manufactured with a reduced cost therefor.

公开(公告)号：US07210235B2

公开(公告)日：2007-05-01

申请号：US11479970

申请日：2006-06-30

申请人： Hideki Sato

发明人： Hideki Sato

IPC分类号： G01C17/02

CPC分类号： G01C17/38 ,  G01C21/20

摘要： In an azimuth/inclination-angle detection apparatus, a measurement data obtaining unit obtains first and second measurement data sets g and h from acceleration and magnetic sensors, respectively. A first computation unit calculates an azimuth α0, an elevation angle β0, and a geomagnetism depression angle θ0 from the measurement data sets g and h. An averaging unit accumulates and averages the geomagnetism depression angle θ0 so as to obtain a value to be used as a geomagnetism depression angle θ. A second computation unit calculates an azimuth α and an elevation angle β from the second measurement data set h and the geomagnetism depression angle θ. When a plurality of solutions exist, they are stored as candidates (α1, β1) and (α2, β2). A selection unit selects a detection value (α, β) from the candidates (α1, β1) and (α2, β2) with reference to the above-described values α0 and β0 serving as reference values.

摘要翻译： 在方位角/倾斜角检测装置中，测量数据获取单元分别从加速度和磁性传感器获得第一和第二测量数据集g和h。 第一计算单元从测量数据集g和h计算方位α0，仰角β0和地磁抑制角θ0。 平均单元积累并平均地磁俯角θ0，以获得要用作地磁俯角θ的值。 第二计算单元计算来自第二测量数据集h和地磁俯角θ的方位角α和仰角β。 当存在多个解决方案时，它们被存储为候选（α1，β1）和（α2，β2）。 选择单元参照作为参考值的上述值α0和β0从候选（α1，β1）和（α2，β2）中选择检测值（α，β）。

公开(公告)号：US07197343B2

公开(公告)日：2007-03-27

申请号：US10190525

申请日：2002-07-09

申请人： Hideki Sato

发明人： Hideki Sato

IPC分类号： H04M1/00

CPC分类号： H04M1/21 ,  G01C17/28 ,  G01C17/38 ,  H04M1/72522 ,  H04M2250/12

摘要： A portable phone has a CPU and a magnetic sensor unit including an X-axis magnetic sensor, a Y-axis magnetic sensor, and a temperature sensor. CPU measures at first and second temperatures the influence of a magnetic field of permanent magnets upon an output Sx of the X-axis magnetic sensor and an output Sy of the Y-axis magnetic sensor, and stores the influence data together with the first and second temperature data. CPU estimates at the present temperature the influence upon the output Sx of the X-axis magnetic sensor and the output Sy of the Y-axis magnetic sensor, from the present temperature detected with the temperature sensor and the stored influence data. CPU corrects the outputs Sx and Sy in accordance with the estimated influence and determines the direction of the portable phone from the corrected outputs Sx and Sy.

摘要翻译： 便携式电话具有包括X轴磁传感器，Y轴磁传感器和温度传感器的CPU和磁传感器单元。 CPU在第一和第二温度下测量永磁体的磁场对X轴磁传感器的输出Sx和Y轴磁传感器的输出Sy的影响，并将影响数据与第一和第二 温度数据。 CPU在当前温度下，从根据温度传感器检测到的当前温度和存储的影响数据对X轴磁传感器的输出Sx和Y轴磁传感器的输出Sy的影响。 CPU根据估计的影响来校正输出Sx和Sy，并根据校正的输出Sx和Sy确定便携式电话的方向。

公开(公告)号：US07170724B2

公开(公告)日：2007-01-30

申请号：US10686261

申请日：2003-10-16

申请人： Hideki Sato ,  Kokichi Aiso ,  Yukio Wakui

发明人： Hideki Sato ,  Kokichi Aiso ,  Yukio Wakui

IPC分类号： G11B5/127

CPC分类号： G01R33/093 ,  B82Y25/00 ,  B82Y40/00 ,  G01R33/0005 ,  G01R33/09 ,  H01F10/3268 ,  H01F10/3295 ,  H01F41/304 ,  Y10T29/49034 ,  Y10T29/49043 ,  Y10T29/49044 ,  Y10T29/49052 ,  Y10T29/49067

摘要： A magnetic sensor comprises magnetoresistive elements and permanent magnet films, which are combined together to form GMR elements formed on a quartz substrate having a square shape, wherein the permanent magnet films are paired and connected to both ends of the magnetoresistive elements, so that an X-axis magnetic sensor and a Y-axis magnetic sensor are realized by adequately arranging the GMR elements relative to the four sides of the quartz substrate. Herein, the magnetization direction of the pinned layer of the magnetoresistive element forms a prescribed angle of 45° relative to the longitudinal direction of the magnetoresistive element or relative to the magnetization direction of the permanent magnet film. Thus, it is possible to reliably suppress offset variations of bridge connections of the GMR elements even when an intense magnetic field is applied; and it is therefore possible to noticeably improve the resistant characteristics to an intense magnetic field.

摘要翻译： 磁传感器包括磁阻元件和永磁体膜，它们组合在一起以形成形成在具有正方形形状的石英衬底上的GMR元件，其中永磁体膜成对并连接到磁阻元件的两端，使得X 通过将GMR元件相对于石英基板的四个边进行适当配置来实现轴向磁传感器和Y轴磁传感器。 这里，磁阻元件的被钉扎层的磁化方向相对于磁阻元件的长度方向相对于永久磁铁膜的磁化方向形成45°的规定角度。 因此，即使施加强磁场，也可以可靠地抑制GMR元件的桥连接的偏移变化; 因此可以显着地提高对强磁场的电阻特性。

公开(公告)号：US20070019977A1

公开(公告)日：2007-01-25

申请号：US11352214

申请日：2006-02-13

申请人： Jun Sawamura ,  Masaharu Inaba ,  Hideki Sato ,  Yasuo Suzuki ,  Hitoshi Nanba

发明人： Jun Sawamura ,  Masaharu Inaba ,  Hideki Sato ,  Yasuo Suzuki ,  Hitoshi Nanba

IPC分类号： G03G15/20

CPC分类号： G03G15/2064 ,  G03G21/1633 ,  G03G21/1685 ,  G03G2221/1639

摘要： A fixing device includes a heating member disposed with an internal heating source and a pressuring member that presses against the heating member. The fixing device is configured to be attachable to and detachable from an image forming apparatus body, and includes: brackets that retain the heating member; pressuring levers that retain the pressuring member and are movably supported in the brackets; urging means that push the pressuring levers in a direction where the pressuring member presses against the heating member; and cams that are rotatably supported in the brackets, contact the pressuring levers, and adjust the pressuring force of the pressuring member.

摘要翻译： 定影装置包括设置有内部加热源的加热构件和压靠加热构件的加压构件。 固定装置构造成能够附接到图像形成装置主体上并可拆卸，并且包括：保持加热构件的支架; 加压杆，其保持加压构件并且可移动地支撑在支架中; 推压装置，在按压构件压靠加热构件的方向上推压加压杆; 并且可旋转地支撑在支架中的凸轮接触加压杆，并且调节加压构件的加压力。

公开(公告)号：US20060251059A1

公开(公告)日：2006-11-09

申请号：US11417147

申请日：2006-05-04

申请人： Shuichi Otsu ,  Junichi Nakamura ,  Hideki Sato

发明人： Shuichi Otsu ,  Junichi Nakamura ,  Hideki Sato

IPC分类号： H04L12/66

CPC分类号： H04L12/282 ,  H04L2012/2849

摘要： When apparatuses controllable via a network exist inside and outside a user's visual range, a user remotely controls at least one of the apparatuses via the network using a predetermined control point in a remote control system. The remote control system includes the following: a mechanism that causes the control point to transmit a command for specifying an apparatus to be controlled via the network to an apparatus to be specified in accordance with a user's apparatus specifying operation; and a mechanism that causes the apparatus that has received the command for specifying an apparatus to be controlled to transmit a response via the network to the control point as well as to perform an operation using a device attached to the body of the apparatus in response to the command.

摘要翻译： 当经由网络可控制的装置存在于用户的视觉范围内部和外部时，用户通过远程控制系统中的预定控制点通过网络远程控制装置中的至少一个。 遥控系统包括以下机构：使控制点将用于指定要经由网络控制的装置的命令发送到根据用户装置指定操作指定的装置; 以及使得已经接收到用于指定要控制的装置的命令的装置的装置经由网络向控制点发送响应并且使用附加到装置的主体的装置来响应于 命令。

公开(公告)号：US20060185182A1

公开(公告)日：2006-08-24

申请号：US11359485

申请日：2006-02-23

申请人： Hideki Sato

发明人： Hideki Sato

IPC分类号： G01C17/38

CPC分类号： G01C17/38

摘要： A portable terminal apparatus is mounted in a casing and has a magnetic sensor that detects a magnetic field around the casing with an offset and outputs magnetic data representing the detected magnetic field, and a tilt sensor that detects a tilt of the casing and sequentially outputs tilt data representing the detected tilt. In the portable terminal apparatus, a capture part sequentially captures the magnetic data from the magnetic sensor at a given time interval. A calculation part calculates the offset of the magnetic sensor based on a plurality of the magnetic data sequentially captured by the capture part. A detection part detects an orientation variation of the casing based on the tilt data sequentially outputted from the tilt sensor. A change part changes the time interval for sequentially capturing the magnetic data in accordance with the detected orientation variation.

摘要翻译： 便携式终端装置安装在壳体中并具有磁传感器，该磁传感器利用偏移检测壳体周围的磁场并输出表示检测到的磁场的磁数据;以及倾斜传感器，其检测壳体的倾斜并依次输出倾斜 表示检测到的倾斜的数据。 在便携式终端装置中，捕捉部件以给定的时间间隔顺序地捕获来自磁传感器的磁数据。 计算部分基于由捕获部分顺序捕获的多个磁数据来计算磁传感器的偏移。 检测部根据从倾斜传感器依次输出的倾斜数据来检测壳体的朝向变化。 改变部分根据检测到的取向变化改变顺序地捕获磁数据的时间间隔。