Abstract:
An apparatus includes a control circuit configured to selectively activate, based on an operating mode signal, either a local clock signal or a pulse signal. The apparatus further includes a data storage circuit that is coupled to a data signal, the local clock signal, and the pulse signal. The data storage circuit may be configured to sample the data signal using the local clock signal during a first operating mode, and to sample the data signal using the pulse signal during a second operating mode.
Abstract:
Techniques are disclosed relating to level-shifting circuitry and time borrowing across voltage domains. In some embodiments, sense amplifier circuitry generates, based on an input signal at a first voltage level, an output signal at a second, different voltage level. Pulse circuitry may generate a pulse signal in response to an active clock edge of a clock signal that is input to the sense amplifier circuitry. Initial resolution circuitry may drive the output signal of the sense amplifier circuitry to match the value of the input signal during the pulse signal. Secondary resolution circuitry may maintain a current value of the output signal after expiration of the pulse signal. This may allow the input signal to change during the pulse, e.g., to enable time borrowing by upstream circuitry.
Abstract:
Systems, apparatuses, and methods for implementing low voltage clock swing sequential circuits are described. An input signal is coupled to the gates of a first P-type transistor and a first N-type transistor of a first transistor stack. A low voltage swing clock signal is coupled to the gate of a second N-type transistor of the first transistor stack. An inverse of the input signal is coupled to the gates of a second P-type transistor and a third N-type transistor of a second transistor stack. The low-swing clock is coupled to the gate of a fourth N-type transistor of the second transistor stack. A first end of one or more enabling P-Type transistors with gates coupled to the low-swing clock is coupled to the first P-type transistor's drain, and a second end of the one or more enabling P-Type transistors is coupled to the second P-type transistor's drain.
Abstract:
An apparatus includes a control circuit configured to selectively activate, based on an operating mode signal, either a local clock signal or a pulse signal. The apparatus further includes a data storage circuit that is coupled to a data signal, the local clock signal, and the pulse signal. The data storage circuit may be configured to sample the data signal using the local clock signal during a first operating mode, and to sample the data signal using the pulse signal during a second operating mode.
Abstract:
An apparatus includes a control circuit configured to selectively activate, based on an operating mode signal, either a local clock signal or a pulse signal. The apparatus further includes a data storage circuit that is coupled to a data signal, the local clock signal, and the pulse signal. The data storage circuit may be configured to sample the data signal using the local clock signal during a first operating mode, and to sample the data signal using the pulse signal during a second operating mode.
Abstract:
A clock gating circuit is disclosed. The clock gating circuit includes an input circuit configured to receive an enable signal and clock enable circuitry configured to receive an input clock signal. The clock gating circuit also includes a latch that captures and stores an enabled state of the enable signal when the enable signal is asserted. An output circuit is coupled to the latch, and provides an output signal corresponding to a state of the clock signal when the latch is storing the enabled state. The clock gating circuit is arranged such that, when the latch is not storing the enabled state, no dynamic power is consumed responsive to state changes of the input clock signal.
Abstract:
Systems, apparatuses, and methods for reducing leakage current for a memory array. In various embodiments, techniques are implemented for generating a supply voltage for a memory array which tracks the data retention voltage of the memory array. In one embodiment, multiple diodes are implemented in parallel between a supply voltage and the memory array. The diodes have different sizes and different voltage drops, and the diode which will cause the voltage to drop closest to without going below the data retention voltage is selected for routing the supply voltage to the memory array. Since the data retention voltage for the memory array varies over temperature, the temperature of the system is monitored. Based on changes in the temperature, the system changes which diode is in the circuit path for supplying power to the memory array so as to reduce leakage current for the memory array.
Abstract:
A system and method for managing power in a memory, wherein the system may include a processor and a memory unit coupled to the processor. The memory unit may initialize an address decoder into a first power mode. In response to receiving a command and an address corresponding to a location within the memory unit, the memory unit may use the first stage of the address decoder to decode at least a portion of the address. The memory unit may further switch a selected portion of a second stage of the address decoder from the first power mode to the second power mode, wherein the selected portion of the second stage of the address decoder is selected dependent upon an output signal of the first stage of the address decoder.
Abstract:
A voltage source controller for a memory array includes an input coupled to a voltage source, an output coupled to one or more memory cells of a memory array, where the output is configured to provide a cell source voltage to the memory cells. The controller also includes a switch circuit configured to: receive a retention enable signal, a write assist enable signal, and a standard mode enable signal; and based on the retention enable signal, write assist enable signal, and standard mode enable signal, selectively set the cell source voltage for one or more of the memory cells to one of: a retention voltage, a write assist voltage, or a standard mode voltage, where the retention voltage and the write assist voltage are less than the standard mode voltage.