摘要:
Disclosed is a PLL (Phase Lock Loop) reducing the lock-in-time of the phase lock loop by altering the impedance of the damping resistor portion of the included LPF (Low Pass Filter) as a function of the difference in frequency or phase between a PLL applied reference frequency and the output frequency provided by the VCO (Voltage Controlled Oscillator) portion of the PLL. This variable impedance is accomplished by introducing a feed forward path that switches a capacitor in and out of the circuit in accordance with the difference frequency. One embodiment uses a mixer to provide the difference frequency signal.
摘要:
The disclosed methodology and apparatus measures the duty cycle of a clock signal. A variable duty cycle circuit receives a clock signal from a clock signal generator. The variable duty cycle circuit adjusts the duty cycle of the clock signal by an amount dependent on a duty cycle index value that it receives. The variable duty cycle circuit supplies a duty-cycle adjusted clock signal to a divider circuit. The apparatus sweeps the frequency of the clock signal from a starting value up to a maximum frequency above which the divider circuit fails. The apparatus then determines the duty cycle of the duty-cycle adjusted clock signal from the maximum frequency.
摘要:
A level shifter apparatus and method for minimizing duty cycle distortion are provided. The level shifter includes a bank of comparators each having an associated threshold built into it. The comparators compare a difference in source voltages for two power domains to these built-in thresholds and output a signal indicative of whether the threshold is exceeded. The output signals from the comparators are provided to a thermometric decoder which generates control signals based on these output signals. The control signals are used to control stages in a level shifter for modifying the voltage output of the level shifter. Individual stages may be enabled to thereby monotonically modify the voltage output of the level shifter and thereby decrease a time required to achieve a voltage having a level that causes a state change in a driven circuit. As a result, duty cycle distortion is minimized and maximum operational frequency is increased.
摘要:
A frequency synthesizer lock detection system is disclosed that distributes a frequency synthesizer output signal across a distribution network to one or more receptor circuits. The distribution network may exhibit delay and other distortion that may cause the downstream signal arriving at the receptor circuit to lose frequency lock with both the frequency synthesizer output signal and a reference clock signal that controls the frequency of the synthesizer output signal. The lock detection system tests the downstream signal to determine if the downstream signal exhibits a lock with respect to the reference clock that determines the operating frequency of the frequency synthesizer. In this manner, lock of the downstream signal to the reference clock signal may be accurately assessed in one embodiment.
摘要:
A method and apparatus for translating signals between different components located in different power boundaries in a mixed voltage system. A level shifter system includes a first level shifter circuit connected to a first voltage source. A second level shifter circuit connects to a second voltage source. An intermediate level shifter circuit has an input that connects to the output of the first level shifter circuit. The output of the intermediate level shifter circuit connects to the input of the second level shifter circuit. The intermediate level shifter circuit uses an intermediate voltage source having an intermediate voltage about midway between the first voltage of the first voltage source and the second voltage of the second voltage source.
摘要:
The present invention provides for a method for examining high-frequency clock-masking signal patterns at a reduced frequency. A first mode of a first shift register is selected. A plurality of bits is loaded on the first shift register at a first frequency. A second mode of the first shift register is selected. A first mode of a second shift register is selected. The plurality of bits is loaded on the second shift register. A second mode of the second shift register is selected. A first mode of a third shift register is selected. The plurality of bits is loaded on the third shift register. A second mode of the third shift register is selected and the plurality of bits is loaded from the third shift register at a second frequency, where the second frequency is lower than the first frequency, thereby providing for examining high-frequency clock-masking signal patterns at a reduced frequency.
摘要:
The present invention provides for a system comprising a level shifter configured to receive a first clock signal from a first power domain, to receive a counter signal, to select one of a plurality of intermediate voltages in response to the received counter signal, and to generate a second clock signal in response to the received first clock signal and the selected intermediate voltage. A counter is coupled to the level shifter and configured to receive a divided clock signal and a comparison result signal, and to generate the counter signal in response to the received divided clock signal and comparison result signal. A divider is coupled to the counter and configured to receive the first clock signal and to generate the divided clock signal in response to the received first clock signal. A filter is coupled to the level shifter and configured to receive the second clock signal and to generate a first comparison signal in response to the received second clock signal. A fixed potential is configured to generate a second comparison signal. A comparator is coupled to the filter, the fixed potential, and the counter and configured to receive the first comparison signal and the second comparison signal, and to generate the comparison result signal in response to the received first comparison signal and the second comparison signal.
摘要:
A method, an apparatus, and a computer program are provided for generating an error detection state and correction of code patterns. Generally, conducting full speed testing of the dI/dt circuit in a low bandwidth lab environment is difficult. A circuit, however, can be employed that periodically detects the functionality of the dI/dt circuit to indicate success or failure. When errors are detected, the circuit allows for erroneous codes to be replaced with accurate ones. Using this circuit, conducting full speed testing of the dI/dt circuit in a low bandwidth lab environment can be more easily achieved.
摘要:
A method, an apparatus, and a computer program are provided for the semi-automatic extraction of an ideality factor of a diode. Traditionally, current/voltage curves for diodes, which provided a basis for extrapolating the ideality factors, had to be determined by hand. By employing a thermal voltage proportional to absolute temperature (PTAT) generator in conjunction with an extraction mechanism, the ideality factor can be extracted in an semi-automatic manner. Therefore, a reliable, quick, and less expensive device can be employed to improve measurements of ideality factors.
摘要:
The present invention provides for determining gate speed parameters in a circuit. A first delay is selected. A second delay is selected, wherein the second delay is longer than the first delay. A clock signal is delayed as a function of the first delay. The clock signal is combined with the first delayed clock signal. A first pulse signal is produced from combining the clock signal with the first delayed clock signal. A clock signal is delayed as a function of the second delay. The clock signal is combined with the first delayed clock signal. A second pulse signal is produced from combining the clock signal with the second delayed clock signal. The first delayed clock signal is integrated. The second delayed clock signal is integrated. The first delayed integrated clock signal is compared with the second delayed integrated clock signal. When the first delayed integrated clock signal is greater than the second integrated clock signal, the gate delay is determined.