Method for measuring optical-phase distribution
    31.
    发明申请
    Method for measuring optical-phase distribution 失效
    光学相位分布测量方法

    公开(公告)号:US20060187467A1

    公开(公告)日:2006-08-24

    申请号:US11359126

    申请日:2006-02-21

    CPC classification number: G01B11/2441 G01J9/00 G01M11/0228

    Abstract: A provided optical-phase-distribution measuring method, by which optical phase distribution is identified at high speed and with high accuracy from information on light-intensity distribution without using a special measuring device, comprises steps: for inputting light to be measured to optical systems, respectively, modulating the intensity and the phase, detecting the output light to be measured with CCD, and measuring the intensity distribution of detected light to be measured as an image with an optical-phase-distribution measuring system provided with the two different optical systems; for setting an observation equation, based on the intensity distribution and on the optical characteristics of the optical systems; for setting a phase-distribution identification inverse-problem from the observation equation, and formulating the set phase-distribution identification inverse-problem as a first nonlinear optimization problem in which complex amplitude representing the light to be measured is assumed to be a design variable; for converting the first nonlinear optimization problem to a second nonlinear optimization problem, in which expansion coefficients in a series expansion are assumed to be design variables, by series expansion of the phase distribution of the light to be measured; and for identifying the phase distribution of the light to be measured by solving the second nonlinear optimization problem.

    Abstract translation: 一种提供的相位分布测量方法,其中通过光信号分布从高分辨率的信息识别光强分布而不使用特殊的测量装置,其中包括以下步骤:将要测量的光输入光学系统 分别调制强度和相位,用CCD检测要测量的输出光,并用配备有两个不同光学系统的光相位分布测量系统测量被测光的测量光的强度分布作为图像 ; 用于基于光学系统的强度分布和光学特性设置观测方程; 用于从观测方程设定相位分布识别反问题,并且将所设定的相位分布识别反问题作为第一非线性优化问题,其中假定表示待测光的复数幅度为设计变量; 用于将第一非线性优化问题转换为第二非线性优化问题,其中串联扩展中的膨胀系数被假设为设计变量,通过对待测量的光的相位分布进行串联扩展; 并且通过求解第二非线性优化问题来识别要测量的光的相位分布。

    Image processing apparatus and refractive index distribution measuring apparatus
    32.
    发明申请
    Image processing apparatus and refractive index distribution measuring apparatus 有权
    图像处理装置和折射率分布测定装置

    公开(公告)号:US20060159332A1

    公开(公告)日:2006-07-20

    申请号:US11335393

    申请日:2006-01-18

    Inventor: Yasuhiro Sawada

    CPC classification number: G01M11/0228 G01N21/45

    Abstract: An image processing apparatus is disclosed which can produce refractive index distribution data with high accuracy without limiting directions in which transmitted wavefronts are measured. The image processing apparatus has a simulating section which simulates a transmitted wavefront in each of the directions to produce a second transmitted wavefront image based on first refractive index distribution data, a comparing section which produces first information indicating the result of comparison between the second transmitted wavefront image and the first transmitted wavefront image, and a changing section which changes the first refractive index distribution data based on the first information to produce second refractive index distribution data. In the apparatus, the processing in the sections is repeated using the second refractive index distribution data as the first refractive index distribution data to produce the resulting second refractive index distribution data which is used as the output refractive index distribution data.

    Abstract translation: 公开了一种图像处理装置,其可以高精度地产生折射率分布数据,而不限制测量透射波前的方向。 该图像处理装置具有模拟部分,其模拟在每个方向上的发射波前,以基于第一折射率分布数据产生第二透射波前图像;比较部分,其产生指示第二透射波阵面之间的比较结果的第一信息 图像和第一透射波前图像,以及改变部分,其基于第一信息改变第一折射率分布数据,以产生第二折射率分布数据。 在该装置中,使用第二折射率分布数据作为第一折射率分布数据重复各部分中的处理,以产生用作输出折射率分布数据的所得到的第二折射率分布数据。

    Apparatus and method of measuring optical properties of diffractive optical element
    33.
    发明授权
    Apparatus and method of measuring optical properties of diffractive optical element 有权
    测量衍射光学元件的光学性质的装置和方法

    公开(公告)号:US06937327B2

    公开(公告)日:2005-08-30

    申请号:US10340620

    申请日:2003-01-13

    Applicant: Keiji Fuse

    Inventor: Keiji Fuse

    CPC classification number: G01M11/0228 B23K26/067 B23K26/382 B23K26/705

    Abstract: A laser beam emitted from a laser source is split by a beam-splitting means such as a beam sampler, and the power Q of the split beam is measured by a first detector. In addition, the power q1 of light that has passed through a pinhole while a DOE is not set is measured by a second detector, and the power ratio α=q1/Q is calculated. Then, the DOE is set and the power ratio βk=qk/Q, where qk is the power of each light beam, is calculated. The power ratio βk is evaluated on the basis of the power ratio α, so the optical properties of a diffractive optical element, in particular, in terms of diffraction efficiency in laser-beam diffraction and intensity uniformity of split beams can be measured with high accuracy.

    Abstract translation: 从激光源发射的激光束被诸如光束采样器之类的光束分离装置分开,并且分割光束的功率Q由第一检测器测量。 此外,通过第二检测器测量未通过DOE通过针孔的光的功率q 1,并且功率比α= q 1 / / Q计算。 然后,设置DOE,并且功率比βQ k = Q k k,其中q k是每个光束的功率, 被计算。 基于功率比α来评估功率比βk,因此衍射光学元件的光学性质,特别是在激光束衍射中的衍射效率和强度均匀性方面 可以高精度地测量分束。

    Method for measuring gradient index distribution of rod lens
    34.
    发明授权
    Method for measuring gradient index distribution of rod lens 失效
    棒状透镜坡度指数分布测量方法

    公开(公告)号:US06919953B2

    公开(公告)日:2005-07-19

    申请号:US10067858

    申请日:2002-02-08

    CPC classification number: G01M11/0228 G02B3/0087

    Abstract: A method of measuring a radial index distribution of a rod lens has the steps: (1) the rod lens is processed so that the length is approximately P/2 (where P is pitch length) or an integer multiple thereof and so end surfaces parallel, (2) a patterned surface is set as an object surface in the proximity of one end surface, and an image surface is formed in the proximity of the other end surface by irradiating the patterned surface with condensed monochromatic light, (3) the positions of paraxial focal points and the curves of curvature of field are obtained by observing the image surface, and (4) higher-order index distribution coefficients are calculated back by a fitting process on the basis of the positions of paraxial focal points and the curves of curvature of field.

    Abstract translation: 测量棒状透镜的径向折射率分布的方法具有以下步骤:(1)棒状透镜被加工成长度近似为P / 2(其中P为节距长度)或其整数倍,因此端面平行 ,(2)将图案化表面设置为在一个端面附近的物体表面,并且通过用聚光单色光照射图案化表面,在另一端面附近形成图像表面,(3)位置 通过观察图像表面获得近轴焦点和曲率曲线,(4)通过拟合过程根据近轴焦点位置和曲线的曲线计算高阶折射率分布系数 曲率场。

    Lens meter
    35.
    发明授权
    Lens meter 失效
    镜头表

    公开(公告)号:US06778264B2

    公开(公告)日:2004-08-17

    申请号:US10034330

    申请日:2001-12-27

    CPC classification number: G01M11/0235 G01M11/0207 G01M11/0214 G01M11/0228

    Abstract: A lens meter according, including: a unit body provided with eyeglasses support means for supporting eyeglasses; a left measurement optical system provided in the unit body and provided with a left light-emitting optical system that emits measurement light to a left eyeglass lens of the eyeglasses and a left light-receiving optical system that receives the measurement light passing through the left eyeglass lens with a CCD (light-receiving element); a right measurement optical system provided in the unit body and provided with a right light-emitting optical system that emits measurement light to a right eyeglass lens of the eyeglasses and a right light-receiving optical system that receives the measurement light passing through the right eyeglass lens with the CCD (light-receiving element); and an arithmetic control circuit that performs operation to the optical characteristics of a pair of the eyeglass lenses based on an output of the CCD (light-receiving element).

    Abstract translation: 一种镜片,包括:单元体,设置有用于支撑眼镜的眼镜支撑装置; 左测量光学系统,设置在单元体中,并且设置有向左眼镜片发出测量光的左发光光学系统和接收通过左眼镜的测量光的左光接收光学系统 带有CCD(光接收元件)的镜头; 一种右测量光学系统,设置在单元体中,并具有向眼镜右眼镜片发射测量光的右发光光学系统,以及接收通过右眼镜的测量光的右光接收光学系统 带有CCD(光接收元件)的镜头; 以及基于CCD(受光元件)的输出对一对眼镜镜片的光学特性进行操作的运算控制电路。

    Method of calibrating a stereomicroscope and a stereomicroscope capable of being calibrated
    36.
    发明申请
    Method of calibrating a stereomicroscope and a stereomicroscope capable of being calibrated 失效
    校准立体显微镜的方法和可校准的立体显微镜

    公开(公告)号:US20040004762A1

    公开(公告)日:2004-01-08

    申请号:US10455112

    申请日:2003-06-05

    Abstract: A method of calibrating the magnification of a stereomicroscope having variable magnification comprises the steps of (A) positioning an object reference measure (10) with a known scaling in an object plane (8) of the stereomicroscope; (B) providing an eyepiece reference measure (6a) of known scaling in an intermediate image plane (7) of the stereomicroscope; (C) varying the magnification of the stereomicroscope using a zoom system (4) thereof so that an image of the object reference measure (10) is brought into optical alignment (coincidence) with the eyepiece reference measure (6a) in the intermediate image plane (7) in order to determine a zoom position of the zoom system (4) corresponding to this alignment; (D) determining an actual magnification of the stereomicroscope in the zoom position on the basis of a lateral magnification defined by the scalings of the object reference measure (10) and eyepiece reference measure (6a) which have been brought into alignment; (E) determining a nominal magnification of the stereomicroscope in the zoom position; (F) correlating the actual magnification and nominal magnification by computer; and (G) calculating magnifications for other zoom positions using the computer correlation of nominal magnification and actual magnification.

    Abstract translation: 校正具有可变放大倍率的立体显微镜的放大率的方法包括以下步骤:(A)将具有已知比例的对象参考测量(10)定位在立体显微镜的物平面(8)中; (B)在立体显微镜的中间像平面(7)中提供已知尺度的目镜参考测量(6a); (C)使用其变焦系统(4)改变立体显微镜的放大率,使得对象参考测量(10)的图像与中间图像平面中的目镜参考测量(6a)进行光学对准(重合) (7),以便确定与该对准相对应的变焦系统(4)的变焦位置; (D)基于通过对准基准测量(10)的缩放和已经对准的目镜参考测量(6a)所定义的横向倍率来确定变焦位置中的立体显微镜的实际倍率; (E)确定所述立体显微镜在所述变焦位置中的标称倍率; (F)通过计算机关联实际放大倍数和标称倍率; 和(G)使用标称倍率和实际倍率的计算机相关性计算其它变焦位置的放大率。

    Characterization of optical preforms
    37.
    发明申请
    Characterization of optical preforms 审中-公开
    光学预型件的表征

    公开(公告)号:US20030110809A1

    公开(公告)日:2003-06-19

    申请号:US10055183

    申请日:2001-10-26

    Applicant: Corning, Inc.

    Abstract: The present invention is directed to a method for characterizing an optical preform. To achieve this, the present invention provides a three-dimensional map of the refractive-index distribution within a boule or an optical preform. The three-dimensional map of the refractive-index distribution allows device manufacturers to better predict the performance of the optical device. The three-dimensional map also allows device manufacturers to determine the best orientation of the preform during device extraction.

    Abstract translation: 本发明涉及一种用于表征光学预型件的方法。 为了实现这一点,本发明提供了一种在焦耳或光学预型件内的折射率分布的三维图。 折射率分布的三维图可以让设备制造商更好地预测光学器件的性能。 三维贴图还允许器件制造商在器件提取期间确定预制棒的最佳取向。

    Apparatus and process for spatially resolved refractive power determination

    公开(公告)号:US06515739B2

    公开(公告)日:2003-02-04

    申请号:US09818124

    申请日:2001-03-26

    CPC classification number: G01M11/0228

    Abstract: Apparatus for the spatially resolved determination of the refractive power distribution of an optical element, with a light source unit for illuminating the optical element with an extended pencil of rays, includes a first multi hole screen for the production of a first number of beam pencils, a spatially resolving detector, and a computing unit. A controllable manipulator is arranged before or after the first multi hole screen. The first multi hole screen and the manipulator are transmissive only for a second number of beam pencils, the second number being smaller than the first number but greater than unity. The measurement principle of the apparatus corresponds to that of a Hartmann wavefront sensor.

    Lens specifying device
    39.
    发明授权
    Lens specifying device 失效
    镜头指定装置

    公开(公告)号:US06359684B2

    公开(公告)日:2002-03-19

    申请号:US09381294

    申请日:1999-09-22

    CPC classification number: G01M11/0235 G01M11/0228

    Abstract: A lens specifying apparatus comprising a light source (21) for projecting a measuring light beam on a lens (30) under examination, an area CCD (35) image receiving element for receiving the measuring light beam transmitted by the lens (30) under examination, a filter disc (64) disposed, as means for providing spectral transmittances, at a midpoint of an optical path extending from the light source (21) to the area CCD (35), and a processing circuit (37) for calculating the refractive characteristics and spectral transmittances of the lens (30) under examination on the basis of an output of the area CCD (35) and displaying the refractive characteristics and spectral transmittances on a monitor (3).

    Abstract translation: 一种透镜指定装置,包括用于将检测光束投射在被检查的透镜(30)上的光源(21),用于接收被检查的透镜(30)透射的测量光束的区域CCD(35)图像接收元件 ,设置在从光源(21)延伸到区域CCD(35)的光路的中点处作为提供光谱透射的装置的滤光片(64),以及用于计算折射率的处理电路(37) 基于区域CCD(35)的输出检查透镜(30)的特性和光谱透射率,并在监视器(3)上显示折射特性和光谱透射率。

    Apparatus and process for spatially resolved refractive power determination
    40.
    发明申请
    Apparatus and process for spatially resolved refractive power determination 有权
    用于空间分辨屈光力测定的装置和工艺

    公开(公告)号:US20020021437A1

    公开(公告)日:2002-02-21

    申请号:US09818124

    申请日:2001-03-26

    CPC classification number: G01M11/0228

    Abstract: Apparatus for the spatially resolved determination of the refractive power distribution of an optical element, with a light source unit for illuminating the optical element with an extended pencil of rays, includes a first multi hole screen for the production of a first number of beam pencils, a spatially resolving detector, and a computing unit. A controllable manipulator is arranged before or after the first multi hole screen. The first multi hole screen and the manipulator are transmissive only for a second number of beam pencils, the second number being smaller than the first number but greater than unity. The measurement principle of the apparatus corresponds to that of a Hartmann wavefront sensor.

    Abstract translation: 用于空间分辨确定光学元件的屈光力分布的装置,具有用于用延长的光线照射光学元件的光源单元,包括用于产生第一数量的光束笔的第一多孔屏幕, 空间分辨检测器和计算单元。 在第一多孔屏幕之前或之后设置可控操纵器。 第一多孔屏幕和操纵器仅对于第二数量的光束笔是透射的,第二数量小于第一数量但大于1。 装置的测量原理对应于哈特曼波前传感器的测量原理。

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