Abstract:
An apparatus adapted to convert an input analog signal to an output digital signal includes means adapted to convert a first digital value of the output signal of the apparatus to a first analog value (IN1), wherein the first digital value is emitted by the apparatus at a first time instant, and also means for feeding back the first analog value to the input of the apparatus. The apparatus includes first means adapted to determine the difference between the first analog value and a second analog value (IN) of the input signal at a second time instant successive to the first time instant. The apparatus also includes second means adapted to convert the difference to a digital value and third means adapted to add or subtract the digital value of the difference to or from said first digital value by obtaining the output digital signal.
Abstract:
An apparatus adapted to convert an input analog signal to an output digital signal includes means adapted to convert a first digital value of the output signal of the apparatus to a first analog value (IN1), wherein the first digital value is emitted by the apparatus at a first time instant, and also means for feeding back the first analog value to the input of the apparatus. The apparatus includes first means adapted to determine the difference between the first analog value and a second analog value (IN) of the input signal at a second time instant successive to the first time instant. The apparatus also includes second means adapted to convert the difference to a digital value and third means adapted to add or subtract the digital value of the difference to or from said first digital value by obtaining the output digital signal.
Abstract:
When converting an analog signal to N-bit digital codes, high SNR (signal to noise ratio) by generating multiple N-bit codes from the same analog sample and averaging the N-bit codes. However, the entire N-bit code is determined only a single time, and only P-bit (P less than N) codes are generated. The P-bit codes may be averaged, and the N-bit code is corrected based on the average value to generate an accurate N-bit digital code. As P can be much less than N, the correction can be implemented in a few iterations, thereby enabling the ADCs to be implemented with a high throughput performance. Due to the correction, a high SNR may be attained as well.
Abstract:
An autoranging analog to digital conversion system is provided. The system may include a digitally programmable preamplifier for amplifying a difference between an analog input and an estimate of the analog input. The preamplifier may be coupled to an analog to digital converter for converting the preamplifier output to a digital signal. The system may also include digital domain predictor or estimation logic for determining an optimum gain and analog input estimate for a given analog input. Multiple signal input channels may be coupled to the analog to digital conversion system. The autoranging estimations may be performed on a sample by sample basis or a channel by channel basis.
Abstract:
A programmable gain preamplifier is provided which has a low temperature drift and good dynamic range characteristics. The programmable gain preamplifier provides a programmable gain of the difference between two input signals (Ain and Ain′ for example). One of the input signals (Ain′) may be an estimation of the other input signal (Ain). The estimation input signal (or a signal related to the estimated input) may be generated by the use of a reference voltage and a first resistor string. More particularly, the reference voltage and the first resistor string may operate as a digital to analog converter (DAC) that converts a digital estimation signal to an analog estimation voltage. The analog estimation voltage operates as an analog voltage that is a function of (or the same as) the analog Ain′ estimation signal. The first resistor string may provide the estimation voltage without loading the resistor string. Thus, the first resistor string may be simultaneously utilized by other circuitry, such as for example, a downstream ADC. The programmable preamplifier gain may be set by the use of a second resistor string and digitally programmable switches. Contacts to the resistors strings may be placed outside of the current path of each resistor string to provide highly stable resistor strings having a very low temperature drift. In one preamplifier embodiment, some or all of the opamps may chopper stabilized opamps, at least one opamp may be a current feedback opamp, the resistor strings may be at least 64 resistors long and programmable gains from 1 to 32 may be provided.
Abstract:
An autoranging analog to digital conversion system is provided. The system may include a digitally programmable preamplifier for amplifying a difference between an analog input and an estimate of the analog input. The preamplifier may be coupled to an analog to digital converter for converting the preamplifier output to a digital signal. The system may also include digital domain predictor or estimation logic for determining an optimum gain and analog input estimate for a given analog input. Multiple signal input channels may be coupled to the analog to digital conversion system. The autoranging estimations may be performed on a sample by sample basis or a channel by channel basis.
Abstract:
A flash converter is preceded by an accurate continuous-time error amplifier operating on the difference between the input signal and a feedback DAC. The DAC output is operatively coupled to the amplifier input virtual ground or summing node through, for example, a set of precision capacitors. The input circuit is also coupled to the amplifier input through a continuous-time element such as a set of precision capacitors, approximately equal in capacitance to those coupled to the DAC. The amplifier may have a moderate closed-loop forward gain such as 16 with a high-pass characteristic beyond, for example, 10 Hz. The DAC is controlled by the latched output of a digital signal processing block, which uses digital outputs from the flash converter and the last latched output to predict the next value of the input signal. Converter control loop stability is afforded by providing a lowpass character to the prediction circuit. The converter produces a digital result by adding the digital value produced by the flash, properly scaled, to the current digital output value of the digital latch driving the DAC. The digital result may be sub-sampled at any arbitrary phase of the input sampling clock to permit optimum-phase data recovery.
Abstract:
A simple down converting A/D converter utilizing predictive coding principles. By placing the sampler inside the predictive loop, the predictive loop filter can be implemented using DSP techniques, thus eliminating the complexities introduced by use of discrete-time analog circuitry. Then, by re-mapping the output of the predictive loop filter into the analog domain using a D/A converter, the predictive filter output signal is subtracted from the input analog signal to generate the prediction error signal. Therefore, through directly sampling the prediction error signal and converting the output of the predictive loop filter into analog representation using a low-cost multiple bit D/A, the use of discrete-time analog circuitry is eliminated and the complexity of the converter design is greatly reduced. Various features of the invention are disclosed.
Abstract:
In an A/D converter for electrical signals, the difference, between the instantaneous analog input signal Y(t) and a previous analog signal value Y(t-T), is converted in a fast analog-to-digital converter (3) to a digital sum value. This sum value is added to the preceding digital value, stored in a buffer memory (7, 7'), and the result is fed to a slow but precise D/A converter (2) for generation of the next Y(t-T) value. This has the advantage that good results can be obtained with A/D converters less expensive than those heretofore required to obtain such results.
Abstract:
An analog-to-digital converter (ADC) has at least one resistance ladder circuit for generating a stepped series of reference voltages and set of comparator circuits for comparing an input voltage, or a voltage derived therefrom, with at least a subset of the stepped series of reference voltages. The reference voltages from the resistance ladder circuit are stepped in 4 LSB increments, where 1 LSB is the voltage differential corresponding to a one bit change in the ADC output value. During an initial set of conversion cycles, a ten-bit digital conversion value representing the input voltage is generated. In a last conversion cycle, two additional bits of resolution are added to the conversion value using a "parallel successive approximation register" circuit. This last conversion cycle also corrects errors of up to .+-.6 LSB in the first ten bits of the digital conversion value. A set of successive comparison voltages are generated in the third conversion cycle by selectively switching combinations of reference voltages with binary weighted capacitors. The resulting comparison voltages are stepped in 1 LSB increments, which is one fourth the voltage increment between neighboring reference voltages produced by the resistance ladder circuit, and cover a predefined range of voltages above and below the voltage associated with the ten-bit value generated during the first two conversion cycles. Then a voltage derived from the input voltage is compared with these generated voltages to generate a correction value that is combined with the ten-bit value generated during the initial conversion cycles to produce a 12-bit conversion value.