Multi-strobe apparatus, testing apparatus, and adjusting method
    31.
    发明授权
    Multi-strobe apparatus, testing apparatus, and adjusting method 有权
    多次选通装置,试验装置和调整方法

    公开(公告)号:US07406646B2

    公开(公告)日:2008-07-29

    申请号:US11096702

    申请日:2005-04-01

    IPC分类号: G06F11/00 G01R31/28 G11B20/20

    摘要: A multi-strobe apparatus for generating multi-strobe having a plurality of strobes is provided, wherein the multi-strobe apparatus includes a clock generating unit which is able to generate a signal for adjustment at a timing at which each of the plurality of strobes should be generated; a strobe generating circuit for generating the plurality of strobes; and an adjusting module for adjusting a timing of the strobe generating circuit's generating each of the strobes on the basis of the signal for adjustment.

    摘要翻译: 提供了一种用于产生具有多个选通脉冲的多次选通的多选通装置,其中多选通装置包括时钟发生单元,该时钟产生单元能够在多个选通中的每个选通时产生用于调整的信号 生成; 选通产生电路,用于产生所述多个频闪; 以及调整模块,用于根据调整信号调整选通脉冲发生电路产生每个选通脉冲的定时。

    Test apparatus and test method
    32.
    发明申请
    Test apparatus and test method 有权
    试验装置及试验方法

    公开(公告)号:US20070277065A1

    公开(公告)日:2007-11-29

    申请号:US11714071

    申请日:2007-03-05

    申请人: Shinya Sato

    发明人: Shinya Sato

    IPC分类号: G06F11/00

    CPC分类号: G11C29/42 G11C29/44

    摘要: A test apparatus is provided for testing memory under test which stores a data string including an error correction code in the form of additional data. The test apparatus comprises: a logic comparator which compares each of the data sets included in a data string read out from the memory under test with a corresponding anticipated value created beforehand; a data error count unit which counts the number of data sets that do not match the respective anticipated values; and a defect detection unit which provides a function whereby, in a case that the count value counted by the error count unit exceeds a predetermined upper limit number which is equal to or greater than 1, determination is made that the memory under test is defective.

    摘要翻译: 提供一种测试装置,用于测试测试存储器,该存储器以附加数据的形式存储包括纠错码的数据串。 测试装置包括:逻辑比较器,将包括在从被测存储器读出的数据串中的每个数据集与预先创建的对应的预期值进行比较; 数据错误计数单元,其计数与各个预期值不匹配的数据集的数量; 以及缺陷检测单元,其提供如下功能:在由误差计数单元计数的计数值超过等于或大于1的预定上限值的情况下,确定被测存储器有缺陷。

    Test apparatus, phase adjusting method and memory controller
    33.
    发明授权
    Test apparatus, phase adjusting method and memory controller 有权
    测试仪器,相位调整方法和存储器控制器

    公开(公告)号:US07266738B2

    公开(公告)日:2007-09-04

    申请号:US11180895

    申请日:2005-07-13

    申请人: Shinya Sato

    发明人: Shinya Sato

    IPC分类号: G11C29/00

    摘要: An inventive test apparatus has a timing comparator for obtaining an output value of an output signal outputted from a memory-under-test with timing of a strobe signal, a logical comparator for comparing the output value obtained by the timing comparator with an expected value and for outputting a comparison result and a phase adjustment control circuit for adjusting the timing of the strobe signal based on the comparison result outputted from the logical comparator. The inventive test apparatus further includes a first variable delay circuit for delaying and supplying the strobe signal to the timing comparator and the phase adjustment control circuit sets the delay effected by the first variable delay circuit based on the comparison result outputted from the logical comparator.

    摘要翻译: 本发明的测试装置具有一个定时比较器,用于获取从被选择的存储器中输出的输出信号的输出值,该输出信号是选通信号的定时;逻辑比较器,用于将由定时比较器获得的输出值与期望值进行比较;以及 用于输出比较结果和相位调整控制电路,用于根据从逻辑比较器输出的比较结果来调节选通信号的定时。 本发明的测试装置还包括用于将选通信号延迟并提供给定时比较器的第一可变延迟电路,并且相位调整控制电路基于从逻辑比较器输出的比较结果来设置由第一可变延迟电路实现的延迟。

    Testing apparatus and testing method
    34.
    发明申请
    Testing apparatus and testing method 失效
    检测仪器及检测方法

    公开(公告)号:US20070136628A1

    公开(公告)日:2007-06-14

    申请号:US11298562

    申请日:2005-12-09

    IPC分类号: G11C29/00

    摘要: There is provided a testing apparatus for testing a memory-under-test, having a pin electronics section for inputting/receiving signals to/from the memory-under-test, a pattern generating section for inputting a test pattern to the memory-under-test via the pin electronics section and a judging section for receiving an output signal of the memory-under-test via the pin electronics section to judge whether or not the memory-under-test is defect-free based on the output signal, wherein the pin electronics section has an internal circuit for inputting/receiving the signal to/from the memory-under-test, a first transmission line for connecting the internal circuit with the memory-under-test and a first switch for connecting the first transmission line with earth potential when the memory-under-test is not tested and for disconnecting the first transmission line from the earth potential in testing the memory-under-test.

    摘要翻译: 提供了一种用于测试被测存储器的测试装置,具有用于向/从被测存储器输入/接收信号的引脚电子部分,用于将测试模式输入到存储器下测试器的模式产生部分, 通过引脚电子部分进行测试,以及判断部分,用于经由引脚电子部分接收待测存储器的输出信号,以基于输出信号判断是否存在无故障的存储器, 引脚电子部分具有用于向/从被测存储器输入/接收信号的内部电路,用于将内部电路与待测存储器连接的第一传输线和用于将第一传输线与 当未测试内存不足并在测试未被测试的内存中断开第一条传输线与地电位时的地电位。

    Test apparatus and test method
    35.
    发明申请
    Test apparatus and test method 有权
    试验装置及试验方法

    公开(公告)号:US20070136625A1

    公开(公告)日:2007-06-14

    申请号:US11290610

    申请日:2005-11-30

    IPC分类号: G11C29/00

    CPC分类号: G11C29/56

    摘要: There is provided a test apparatus for testing a memory-under-test for storing data strings to which an error correcting code has been added, having a logical comparator for comparing each data contained in the data string read out of the memory-under-test with an expected value generated in advance, a data error counting section for counting a number of data inconsistent with the expected value, a plurality of registers, provided corresponding to each of a plurality of classes, for storing an upper limit value of a number of errors contained in the data -under-test to be classified into the class, comparing sections for comparing each of the plurality of upper limit values stored in the plurality of registers with the counted value of the data error counting section and a classifying section for classifying the memory-under-test into the class corresponding to the register storing the upper limit value which is greater than the counted value.

    摘要翻译: 提供了一种用于测试用于存储已经添加了纠错码的数据串的测试存储器的测试装置,具有用于比较从被测存储器中读出的数据串中包含的每个数据的逻辑比较器 具有预先产生的期望值,用于计数与期望值不一致的数据数量的数据错误计数部分,与多个类别中的每一个相对应地设置的多个寄存器,用于存储多个等级的上限值 包含在要分类到该类别的数据测试中的错误,比较将存储在多个寄存器中的多个上限值中的每一个与数据错误计数部分的计数值进行比较的部分和用于分类的分类部分 与存储上限值的寄存器对应的类别中的存储器下测试大于计数值。

    Inverter device
    36.
    发明申请
    Inverter device 有权
    变频器

    公开(公告)号:US20060119310A1

    公开(公告)日:2006-06-08

    申请号:US11293914

    申请日:2005-12-05

    IPC分类号: H02P27/04

    CPC分类号: H02M7/5387 H02P6/18 H02P6/20

    摘要: The control device records, in advance, a current data table which specifies relationships between currents in respective phases in a three-phase motor and rotation angles of a rotor of the three-phase motor, obtains, from the current data table, a rotation angle of the rotor of the three-phase motor corresponding to a current in each phase in the three-phase motor detected by a current sensor before driving of the three-phase motor, and obtains an initial position of the rotor.

    摘要翻译: 控制装置预先记录指定三相电动机的各相的电流与三相电动机的转子的旋转角度之间的关系的当前数据表,从当前数据表中取得旋转角度 在三相电动机的驱动之前由三相电动机的转子对应于由三相电动机中的电流传感器检测到的每相中的电流,并获得转子的初始位置。

    Liquid crystal optical element and an optical device
    37.
    发明申请
    Liquid crystal optical element and an optical device 有权
    液晶光学元件和光学器件

    公开(公告)号:US20050140859A1

    公开(公告)日:2005-06-30

    申请号:US11067648

    申请日:2005-02-28

    CPC分类号: G02F1/133512 G02F1/134309

    摘要: The present invention provides a compact liquid crystal optical element for optical modulation and a compact optical device. A liquid crystal optical element for optical modulation is prepared by connecting two transparent substrates, each formed with a transparent electrode and an orientation film, with a sealing member, leaving a clearance between the two transparent substrates. On at least one surface of at least one of these transparent substrates, a diaphragm is formed using a shielding member. With this arrangement, it is possible to provide a more compact liquid crystal optical element than has been conventionally available. At the same time, it is possible to substantially reduce the occurrence of noise. Therefore, it is possible to provide a liquid crystal optical element and an optical device having excellent performance.

    摘要翻译: 本发明提供一种用于光调制的紧凑型液晶光学元件和紧凑型光学器件。 通过将两个形成有透明电极和取向膜的透明基板与密封构件连接,在两个透明基板之间留有间隙来制备用于光学调制的液晶光学元件。 在这些透明基板中的至少一个的至少一个表面上,使用屏蔽构件形成隔膜。 通过这种布置,可以提供比传统可用的更紧凑的液晶光学元件。 同时,可以显着地减少噪声的发生。 因此,可以提供具有优异性能的液晶光学元件和光学装置。

    Filtering means regenerating system for diesel engine
    38.
    发明授权
    Filtering means regenerating system for diesel engine 失效
    过滤是指柴油机的再生系统

    公开(公告)号:US06817174B1

    公开(公告)日:2004-11-16

    申请号:US09691526

    申请日:2000-10-18

    IPC分类号: F01N300

    摘要: There is provided a filtering means regenerating system for a diesel engine, in which the filtering means provided in an exhaust gas passage oxidizes NO in exhaust gas of the engine into NO2, and collects particulates in exhaust gas to thereby oxidize the particulates by NO2 and remove the same at a temperature higher than a predetermined exhaust gas temperature. Also, an in-line fuel injection system for injecting fuel into the engine is provided with a variable timer mechanism for regulating the injection timing of fuel, and the deposit of particulates deposited on the filtering means is detected by deposit detecting means. A controller controls the variable timer mechanism based on the detection output of the deposit detecting means. The filtering means is prevented from becoming in an excessively collecting state in all operation statuses of the engine, thereby preventing a decrease in fuel economy and power performance of the engine.

    摘要翻译: 提供了一种用于柴油发动机的过滤装置再生系统,其中设置在排气通道中的过滤装置将发动机的废气中的NO氧化为NO 2,并且将废气中的颗粒收集,从而通过NO 2氧化颗粒并除去 在高于预定排气温度的温度下相同。 此外,用于将燃料喷射到发动机中的在线燃料喷射系统设置有用于调节燃料的喷射正时的可变定时器机构,并且通过沉积检测装置检测沉积在过滤装置上的微粒的沉积。 控制器基于存款检测装置的检测输出来控制可变定时器机构。 在发动机的所有操作状态下,防止过滤装置处于过度收集状态,从而防止发动机的燃油经济性和动力性能的降低。

    Delay time judging apparatus
    39.
    发明授权
    Delay time judging apparatus 失效
    延迟时间判断装置

    公开(公告)号:US06651179B1

    公开(公告)日:2003-11-18

    申请号:US09568339

    申请日:2000-05-10

    IPC分类号: G06F104

    摘要: Apparatus of judging delay time, capable of judging whether or not delay time for delaying an input signal is equal to a desired delay, includes: a shift clock supply unit which supplies a shift clock whose phase is delayed by the desired delayed time against a phase of a reference clock; a phase comparing unit which compares a phase of the shift clock to a phase of a delay clock for which the reference clock is delayed by a delay circuit, and then outputs a comparison signal; and a judging unit which judges whether or not the delay time of the delay circuit is equal to the desired delay time. A method therefor includes: generating a shift clock which delays a phase of a reference clock by a predetermined amount based on a desired delay time; comparing a phase of the delay clock to that of the shift clock; judging whether or not the phase of the shift clock matches that of the delay clock; and repeating a step of generating the shift clock, a step of comparing the phase and a step of judging until the phase of the delay clock matches that of the shift clock.

    摘要翻译: 判断延迟时间的装置,能够判断延迟输入信号的延迟时间是否等于期望的延迟,包括:移位时钟提供单元,其向相位延迟所需延迟时间的移相时钟提供相位, 的参考时钟; 相位比较单元,其将所述移位时钟的相位与所述参考时钟被延迟电路延迟的延迟时钟的相位进行比较,然后输出比较信号; 以及判断单元,判断延迟电路的延迟时间是否等于期望的延迟时间。 其方法包括:产生基于期望的延迟时间将参考时钟的相位延迟预定量的移位时钟; 将延迟时钟的相位与移位时钟的相位进行比较; 判断移位时钟的相位是否与延迟时钟的相位相匹配; 以及重复产生移位时钟的步骤,比较所述相位和判断步骤直至所述延迟时钟的相位与所述移位时钟的相位相匹配的步骤。