Abstract:
A method for converting a SMS sent through a mobile communication network into a SMS or MMS in a previously registered format includes the steps of: receiving a SMS from a certain sending subscriber, determining whether the corresponding sending subscriber is subscribed to a SMS converting service, then converting the SMS into a previously registered format in case the sending subscriber is subscribed to the SMS converting service, and then sending the converted message to a designated receiving terminal.
Abstract:
The present invention is directed to a duty cycle correction apparatus that can be implemented in a small size, and is capable of performing a phase lock more rapidly, and reducing the amount of current being consumed, and to a method thereof. The duty cycle correction apparatus in accordance with the present invention for use in a semiconductor memory device includes a delay line unit for delaying a first clock signal to produce a first delayed clock signal; an output tap unit for delaying the first delayed clock signal by a pulse width of a first logic state of the first clock signal under the control of a toss control signal derived from a second clock signal; and a phase mixer for mixing the clock signal from the output tap unit and one of the first and second clock signals.
Abstract:
An apparatus for controlling an on die termination (ODT) includes a counting unit for receiving an external clock signal and a delay locked loop (DLL) clock signal, and counting the toggle number of each of external clock signal and the DLL clock signal from a preset number; a comparing control unit for comparing the counted toggle number of the external clock signal with that of the DLL clock signal in response to an ODT command signal, and outputting an ODT enable signal for controlling the ODT based on the compared result.
Abstract:
A level shifter and a display device having the same are provided. In a level shifter, a first transistor includes a gate electrode receiving a first driving voltage, and a source electrode receiving an input signal through an input terminal. A second transistor includes a drain electrode receiving the first driving voltage, and a source electrode electrically connected to a drain electrode of the first transistor through a first node. A third transistor includes a source electrode receiving a second driving voltage, a drain electrode electrically connected to a gate electrode of the second transistor through a second node, and a gate electrode receiving the input signal. A fourth transistor includes a drain electrode receiving the first driving voltage, a gate electrode electrically connected to the drain electrode of the first transistor through the first node, and a source electrode electrically connected to the drain electrode of the third transistor through the second node. An inverter inverts a signal outputted from the second node to apply the inverted signal to an output terminal.
Abstract:
A semiconductor memory device includes a first clock input unit for generating a first clock signal based on a signal at an intersection of a system clock signal and an inverted system clock signal; a second input unit for generating a second clock signal based on a signal at an intersection of the system clock signal and a reference signal; a third input unit for generating a third clock signal based on a signal at an intersection of the inverted system clock signal and the reference signal; a delay unit for generating a delay clock signal by delaying the first clock signal in response to a delay control signal; and a clock delay control unit for generating the delay control signal in response to a phase difference between the second clock signal and the delay clock signal or a phase difference between the third clock signal and the delay clock signal.
Abstract:
A semiconductor memory device includes a reference signal generating unit for generating a reference signal; a comparing unit for comparing the reference signal with a test signal applied to a test pad to output an adjusted value after adjusting the adjusted value until the test signal is equal to the reference signal; an impedance measuring unit for measuring an impedance of the test pad based on the adjusted value to output the test signal; an impedance adjusting unit for adjusting an impedance of a data I/O pad to have an impedance value corresponding to the adjusted value outputted when the test signal is equal to the reference signal; an impedance control unit for controlling the comparing unit so that the adjusted value is outputted when the test signal is equal to the reference signal; and a reference signal control unit for adjusting a voltage level of the reference signal.
Abstract:
An on die termination (ODT) test device includes: a control unit for selectively activating a plurality of pull-up signals and a plurality of pull-down signals by performing a logic operation to an ODT control signal for controlling a resistor of a termination terminal, an off chip driver (OCD) control signal for adjusting an impedance of an output terminal, a plurality of ODT test signals for measuring a termination resistance of the termination terminal and a plurality of ODT signals having a different resistance; and a pull-up/pull-down unit for selectively driving a plurality of pull-up drivers and a plurality of pull-down drivers according to the pull-up signals and the pull-down signals in order to output a corresponding resistance of the output terminal at a read operation mode.
Abstract:
An apparatus for comparing inputted signals by removing an offset voltage during adjusting an output impedance of a semiconductor memory device, includes a voltage comparator for comparing a first input signal applied to its positive input node with a second input signal applied to its negative input node to output a first output signal to its positive output node and its second output signal to a negative output node; a switched capacitive unit for removing an offset voltage occurred in the positive input node, the negative input node, the positive output node and the negative output node of the voltage comparator; and a latch unit for latching the first output signal and the second output signal.
Abstract:
A delay locked loop increases an operation margin of a delay locked loop by using an output clock having more advanced phase than a DLL output clock. A clock delay compensation block receives an external clock signal to thereby generate a first multi clock and a second multi clock. A phase control block compares the first multi clock with the second multi clock to generate phase control signal controlling a shifting operation. A multi-phase delay control block performs a shifting operation based on the phase control signal to control the clock delay compensation block.
Abstract:
A Delay Locked Loop (DLL) driver control circuit is capable of reducing an amount of current consumption by preventing the output of unnecessary clocks. The DLL driver control circuit includes a DLL driver for driving a DLL clock and a DLL driver controller for generating a control signal to control an operation of the DLL driver in response to a signal having information associated with an active mode. The DLL driver controller is provided with a counter for counting the DLL clock to produce a count a setting value having a plurality of bits and generating an activated equal signal if the two values are the same, and an SR latch for accepting the equal signal and the signal having the information associated with the active mode to provide the control signal.