Abstract:
A provided optical-phase-distribution measuring method, by which optical phase distribution is identified at high speed and with high accuracy from information on light-intensity distribution without using a special measuring device, comprises steps: for inputting light to be measured to optical systems, respectively, modulating the intensity and the phase, detecting the output light to be measured with CCD, and measuring the intensity distribution of detected light to be measured as an image with an optical-phase-distribution measuring system provided with the two different optical systems; for setting an observation equation, based on the intensity distribution and on the optical characteristics of the optical systems; for setting a phase-distribution identification inverse-problem from the observation equation, and formulating the set phase-distribution identification inverse-problem as a first nonlinear optimization problem in which complex amplitude representing the light to be measured is assumed to be a design variable; for converting the first nonlinear optimization problem to a second nonlinear optimization problem, in which expansion coefficients in a series expansion are assumed to be design variables, by series expansion of the phase distribution of the light to be measured; and for identifying the phase distribution of the light to be measured by solving the second nonlinear optimization problem.
Abstract:
An image processing apparatus is disclosed which can produce refractive index distribution data with high accuracy without limiting directions in which transmitted wavefronts are measured. The image processing apparatus has a simulating section which simulates a transmitted wavefront in each of the directions to produce a second transmitted wavefront image based on first refractive index distribution data, a comparing section which produces first information indicating the result of comparison between the second transmitted wavefront image and the first transmitted wavefront image, and a changing section which changes the first refractive index distribution data based on the first information to produce second refractive index distribution data. In the apparatus, the processing in the sections is repeated using the second refractive index distribution data as the first refractive index distribution data to produce the resulting second refractive index distribution data which is used as the output refractive index distribution data.
Abstract:
A laser beam emitted from a laser source is split by a beam-splitting means such as a beam sampler, and the power Q of the split beam is measured by a first detector. In addition, the power q1 of light that has passed through a pinhole while a DOE is not set is measured by a second detector, and the power ratio α=q1/Q is calculated. Then, the DOE is set and the power ratio βk=qk/Q, where qk is the power of each light beam, is calculated. The power ratio βk is evaluated on the basis of the power ratio α, so the optical properties of a diffractive optical element, in particular, in terms of diffraction efficiency in laser-beam diffraction and intensity uniformity of split beams can be measured with high accuracy.
Abstract translation:从激光源发射的激光束被诸如光束采样器之类的光束分离装置分开,并且分割光束的功率Q由第一检测器测量。 此外,通过第二检测器测量未通过DOE通过针孔的光的功率q 1,并且功率比α= q 1 / / Q计算。 然后,设置DOE,并且功率比βQ k = Q k k,其中q k是每个光束的功率, 被计算。 基于功率比α来评估功率比βk,因此衍射光学元件的光学性质,特别是在激光束衍射中的衍射效率和强度均匀性方面 可以高精度地测量分束。
Abstract:
A method of measuring a radial index distribution of a rod lens has the steps: (1) the rod lens is processed so that the length is approximately P/2 (where P is pitch length) or an integer multiple thereof and so end surfaces parallel, (2) a patterned surface is set as an object surface in the proximity of one end surface, and an image surface is formed in the proximity of the other end surface by irradiating the patterned surface with condensed monochromatic light, (3) the positions of paraxial focal points and the curves of curvature of field are obtained by observing the image surface, and (4) higher-order index distribution coefficients are calculated back by a fitting process on the basis of the positions of paraxial focal points and the curves of curvature of field.
Abstract:
A lens meter according, including: a unit body provided with eyeglasses support means for supporting eyeglasses; a left measurement optical system provided in the unit body and provided with a left light-emitting optical system that emits measurement light to a left eyeglass lens of the eyeglasses and a left light-receiving optical system that receives the measurement light passing through the left eyeglass lens with a CCD (light-receiving element); a right measurement optical system provided in the unit body and provided with a right light-emitting optical system that emits measurement light to a right eyeglass lens of the eyeglasses and a right light-receiving optical system that receives the measurement light passing through the right eyeglass lens with the CCD (light-receiving element); and an arithmetic control circuit that performs operation to the optical characteristics of a pair of the eyeglass lenses based on an output of the CCD (light-receiving element).
Abstract:
A method of calibrating the magnification of a stereomicroscope having variable magnification comprises the steps of (A) positioning an object reference measure (10) with a known scaling in an object plane (8) of the stereomicroscope; (B) providing an eyepiece reference measure (6a) of known scaling in an intermediate image plane (7) of the stereomicroscope; (C) varying the magnification of the stereomicroscope using a zoom system (4) thereof so that an image of the object reference measure (10) is brought into optical alignment (coincidence) with the eyepiece reference measure (6a) in the intermediate image plane (7) in order to determine a zoom position of the zoom system (4) corresponding to this alignment; (D) determining an actual magnification of the stereomicroscope in the zoom position on the basis of a lateral magnification defined by the scalings of the object reference measure (10) and eyepiece reference measure (6a) which have been brought into alignment; (E) determining a nominal magnification of the stereomicroscope in the zoom position; (F) correlating the actual magnification and nominal magnification by computer; and (G) calculating magnifications for other zoom positions using the computer correlation of nominal magnification and actual magnification.
Abstract:
The present invention is directed to a method for characterizing an optical preform. To achieve this, the present invention provides a three-dimensional map of the refractive-index distribution within a boule or an optical preform. The three-dimensional map of the refractive-index distribution allows device manufacturers to better predict the performance of the optical device. The three-dimensional map also allows device manufacturers to determine the best orientation of the preform during device extraction.
Abstract:
Apparatus for the spatially resolved determination of the refractive power distribution of an optical element, with a light source unit for illuminating the optical element with an extended pencil of rays, includes a first multi hole screen for the production of a first number of beam pencils, a spatially resolving detector, and a computing unit. A controllable manipulator is arranged before or after the first multi hole screen. The first multi hole screen and the manipulator are transmissive only for a second number of beam pencils, the second number being smaller than the first number but greater than unity. The measurement principle of the apparatus corresponds to that of a Hartmann wavefront sensor.
Abstract:
A lens specifying apparatus comprising a light source (21) for projecting a measuring light beam on a lens (30) under examination, an area CCD (35) image receiving element for receiving the measuring light beam transmitted by the lens (30) under examination, a filter disc (64) disposed, as means for providing spectral transmittances, at a midpoint of an optical path extending from the light source (21) to the area CCD (35), and a processing circuit (37) for calculating the refractive characteristics and spectral transmittances of the lens (30) under examination on the basis of an output of the area CCD (35) and displaying the refractive characteristics and spectral transmittances on a monitor (3).
Abstract:
Apparatus for the spatially resolved determination of the refractive power distribution of an optical element, with a light source unit for illuminating the optical element with an extended pencil of rays, includes a first multi hole screen for the production of a first number of beam pencils, a spatially resolving detector, and a computing unit. A controllable manipulator is arranged before or after the first multi hole screen. The first multi hole screen and the manipulator are transmissive only for a second number of beam pencils, the second number being smaller than the first number but greater than unity. The measurement principle of the apparatus corresponds to that of a Hartmann wavefront sensor.