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公开(公告)号:US20230341266A1
公开(公告)日:2023-10-26
申请号:US18344303
申请日:2023-06-29
Applicant: HUAWEI TECHNOLOGIES CO., LTD.
Inventor: Cheewei LEE , Chao PAN , Stevanus DARMAWAN , Shaowu WANG , Qian WANG , Huaqiang QIN
CPC classification number: G01J3/45 , G01J3/0229 , G02B27/1006
Abstract: A optical chip includes: an optical splitter, configured to receive a first electromagnetic wave signal, and divide the first electromagnetic wave signal into two electromagnetic wave signals for output; and a first interferometer and a second interferometer, where the optical splitter, the first interferometer, and the second interferometer are sequentially coupled, and the first interferometer and the second interferometer are configured to receive one of the two electromagnetic wave signals, so that the one electromagnetic wave signal is interfered twice, to output a plurality of second electromagnetic wave signals. The other one of the two electromagnetic wave signals is output as a third electromagnetic wave signal, and the second electromagnetic wave signal and the third electromagnetic wave signal may be used to obtain wavelength information of the first electromagnetic wave signal through optical-electrical conversion. A wavelength measurement system is further provided.
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公开(公告)号:US11774354B2
公开(公告)日:2023-10-03
申请号:US17955131
申请日:2022-09-28
Applicant: Photothermal Spectroscopy Corp
Inventor: Craig Prater , David Grigg , Derek Decker
CPC classification number: G01N21/35 , G01J3/45 , G02B21/002
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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373.
公开(公告)号:US11740129B2
公开(公告)日:2023-08-29
申请号:US17298615
申请日:2020-03-30
Applicant: SOUTH CHINA NORMAL UNIVERSITY
Inventor: Xiaoxu Lv , Chengxin Zhou , Liyun Zhong , Qinwen Ning , Shengde Liu
IPC: G01J3/45 , G02F1/13363 , G01J3/02 , G01J3/12
CPC classification number: G01J3/45 , G01J3/0224 , G01J3/0229 , G01J3/0237 , G01J3/12 , G02F1/133638 , G01J2003/1291
Abstract: A differential interference imaging system capable of rapidly changing shear direction and amount includes: a light source (101), a filter (102), a polarizer (103), a sample stage (104), an infinite imaging microobjective (105), a tube lens (106), a shear component, an analyzer (113), and an image sensor (114). After the light intensity and a polarization direction is adjusted, the linearly polarized light passes through a transparent sample, to be collected by the infinite imaging microobjective (105) and to implement imaging through the tube lens (106). An imaging beam is divided into two linearly polarized light fields which are perpendicular to each other in the polarization directions and have tiny shear amount, then they are further combined into an interference light filed by the analyzer (103) to form a differential interference image in the image sensor (114). The system may be flexibly assembled, is simple in structure and easy to implement.
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公开(公告)号:US20230236118A1
公开(公告)日:2023-07-27
申请号:US17955131
申请日:2022-09-28
Applicant: Photothermal Spectroscopy Corp
Inventor: Craig Prater , David Grigg , Derek Decker
CPC classification number: G01N21/35 , G02B21/002 , G01J3/45
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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公开(公告)号:US11703680B2
公开(公告)日:2023-07-18
申请号:US16625702
申请日:2018-07-06
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Tatsuya Sugimoto , Tomofumi Suzuki , Kyosuke Kotani
CPC classification number: G02B26/0841 , B81B3/0045 , G01J3/021 , G01J3/0202 , G01J3/45 , B81B2201/033 , B81B2201/042 , B81B2203/0136 , B81B2203/0154 , B81B2203/04
Abstract: An optical device includes: a base that includes a main surface; a movable unit that includes an optical function unit; and an elastic support unit that is connected between the base and the movable unit, and supports the movable unit so that the movable unit is movable along a first direction perpendicular to the main surface. The elastic support unit includes a lever, a first torsion support portion that extends along a second direction perpendicular to the first direction and is connected between the lever and the movable unit, and a second torsion support portion that extends along the second direction and is connected between the lever and the base. A torsional spring constant of the first torsion support portion is greater than a torsional spring constant of the second torsion support portion.
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公开(公告)号:US11684253B2
公开(公告)日:2023-06-27
申请号:US16855393
申请日:2020-04-22
Applicant: TOPCON CORPORATION
Inventor: Zaixing Mao , Zhenguo Wang , Bin Cao , Kinpui Chan
CPC classification number: A61B3/101 , A61B3/0025 , A61B3/14 , G01B9/02041 , G01B9/02083 , G01B11/06 , G01J3/45
Abstract: A method for determining thickness of layers of the tear film includes reconstructing a full- or hyper-spectral interference pattern from an imaged multi-spectral pattern. Tear film thickness can then be estimated from the full- or hyper-spectral interference pattern. Using a full- or hyper-spectral interference pattern provides a greater number of frequency sampling points for increased tear film thickness estimation accuracy, without traditional time consuming techniques.
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377.
公开(公告)号:US20230152153A1
公开(公告)日:2023-05-18
申请号:US17042197
申请日:2020-01-09
Inventor: Yingjian WANG , Yufei CHU , Dong LIU , Decheng WU , Zhenzhu WANG , Kunming XING , Zhiqiang KUANG , Bangxin WANG , Zhiqing ZHONG , Aiyuan FAN , Chenbo XIE
CPC classification number: G01J3/26 , G01J3/45 , G01J3/0208 , G01J3/0297
Abstract: This application relates to a device for measuring a transmittance curve of an Fabry-Perot using a frequency comb light source and a method using the same. The device includes the following components sequentially arranged in an optical path: a single frequency pulse laser generating single frequency pulse laser; a frequency comb laser converting received single frequency pulse laser into frequency comb laser; and an Fabry-Perot to be detected receiving laser output from the frequency comb laser; where the device further includes a first receiving unit receiving laser from an output end of the frequency comb laser and performing component and spectrum analysis, and a second receiving unit receiving laser from an output end of the Fabry-Perot to be detected and performing component and spectrum analysis.
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公开(公告)号:US20190204065A1
公开(公告)日:2019-07-04
申请号:US16322592
申请日:2017-08-07
Inventor: Takeshi AKAGAWA , Masahiro KUBO , Katsumi ABE , Kimiyasu TAKOH , Ersin ALTINTAS , Yuji OHNO , Tetsuri ARIYAMA , Ichiro ISHIMARU
CPC classification number: G01B9/02067 , G01B9/02041 , G01B9/02061 , G01B9/02068 , G01J3/45
Abstract: A light measurement device that maintains high measurement precision. The light measurement device includes: light source that irradiates light upon measurement object; branch part that splits transmitted light or reflected light from measurement object; phase-changing unit that changes the phase of one beam of the branched light beams; phase-fixing unit that maintains the phase of the other beam of the branched light beams; adjustment mechanism, which is provided in phase-changing unit or phase-fixing unit, for adjusting the propagation direction of light; multiplexer that causes the light emitted by each of phase-changing unit and phase-fixing unit to interfere with each other; detection unit that detects light that is interfered with by multiplexer; and control unit that controls the adjustment mechanism on the basis of the luminance values of an interference image that is detected by detection unit and adjusts the propagation direction of light in phase-changing unit or phase-fixing unit.
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379.
公开(公告)号:US20190186993A1
公开(公告)日:2019-06-20
申请号:US16320921
申请日:2017-06-07
Applicant: Shimadzu Corporation
Inventor: Hiromasa MARUNO , Naoji MORIYA , Toyoyuki HASHIMOTO , Takashi MURAMATSU , Hideaki KATSU
IPC: G01J3/06 , G01J3/45 , H02K41/035
CPC classification number: G01J3/06 , G01J3/45 , G01J2003/062 , G01J2003/064 , H02K33/18 , H02K41/0356
Abstract: In the voice coil motor and the interference spectrophotometer according to the invention, the angular deviation between the movable and fixed mirrors can always be suppressed to one second or less. The voice coil motor is provided with: a static unit 71 including a yoke 73 having a cylindrical part 73a fixed to the static unit 71 and a magnet 74 disposed in the cylindrical part 73a fixed to the static unit 71; a movable unit 72 including a circular coil 72b fixed thereto, the circular coil 72b disposed between the cylindrical part 73a of the yoke 73 and the magnet 74; and a power supply line 72c for connecting the coil 72b to a power supply. The cylindrical part 73a of the yoke 73 has a slit 73c through which the power supply line 72c is to pass is created, the movable unit 72 is configured to reciprocally move relative to the static unit 71 in response to an electromagnetic force generated by the magnet 74 in conjunction with the activated coil 72b, and another slit 73d is created in the cylindrical part 73a of the yoke 73 in such a manner that the slits 73c,73d are symmetrical with respect to a central axis of the cylindrical part 73a.
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公开(公告)号:US20190017930A1
公开(公告)日:2019-01-17
申请号:US16034417
申请日:2018-07-13
Applicant: Thermo Electron Scientific Instruments LLC
Inventor: John Magie Coffin
IPC: G01N21/3577 , G01J3/45 , G01J3/26 , G01J3/02 , G01J3/10 , G01N21/3504
CPC classification number: G01N21/3577 , G01J3/0208 , G01J3/021 , G01J3/0229 , G01J3/108 , G01J3/26 , G01J3/28 , G01J3/45 , G01J2003/2869 , G01N21/3504 , G01N2021/3595
Abstract: A spectroscopy system and method in which the optical path following the interferometer includes a Jacquinot stop having an aperture disposed substantially at its focal point. The Jacquinot stop includes a reflective surface substantially non-orthogonal to the longitudinal axis of the path and facing the source of the IR signal containing an interferogram. The aperture passes an inner portion of the incident IR signal, while the reflective surface reflects an outer portion. The reflected outer portion of the incident IR signal, which contains erroneous spectral information due to inherent flaws in the interferometer optics, is thereby effectively removed from the original incident IR signal ultimately used to irradiate the sample, and yet still be made available for use in monitoring background spectra of the sampling optics.
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