利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

37 条记录 (耗时 0.032 秒)

    Arrayed micro-ring spectrometer system and method of use
    21.
    发明授权
    Arrayed micro-ring spectrometer system and method of use 有权
    阵列微环光谱仪系统及使用方法

    公开(公告)号：US08174695B2

    公开(公告)日：2012-05-08

    申请号：US12508018

    申请日：2009-07-23

    申请人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

    发明人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

    IPC分类号： G01J3/28

    CPC分类号： G01J3/2823 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/18 ,  G01N21/6452 ,  G01N21/6454 ,  G01N21/648 ,  G01N2021/6421 ,  G01N2021/6478 ,  G02B5/188

    摘要： A spectrometer system includes an array of micro-zone plates (MZP) each having coaxially-aligned ring gratings, a sample plate for supporting and illuminating a sample, and an array of photon detectors for measuring a spectral characteristic of the predetermined wavelength. The sample plate emits an evanescent wave in response to incident light, which excites molecules of the sample to thereby cause an emission of secondary photons. A method of detecting the intensity of a selected wavelength of incident light includes directing the incident light onto an array of MZP, diffracting a selected wavelength of the incident light onto a target focal point using the array of MZP, and detecting the intensity of the selected portion using an array of photon detectors. An electro-optic layer positioned adjacent to the array of MZP may be excited via an applied voltage to select the wavelength of the incident light.

    摘要翻译： 光谱仪系统包括每个具有同轴对准的环形光栅的微区域阵列（MZP），用于支撑和照射样品的样品板，以及用于测量预定波长的光谱特性的光子检测器阵列。 样品板响应于入射光发射ev逝波，其激发样品的分子，从而引起次级光子的发射。 检测入射光的所选波长的强度的方法包括将入射光引导到MZP阵列上，使用MZP阵列将入射光的选定波长衍射到目标焦点，并检测所选择的 部分使用光子检测器阵列。 可以通过施加的电压激发邻近MZP阵列定位的电光层，以选择入射光的波长。

    Micro-Fresnel zone plate optical devices using densely accumulated ray points
    22.
    发明授权
    Micro-Fresnel zone plate optical devices using densely accumulated ray points 有权
    微菲涅耳带片光学器件使用密集积累的光点

    公开(公告)号：US08018815B2

    公开(公告)日：2011-09-13

    申请号：US12490747

    申请日：2009-06-24

    申请人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

    发明人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

    IPC分类号： G11B7/00

    CPC分类号： G11B7/1353 ,  G11B7/1374 ,  G11B2007/0006 ,  G11B2007/13722

    摘要： An embodiment generally relates to an optical device suitable for use with an optical medium for the storage and retrieval of data. The optical device includes an illumination means for providing a beam of optical radiation of wavelength λ and an optical path that the beam of optical radiation follows. The optical device also includes a diffractive optical element defined by a plurality of annular sections. The plurality of annular sections having a first material alternately disposed with a plurality of annular sections comprising a second material. The diffractive optical element generates a plurality of focal points and densely accumulated ray points with phase contrast phenomena and the optical medium is positioned at a selected focal point or ray point of the diffractive optical element.

    摘要翻译： 实施例一般涉及适合与光学介质一起使用以用于存储和检索数据的光学装置。 该光学装置包括用于提供波长λ的光束的照射装置和光辐射束跟随的光路。 光学装置还包括由多个环形部分限定的衍射光学元件。 所述多个环形部分具有交替设置有包括第二材料的多个环形部分的第一材料。 衍射光学元件产生具有相位对比现象的多个焦点和密集累积的光点，并且光学介质位于衍射光学元件的选定焦点或射线点处。

    Epitaxial growth of cubic crystalline semiconductor alloys on basal plane of trigonal or hexagonal crystal
    23.
    发明授权
    Epitaxial growth of cubic crystalline semiconductor alloys on basal plane of trigonal or hexagonal crystal 有权
    立方晶体半导体合金在三角晶体或六方晶体的基面上的外延生长

    公开(公告)号：US07906358B2

    公开(公告)日：2011-03-15

    申请号：US12254017

    申请日：2008-10-20

    申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King

    发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King

    IPC分类号： H01L21/00 ,  H01L29/22 ,  H01L29/20 ,  H01L21/02

    CPC分类号： G01N23/207

    摘要： Hetero-epitaxial semiconductor materials comprising cubic crystalline semiconductor alloys grown on the basal plane of trigonal and hexagonal substrates, in which misfit dislocations are reduced by approximate lattice matching of the cubic crystal structure to underlying trigonal or hexagonal substrate structure, enabling the development of alloyed semiconductor layers of greater thickness, resulting in a new class of semiconductor materials and corresponding devices, including improved hetero-bipolar and high-electron mobility transistors, and high-mobility thermoelectric devices.

    摘要翻译： 异质外延半导体材料包括在三角和六边形衬底的基底面上生长的立方晶体半导体合金，其中失配位错通过立方晶体结构与下面的三角或六边形衬底结构的近似晶格匹配而减少，从而能够开发合金半导体 更大厚度的层，导致新类型的半导体材料和相应的器件，包括改进的异质双极和高电子迁移率晶体管以及高迁移率热电器件。

    Arrayed Micro-Ring Spectrometer System and Method of Use
    24.
    发明申请
    Arrayed Micro-Ring Spectrometer System and Method of Use 有权
    阵列微环光谱仪系统及其使用方法

    公开(公告)号：US20100039644A1

    公开(公告)日：2010-02-18

    申请号：US12508018

    申请日：2009-07-23

    申请人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

    发明人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

    IPC分类号： G01J3/28

    CPC分类号： G01J3/2823 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/18 ,  G01N21/6452 ,  G01N21/6454 ,  G01N21/648 ,  G01N2021/6421 ,  G01N2021/6478 ,  G02B5/188

    摘要： A spectrometer system includes an array of micro-zone plates (MZP) each having coaxially-aligned ring gratings, a sample plate for supporting and illuminating a sample, and an array of photon detectors for measuring a spectral characteristic of the predetermined wavelength. The sample plate emits an evanescent wave in response to incident light, which excites molecules of the sample to thereby cause an emission of secondary photons. A method of detecting the intensity of a selected wavelength of incident light includes directing the incident light onto an array of MZP, diffracting a selected wavelength of the incident light onto a target focal point using the array of MZP, and detecting the intensity of the selected portion using an array of photon detectors. An electro-optic layer positioned adjacent to the array of MZP may be excited via an applied voltage to select the wavelength of the incident light.

    摘要翻译： 光谱仪系统包括每个具有同轴对准的环形光栅的微区域阵列（MZP），用于支撑和照射样品的样品板，以及用于测量预定波长的光谱特性的光子检测器阵列。 样品板响应于入射光发射ev逝波，其激发样品的分子，从而引起次级光子的发射。 检测入射光的所选波长的强度的方法包括将入射光引导到MZP阵列上，使用MZP阵列将入射光的选定波长衍射到目标焦点，并检测所选择的 部分使用光子检测器阵列。 可以通过施加的电压激发邻近MZP阵列定位的电光层，以选择入射光的波长。

    Apparatus and Method for Creating a Photonic Densely-Accumulated Ray-Point
    26.
    发明申请
    Apparatus and Method for Creating a Photonic Densely-Accumulated Ray-Point 有权
    用于创建光子强积累的射线点的装置和方法

    公开(公告)号：US20110024609A1

    公开(公告)日：2011-02-03

    申请号：US12512344

    申请日：2009-07-30

    申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    IPC分类号： G02B27/44 ,  H01L31/0232 ,  G03B27/32

    CPC分类号： G03B27/32 ,  G03F7/70316 ,  G03F7/70383

    摘要： An optical apparatus includes an optical diffraction device configured for diffracting a predetermined wavelength of incident light onto adjacent optical focal points, and a photon detector for detecting a spectral characteristic of the predetermined wavelength. One of the optical focal points is a constructive interference point and the other optical focal point is a destructive interference point. The diffraction device, which may be a micro-zone plate (MZP) of micro-ring gratings or an optical lens, generates a constructive ray point using phase-contrasting of the destructive interference point. The ray point is located between adjacent optical focal points. A method of generating a densely-accumulated ray point includes directing incident light onto the optical diffraction device, diffracting the selected wavelength onto the constructive interference focal point and the destructive interference focal point, and generating the densely-accumulated ray point in a narrow region.

    摘要翻译： 光学装置包括被配置为将预定波长的入射光衍射到相邻的光学焦点上的光学衍射装置，以及用于检测预定波长的光谱特性的光子检测器。 其中一个光学焦点是一个建设性的干涉点，另一个光学焦点是一个破坏性的干涉点。 可以是微环形光栅的微区域（MZP）或光学透镜的衍射装置使用相消干涉点的相位对应产生建设性的射线点。 射线点位于相邻的光学焦点之间。 产生密集累积的射线点的方法包括将入射光引导到光学衍射装置上，将所选择的波长衍射到构造干涉焦点和破坏性干涉焦点上，并在狭窄区域中产生密集累积的射线点。

    Devices And Methods For A Micro-Fresnel Zone Plate Optical Device
    27.
    发明申请
    Devices And Methods For A Micro-Fresnel Zone Plate Optical Device 有权
    微型菲涅耳区域平板光学器件的设备和方法

    公开(公告)号：US20100118683A1

    公开(公告)日：2010-05-13

    申请号：US12490747

    申请日：2009-06-24

    申请人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

    发明人： Sang H. Choi ,  Yeonjoon Park ,  Glen C. King ,  James R. Elliott

    IPC分类号： G11B7/00

    CPC分类号： G11B7/1353 ,  G11B7/1374 ,  G11B2007/0006 ,  G11B2007/13722

    摘要： An embodiment generally relates to an optical device suitable for use with an optical medium for the storage and retrieval of data. The optical device includes an illumination means for providing a beam of optical radiation of wavelength λ and an optical path that the beam of optical radiation follows. The optical device also includes a diffractive optical element defined by a plurality of annular sections. The plurality of annular sections having a first material alternately disposed with a plurality of annular sections comprising a second material. The diffractive optical element generates a plurality of focal points and densely accumulated ray points with phase contrast phenomena and the optical medium is positioned at a selected focal point or ray point of the diffractive optical element.

    摘要翻译： 实施例一般涉及适合与光学介质一起使用以用于存储和检索数据的光学装置。 该光学装置包括用于提供波长λ的光束的照射装置和光辐射束跟随的光路。 光学装置还包括由多个环形部分限定的衍射光学元件。 所述多个环形部分具有交替设置有包括第二材料的多个环形部分的第一材料。 衍射光学元件产生具有相位对比现象的多个焦点和密集累积的光点，并且光学介质位于衍射光学元件的选定焦点或射线点处。

    Epitaxial Growth of Cubic Crystalline Semiconductor Alloys on Basal Plane of Trigonal or Hexagonal Crystal
    29.
    发明申请
    Epitaxial Growth of Cubic Crystalline Semiconductor Alloys on Basal Plane of Trigonal or Hexagonal Crystal 有权
    立方晶体半导体合金在三角晶体或六角晶体基底上的外延生长

    公开(公告)号：US20090140296A1

    公开(公告)日：2009-06-04

    申请号：US12254017

    申请日：2008-10-20

    申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King

    发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King

    IPC分类号： H01L29/737 ,  C09K3/00 ,  H01L29/778 ,  G06F19/00

    CPC分类号： G01N23/207

    摘要： Hetero-epitaxial semiconductor materials comprising cubic crystalline semiconductor alloys grown on the basal plane of trigonal and hexagonal substrates, in which misfit dislocations are reduced by approximate lattice matching of the cubic crystal structure to underlying trigonal or hexagonal substrate structure, enabling the development of alloyed semiconductor layers of greater thickness, resulting in a new class of semiconductor materials and corresponding devices, including improved hetero-bipolar and high-electron mobility transistors, and high-mobility thermoelectric devices.

    摘要翻译： 异质外延半导体材料包括在三角和六边形衬底的基底面上生长的立方晶体半导体合金，其中失配位错通过立方晶体结构与下面的三角或六边形衬底结构的近似晶格匹配而减少，从而能够开发合金半导体 更大厚度的层，导致新类型的半导体材料和相应的器件，包括改进的异质双极和高电子迁移率晶体管以及高迁移率热电器件。