摘要:
A connector connects a rotatable body including an attachment hole and an engaging groove, and a shaft pressed into the attachment hole to integrally rotate. The connector includes at least one pin configured to fit in the engaging groove; and a screw having a head configured to be pressed against the rotatable body either directly or via another member. The at least one pin is fixed on the shaft and extends in a radial direction of the shaft to penetrate the shaft. The screw is screwed into a screw hole on an end face of the shaft and is tightened to press the at least one pin against a surface of the engaging groove.
摘要:
Provided is a jitter measurement apparatus that measures timing jitter of a signal under measurement having a prescribed repeating pattern, comprising a sampling section that coherently samples the signal under measurement within a prescribed measurement duration; a waveform reconfiguring section that rearranges ordinal ranks of data values sampled by the sampling section to generate a reconfigured waveform that is a reproduction of a waveform of the signal under measurement; an analytic signal generating section that converts the reconfigured waveform into a complex analytic signal; and a jitter measuring section that measures jitter of the signal under measurement based on the analytic signal.
摘要:
There is provided a calibration apparatus that calibrates a jitter measuring circuit for outputting a jitter measuring signal with a level according to an amount of jitter in an input signal based on the input signal and a delay signal obtained by delaying the input signal by means of a variable delay circuit. The calibration apparatus includes a delay control section that sequentially sets a first delay amount and a second delay amount in the variable delay circuit and a gain computing section that computes gain in the jitter measuring circuit based on the jitter measuring signal respectively output from the jitter measuring circuit for the first delay amount and the second delay amount.
摘要:
A measuring apparatus including a timing jitter estimator which estimates an output timing jitter sequence which indicates the output timing jitter of an output signal based on an output signal output from a DUT in response to an input signal input to the DUT, and a jitter transfer function estimator which estimates a jitter transfer function in the DUT based on the output timing jitter sequence. The jitter transfer function estimator includes an instantaneous phase noise estimator which estimates an instant phase noise of the output signal based on an output signal, and a resampler which generates the output timing jitter sequence by resampling the instantaneous phase noise at predetermined timing.
摘要:
There is provided a clock generator for generating a single-phase clock into which jitter has been injected, having a multi-phase clock generating section for generating a plurality of clock signals having an almost equal phase difference from each other and a jitter injecting section for injecting jitter into the respective clock signals.
摘要:
A testing apparatus tests the performance of an electronic device having an operation circuit for providing a useful output signal. A demodulator configured to provide a phase or frequency demodulated signal related to the output of the operation circuit is packaged with the operation circuit. The gain of the demodulator is controllable from outside the package. The testing apparatus analyses the demodulated signal and controls the gain of the demodulator.
摘要:
A nitride semiconductor device includes: a semiconductor substrate; a p-type semiconductor layer formed over the semiconductor substrate, made of a nitride semiconductor, and containing first impurities; and an insulating film contacting the p-type semiconductor layer and having an impurity region containing second impurities for trapping hydrogen. Since residual hydrogen in the p-type semiconductor layer is trapped in the impurity region, the hydrogen concentration in the impurity region is higher than that in the insulating film excluding the impurity region.
摘要:
There is provided a signal generation circuit for generating an output signal including jitter injected thereto. The signal generation circuit includes a jitter output section that outputs a first jitter signal and a second jitter signal which have different frequencies from each other, a carrier output section that outputs a carrier signal having a frequency positioned in substantially the middle between the frequencies of the first and second jitter signals, and an adding section that adds together the first jitter signal, second jitter signal and carrier signal so as to generate the output signal.
摘要:
There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.
摘要:
There is provided a signal generation circuit for generating an output signal including jitter injected thereto. The signal generation circuit includes a jitter output section that outputs a first jitter signal and a second jitter signal which have different frequencies from each other, a carrier output section that outputs a carrier signal having a frequency positioned in substantially the middle between the frequencies of the first and second jitter signals, and an adding section that adds together the first jitter signal, second jitter signal and carrier signal so as to generate the output signal.