利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

52 条记录 (耗时 0.029 秒)

    Micro Spectrometer for Parallel Light and Method of Use
    2.
    发明申请
    Micro Spectrometer for Parallel Light and Method of Use 有权
    用于平行光的微光谱仪和使用方法

    公开(公告)号：US20100039643A1

    公开(公告)日：2010-02-18

    申请号：US12496788

    申请日：2009-07-02

    申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    IPC分类号： G01J3/28

    CPC分类号： G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J2003/1861 ,  G02F1/134309

    摘要： A spectrometer system includes an optical assembly for collimating light, a micro-ring grating assembly having a plurality of coaxially-aligned ring gratings, an aperture device defining an aperture circumscribing a target focal point, and a photon detector. An electro-optical layer of the grating assembly may be electrically connected to an energy supply to change the refractive index of the electro-optical layer. Alternately, the gratings may be electrically connected to the energy supply and energized, e.g., with alternating voltages, to change the refractive index. A data recorder may record the predetermined spectral characteristic. A method of detecting a spectral characteristic of a predetermined wavelength of source light includes generating collimated light using an optical assembly, directing the collimated light onto the micro-ring grating assembly, and selectively energizing the micro-ring grating assembly to diffract the predetermined wavelength onto the target focal point, and detecting the spectral characteristic using a photon detector.

    摘要翻译： 光谱仪系统包括用于准直光的光学组件，具有多个同轴对准的环形光栅的微环格栅组件，限定限定目标焦点的孔的孔装置和光子检测器。 光栅组件的电光层可电连接到能量源以改变电光层的折射率。 或者，光栅可以电连接到能量供应并且例如用交流电压通电，以改变折射率。 数据记录器可以记录预定的光谱特性。 检测源光的预定波长的光谱特性的方法包括使用光学组件产生准直光，将准直光引导到微环格栅组件上，以及选择性地激励微环格栅组件以将预定波长衍射到 目标焦点，并使用光子检测器检测光谱特性。

    Micro Ring Grating Spectrometer with Adjustable Aperture
    3.
    发明申请
    Micro Ring Grating Spectrometer with Adjustable Aperture 有权
    具有可调孔径的微环光栅

    公开(公告)号：US20100039641A1

    公开(公告)日：2010-02-18

    申请号：US12487735

    申请日：2009-06-19

    申请人： Yeonjoon Park ,  Glen C. King ,  James R. Elliott ,  Sang H. Choi

    发明人： Yeonjoon Park ,  Glen C. King ,  James R. Elliott ,  Sang H. Choi

    IPC分类号： G01J3/04 ,  G01J3/28

    CPC分类号： G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0237 ,  G01J3/0256 ,  G02B5/005 ,  G02B5/1876

    摘要： A spectrometer includes a micro-ring grating device having coaxially-aligned ring gratings for diffracting incident light onto a target focal point, a detection device for detecting light intensity, one or more actuators, and an adjustable aperture device defining a circular aperture. The aperture circumscribes a target focal point, and directs a light to the detection device. The aperture device is selectively adjustable using the actuators to select a portion of a frequency band for transmission to the detection device. A method of detecting intensity of a selected band of incident light includes directing incident light onto coaxially-aligned ring gratings of a micro-ring grating device, and diffracting the selected band onto a target focal point using the ring gratings. The method includes using an actuator to adjust an aperture device and pass a selected portion of the frequency band to a detection device for measuring the intensity of the selected portion.

    摘要翻译： 光谱仪包括具有用于将入射光衍射到目标焦点的同轴对准环形光栅的微环格栅装置，用于检测光强度的检测装置，一个或多个致动器以及限定圆形孔径的可调节孔径装置。 光圈限定目标焦点，并将光引导到检测装置。 使用致动器可选择性地调节孔径装置，以选择频带的一部分以传输到检测装置。 检测入射光的所选频带的强度的方法包括将入射光引导到微环光栅装置的同轴对准的环形光栅上，并使用环形光栅将所选择的带衍射到目标焦点上。 该方法包括使用致动器来调节孔径装置并将频带的选定部分传递到用于测量所选部分的强度的检测装置。

    Hybrid bandgap engineering for super-hetero-epitaxial semiconductor materials, and products thereof
    6.
    发明授权
    Hybrid bandgap engineering for super-hetero-epitaxial semiconductor materials, and products thereof 有权
    超异质外延半导体材料的混合带隙工程及其产品

    公开(公告)号：US08226767B2

    公开(公告)日：2012-07-24

    申请号：US12254134

    申请日：2008-10-20

    申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    IPC分类号： C30B25/18

    CPC分类号： G01N23/207

    摘要： “Super-hetero-epitaxial” combinations comprise epitaxial growth of one material on a different material with different crystal structure. Compatible crystal structures may be identified using a “Tri-Unity” system. New bandgap engineering diagrams are provided for each class of combination, based on determination of hybrid lattice constants for the constituent materials in accordance with lattice-matching equations. Using known bandgap figures for previously tested materials, new materials with lattice constants that match desired substrates and have the desired bandgap properties may be formulated by reference to the diagrams and lattice matching equations. In one embodiment, this analysis makes it possible to formulate new super-hetero-epitaxial semiconductor systems, such as systems based on group IV alloys on c-plane LaF3; group IV alloys on c-plane langasite; Group III-V alloys on c-plane langasite; and group II-VI alloys on c-plane sapphire.

    摘要翻译： “超异质外延”组合包括在具有不同晶体结构的不同材料上的一种材料的外延生长。 可以使用“Tri-Unity”系统来识别兼容的晶体结构。 基于根据晶格匹配方程确定构成材料的混合晶格常数，为每种组合提供了新的带隙工程图。 对于先前测试的材料，使用已知的带隙图，可以通过参考图和晶格匹配方程来形成具有匹配所需衬底并具有期望带隙特性的晶格常数的新材料。 在一个实施例中，该分析使得可以配制新的超异质外延半导体系统，例如基于c面LaF 3上的基于IV族合金的系统; Ⅳ族合金在c面l石上; Ⅲ-Ⅴ族合金在c面硅酸盐岩上; 和II-VI族组合在c面蓝宝石上。

    Micro spectrometer for parallel light and method of use
    7.
    发明授权
    Micro spectrometer for parallel light and method of use 有权
    微光谱仪用于平行光和使用方法

    公开(公告)号：US08059273B2

    公开(公告)日：2011-11-15

    申请号：US12496788

    申请日：2009-07-02

    申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    IPC分类号： G01J3/28

    CPC分类号： G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J2003/1861 ,  G02F1/134309

    摘要： A spectrometer system includes an optical assembly for collimating light, a micro-ring grating assembly having a plurality of coaxially-aligned ring gratings, an aperture device defining an aperture circumscribing a target focal point, and a photon detector. An electro-optical layer of the grating assembly may be electrically connected to an energy supply to change the refractive index of the electro-optical layer. Alternately, the gratings may be electrically connected to the energy supply and energized, e.g., with alternating voltages, to change the refractive index. A data recorder may record the predetermined spectral characteristic. A method of detecting a spectral characteristic of a predetermined wavelength of source light includes generating collimated light using an optical assembly, directing the collimated light onto the micro-ring grating assembly, and selectively energizing the micro-ring grating assembly to diffract the predetermined wavelength onto the target focal point, and detecting the spectral characteristic using a photon detector.

    摘要翻译： 光谱仪系统包括用于准直光的光学组件，具有多个同轴对准的环形光栅的微环格栅组件，限定限定目标焦点的孔的孔装置和光子检测器。 光栅组件的电光层可电连接到能量源以改变电光层的折射率。 或者，光栅可以电连接到能量供应并且例如用交流电压通电，以改变折射率。 数据记录器可以记录预定的光谱特性。 检测源光的预定波长的光谱特性的方法包括使用光学组件产生准直光，将准直光引导到微环格栅组件上，以及选择性地激励微环格栅组件以将预定波长衍射到 目标焦点，并使用光子检测器检测光谱特性。

    Hybrid Bandgap Engineering For Super-Hetero-Epitaxial Semiconductor Materials, and Products Thereof
    8.
    发明申请
    Hybrid Bandgap Engineering For Super-Hetero-Epitaxial Semiconductor Materials, and Products Thereof 有权
    超异质外延半导体材料的混合带隙工程及其产品

    公开(公告)号：US20090220047A1

    公开(公告)日：2009-09-03

    申请号：US12254134

    申请日：2008-10-20

    申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    IPC分类号： G01N23/20 ,  H01B1/02 ,  G06F17/10

    CPC分类号： G01N23/207

    摘要： “Super-hetero-epitaxial” combinations comprise epitaxial growth of one material on a different material with different crystal structure. Compatible crystal structures may be identified using a “Tri-Unity” system. New bandgap engineering diagrams are provided for each class of combination, based on determination of hybrid lattice constants for the constituent materials in accordance with lattice-matching equations. Using known bandgap figures for previously tested materials, new materials with lattice constants that match desired substrates and have the desired bandgap properties may be formulated by reference to the diagrams and lattice matching equations. In one embodiment, this analysis makes it possible to formulate new super-hetero-epitaxial semiconductor systems, such as systems based on group IV alloys on c-plane LaF3; group IV alloys on c-plane langasite; Group III-V alloys on c-plane langasite; and group II-VI alloys on c-plane sapphire.

    摘要翻译： “超异质外延”组合包括在具有不同晶体结构的不同材料上的一种材料的外延生长。 可以使用“Tri-Unity”系统来识别兼容的晶体结构。 基于根据晶格匹配方程确定构成材料的混合晶格常数，为每种组合提供了新的带隙工程图。 对于先前测试的材料，使用已知的带隙图，可以通过参考图和晶格匹配方程来形成具有匹配所需衬底并具有期望带隙特性的晶格常数的新材料。 在一个实施例中，该分析使得可以配制新的超异质外延半导体系统，例如基于c面LaF 3上的基于IV族合金的系统; Ⅳ族合金在c面l石上; Ⅲ-Ⅴ族合金在c面硅酸盐岩上; 和II-VI族组合在c面蓝宝石上。

    Apparatus and method for creating a photonic densely-accumulated ray-point
    9.
    发明授权
    Apparatus and method for creating a photonic densely-accumulated ray-point 有权
    用于产生光子密集累积射线点的装置和方法

    公开(公告)号：US08294989B2

    公开(公告)日：2012-10-23

    申请号：US12512344

    申请日：2009-07-30

    申请人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    发明人： Yeonjoon Park ,  Sang H. Choi ,  Glen C. King ,  James R. Elliott

    IPC分类号： G02B27/44

    CPC分类号： G03B27/32 ,  G03F7/70316 ,  G03F7/70383

    摘要： An optical apparatus includes an optical diffraction device configured for diffracting a predetermined wavelength of incident light onto adjacent optical focal points, and a photon detector for detecting a spectral characteristic of the predetermined wavelength. One of the optical focal points is a constructive interference point and the other optical focal point is a destructive interference point. The diffraction device, which may be a micro-zone plate (MZP) of micro-ring gratings or an optical lens, generates a constructive ray point using phase-contrasting of the destructive interference point. The ray point is located between adjacent optical focal points. A method of generating a densely-accumulated ray point includes directing incident light onto the optical diffraction device, diffracting the selected wavelength onto the constructive interference focal point and the destructive interference focal point, and generating the densely-accumulated ray point in a narrow region.

    摘要翻译： 光学装置包括被配置为将预定波长的入射光衍射到相邻的光学焦点上的光学衍射装置，以及用于检测预定波长的光谱特性的光子检测器。 其中一个光学焦点是一个建设性的干涉点，另一个光学焦点是一个破坏性的干涉点。 可以是微环形光栅的微区域（MZP）或光学透镜的衍射装置使用相消干涉点的相位对应产生建设性的射线点。 射线点位于相邻的光学焦点之间。 产生密集累积的射线点的方法包括将入射光引导到光学衍射装置上，将所选择的波长衍射到构造干涉焦点和破坏性干涉焦点上，并在狭窄区域中产生密集累积的射线点。

    Micro ring grating spectrometer with adjustable aperture
    10.
    发明授权
    Micro ring grating spectrometer with adjustable aperture 有权
    微孔光栅光栅，可调光圈

    公开(公告)号：US08094306B2

    公开(公告)日：2012-01-10

    申请号：US12487735

    申请日：2009-06-19

    申请人： Yeonjoon Park ,  Glen C. King ,  James R. Elliott ,  Sang H. Choi

    发明人： Yeonjoon Park ,  Glen C. King ,  James R. Elliott ,  Sang H. Choi

    IPC分类号： G01J3/28

    CPC分类号： G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0237 ,  G01J3/0256 ,  G02B5/005 ,  G02B5/1876

    摘要： A spectrometer includes a micro-ring grating device having coaxially-aligned ring gratings for diffracting incident light onto a target focal point, a detection device for detecting light intensity, one or more actuators, and an adjustable aperture device defining a circular aperture. The aperture circumscribes a target focal point, and directs a light to the detection device. The aperture device is selectively adjustable using the actuators to select a portion of a frequency band for transmission to the detection device. A method of detecting intensity of a selected band of incident light includes directing incident light onto coaxially-aligned ring gratings of a micro-ring grating device, and diffracting the selected band onto a target focal point using the ring gratings. The method includes using an actuator to adjust an aperture device and pass a selected portion of the frequency band to a detection device for measuring the intensity of the selected portion.

    摘要翻译： 光谱仪包括具有用于将入射光衍射到目标焦点的同轴对准环形光栅的微环格栅装置，用于检测光强度的检测装置，一个或多个致动器以及限定圆形孔径的可调节孔径装置。 光圈限定目标焦点，并将光引导到检测装置。 使用致动器可选择性地调节孔径装置，以选择频带的一部分以传输到检测装置。 检测入射光的所选频带的强度的方法包括将入射光引导到微环光栅装置的同轴对准的环形光栅上，并使用环形光栅将所选择的带衍射到目标焦点上。 该方法包括使用致动器来调节孔径装置并将频带的选定部分传递到用于测量所选部分的强度的检测装置。