摘要:
The present invention relates to a base station device 1 that performs wireless communication with a terminal device 2 existing in its cell. The base station device 1 includes an obtainment unit (reception unit 12) that obtains control information for another base station device 1 to achieve synchronization with the another base station device 1, and a selection unit (synchronization control unit 40) that selects the another base station device 1 to be a synchronization source, based on identification information that specifies the type of the another base station device 1, the identification information being included in the control information.
摘要:
Basic units (resource blocks) of resource allocation that can be used in a communication area of a base station apparatus are determined without obtaining resource allocation information. To do so, a base station apparatus includes an RF unit 4 that receives a communication signal between another base station apparatus and a terminal apparatus wirelessly connected to the another base station apparatus; a synchronization processing unit 5b that performs a process for synchronizing with the another base station apparatus; and a measurement processing unit 5d that determines power in each resource block of the communication signal received by the RF unit 4 and determines, based on the power, whether the resource block can be used in a communication area of the base station apparatus.
摘要:
Interference suppression by beam forming is achieved even in an FDD (Frequency Division Duplex) system. A base station device 1 performs communication based on FDD. The base station device 1 includes a downlink signal reception unit 12 that receives a downlink signal transmitted from another base station device. The base station device 1 performs a beam forming process for directing a null beam to an arrival direction of the downlink signal from the another base station device, by using transmission path information between the base station device and the another base station device, the information being available from the downlink signal received by the downlink signal reception unit 12.
摘要:
A projector includes a light source, a light modulator that modulates the light flux emitted from the light source in accordance with an image signal to form image light, a projection optical apparatus that enlarges and projects the image light, a reflection section having a reflection surface disposed along the direction in which the projection optical apparatus outputs the image light, the reflection surface reflecting the image light, and an adjustment section that adjusts the inclination angle of the reflection section with respect to the direction in which the image light travels.
摘要:
A thermal power plant that uses low-grade coal as fuel and allows for increased thermal efficiency of the entire plant is provided. The thermal power plant includes a drying device (3) that dries the low-grade coal to be supplied to a lignite mill (coal pulverizer) (4), and a drying-gas heater (13) that heats air to be supplied to the drying device (3) so as to be used for drying the low-grade coal. A condenser (12) and the drying-gas heater (13) are connected with each other via a heat exchanger (19), and exhaust heat from the condenser (12) is used as a heat source for heating the air.
摘要:
The generation of bubbles in a liquid crystal material of a liquid crystal display panel and the generation of color irregularities when the liquid crystal display panel is pushed can be reduced. In a display device having a liquid crystal display panel in which a liquid crystal material is filled between a first substrate and a second substrate, the second substrate forms, on a surface of an insulation substrate which faces the first substrate, first columnar members, second columnar members and third columnar members which differ from each other in a distance from the surface of the insulation substrate to a top portion of each columnar member. Assuming the distance of the first columnar member as L1, the distance of the second columnar member as L2 and the distance of the third columnar member as L3, a relationship among the distances L1, L3, L2 satisfies L1>L3>L2, and assuming the number of the first columnar members arranged on the surface of the insulation substrate as N1, the number of the second columnar members arranged on the surface of the insulation substrate as N2 and the number of the third columnar members arranged on the surface of the insulation substrate as N3, a relationship among the numbers N1, N2, N3 satisfies N2>N1>N3.
摘要:
Disclosed herein is a microscope, including: an illumination optical system; a first image creation optical system; a second image creation optical system; an illumination-field-diaphragm focus adjustment section; and a characteristic-quantity computation block, wherein the illumination-field-diaphragm focus adjustment section adjusts the image creation position for the illumination field diaphragm on the basis of the characteristic quantity computed by the characteristic-quantity computation block.
摘要:
The amount of high-temperature steam supplied from external equipment is reduced. Provided is a hydrogen production system (1) including a reactor (3) that allows a humidified process fluid output from a humidifier (2) to react in the presence of a catalyst to transform carbon monoxide in the process fluid into carbon dioxide; a second channel (B) through which the high-temperature process fluid that has reacted in the reactor (3) flows; a circulation channel (C) through which excess water in the humidifier (2) is circulated; and a first heat exchanger (7), disposed at an intersection of the circulation channel (C) and the second channel (B), for heat exchange between the high-temperature process fluid that has reacted in the reactor (3) and the fluid circulated through the circulation channel (C).
摘要:
The present invention relates to a plasma etching apparatus capable of uniformly etching the entire surface of a substrate regardless of the kind of the substrate. A plasma etching apparatus 1 has a processing chamber 11 in which the outer diameter of an upper chamber 12 is formed smaller than a lower chamber 13 and the upper chamber 12 is provided at the central portion of the top surface of the lower chamber 13, a grounded plate-shaped member 14 which is provided on the ceiling of the lower chamber 13 to divide the inner space of the processing chamber 11 and which has a plurality of through holes 14a penetrating from the top surface to the bottom surface thereof, a platen 16 which is disposed in the lower chamber 13 and on which a substrate K is placed, a gas supply device 20 for supplying an etching gas into the upper chamber 12, plasma generating devices 26, 29 for exciting etching gases in the upper chamber 12 and in the lower chamber 13 into a plasma, respectively, an exhaust device 35 for reducing the pressure within the processing chamber 11, and an RF power supply unit 32 for supplying RF power to the platen 16.
摘要:
A plasma processing apparatus includes a processing chamber; a lower electrode provided in the processing chamber and having a base made of a conductive metal to which a high frequency power is applied, the lower electrode also serving as a mounting table for mounting thereon a target substrate; an upper electrode provided in the processing chamber to face the lower electrode; and a focus ring disposed above the lower electrode to surround the target substrate. An electrical connection mechanism is provided between the base of the lower electrode and the focus ring to electrically connect the base of the lower electrode to the focus ring through a current control element, and generates a DC current in accordance with a potential difference.