Spectral imaging system
    422.
    发明授权

    公开(公告)号:US10228283B2

    公开(公告)日:2019-03-12

    申请号:US15676979

    申请日:2017-08-14

    Abstract: A spectral imaging system includes a spectrometer and an optics imaging system. The spectrometer is operable for generating spectral signatures of objects from a scene. The optics imaging system is operable to generate six or more responses from the same scene. Each of the six or more responses represents different spectral content of the objects in the scene. The responses generated by the optics imaging system can be used to generate a hypercube using spectral reconstruction techniques. In an embodiment, the spectral imaging system could be implemented as part of a mobile phone.

    Spectral imaging system for remote and noninvasive detection of target substances using spectral filter arrays and image capture arrays

    公开(公告)号:US10222260B2

    公开(公告)日:2019-03-05

    申请号:US15379059

    申请日:2016-12-14

    Applicant: InnoPix, Inc.

    Abstract: An approach to noninvasively and remotely detect the presence, location, and/or quantity of a target substance in a scene via a spectral imaging system comprising a spectral filter array and image capture array. For a chosen target substance, a spectral filter array is provided that is sensitive to selected wavelengths characterizing the electromagnetic spectrum of the target substance. Elements of the image capture array are optically aligned with elements of the spectral filter array to simultaneously capture spectrally filtered images. These filtered images identify the spectrum of the target substance. Program instructions analyze the acquired images to compute information about the target substance throughout the scene. A color-coded output image may be displayed on a smartphone or computing device to indicate spatial and quantitative information about the detected target substance. The system desirably includes a library of interchangeable spectral filter arrays, each sensitive to one or more target substances.

    Spectroscope and method for producing spectroscope

    公开(公告)号:US10215634B2

    公开(公告)日:2019-02-26

    申请号:US15987563

    申请日:2018-05-23

    Abstract: A spectrometer includes a light detection element having a substrate made of a semiconductor material, a light passing part provided in the substrate, and a light detection part put in the substrate, a support having a base wall part opposing the light detection element, and side wall parts integrally formed with the base wall part, the light detection element being fixed to the side wall parts, the support being provided with a wiring electrically connected to the light detection part, and a dispersive part provided on a surface of the base wall part on a side of a space. An end part of the wiring is connected to a terminal of the light detection element. An end part of the wiring is positioned on a surface in the base wall part on an opposite side from the side of the space.

    FILTER ARRAY RECONSTRUCTIVE SPECTROMETRY
    425.
    发明申请

    公开(公告)号:US20190056269A1

    公开(公告)日:2019-02-21

    申请号:US16079654

    申请日:2017-02-24

    Abstract: A spectrometry system may include an etalon array having a first etalon and a second etalon. The first etalon may be configured to process light to at least generate a first transmission pattern. The first transmission pattern may have at least a first transmission peak corresponding to a first wavelength in an original spectrum of the light. The second etalon may be configured to process the light to at least generate a second transmission pattern. The second transmission pattern may have at least a second transmission peak corresponding to a second wavelength in the original spectrum of the light. The first etalon may have a different thickness than the second etalon in order for the first transmission pattern to have at least one transmission peak that is at a different wavelength than the second transmission pattern. The first transmission pattern and the second transmission pattern may enable a reconstruction the original spectrum of the light.

    Global solar spectrum devices and methods

    公开(公告)号:US10209132B2

    公开(公告)日:2019-02-19

    申请号:US15769601

    申请日:2016-10-20

    Applicant: SPECTRAFY INC.

    Abstract: Solar spectral irradiance (SSI) measurements are important for solar collector/photovoltaic panel efficiency and solar energy resource assessment as well as being important for scientific meteorological/climate observations and material testing research. To date such measurements have exploited modified diffraction grating based scientific instruments which are bulky, expensive, and with low mechanical integrity for generalized deployment. A compact and cost-effective tool for accurately determining the global solar spectra as well as the global horizontal or tilted irradiances as part of on-site solar resource assessments and module performance characterization studies would be beneficial. An instrument with no moving parts for mechanical and environment stability in open field, non-controlled deployments could exploit software to resolve the global, direct and diffuse solar spectra from its measurements within the 280-4000 nm spectral range, in addition to major atmospheric processes, such as air mass, Rayleigh scattering, aerosol extinction, ozone and water vapor absorptions.

    Atomic absorption photometer and atomic absorption measurement method

    公开(公告)号:US10184886B2

    公开(公告)日:2019-01-22

    申请号:US15525327

    申请日:2014-11-11

    Inventor: Kazuo Sugihara

    Abstract: There are provided an atomic absorption photometer and an atomic absorption measurement method which can easily perform background correction in a short time period by using a plurality of types of methods while suppressing the amount of samples consumed. Background correction is performing by using each of the D2 lamp method, the Zeeman method, and a self-reversal method, according to measurement data in each of measurement periods T41 to T46 obtained in one data acquisition cycle. Background correction is performed on the common measurement data (atomic absorption data) obtained in the atomic absorption measurement period T41, by using the measurement data (background data) obtained in each of the first to third background measurement periods T44, T46, and T42.

    Apparatus and method for snapshot spectral imaging

    公开(公告)号:US10184830B2

    公开(公告)日:2019-01-22

    申请号:US15810665

    申请日:2017-11-13

    Abstract: Apparatus and method for obtaining a plurality of spectral images of a source object in a snapshot using comprising two-dimensional compressed sensing data cube reconstruction (2D CS-SCR) applied to a dispersed-diffused snapshot image. In some embodiments, the snapshot image is obtained through a RIP diffuser. In some embodiments, a randomizer is used to further randomized the dispersed-diffused snapshot image. The 2D CS-SCR includes applying a 2D framelet transform separately to arrays representing different wavebands of spectral cube data derived from the snapshot image. The application of the 2D framelet transform separately to the arrays representing the different wavebands includes application of direct and inverse 2D framelet transforms to the arrays. In some embodiments, the direct and inverse framelet transforms are included in a split Bregman iteration.

    Optical spectroscopic measurement system

    公开(公告)号:US10168212B2

    公开(公告)日:2019-01-01

    申请号:US14964956

    申请日:2015-12-10

    Applicant: Thorlabs, Inc.

    Abstract: A system capable of highly sensitive measurement of material concentration values in a sample using an optical spectroscopic method is disclosed. The system utilizes high-speed data acquisition and high resolution sampling of the raw signals output by the sensors with reduced total channel counts, and performs frequency analysis of the signals using the Fourier transform method to process all sensor channels in parallel. When each sensor is targeting the detection of some certain materials at some certain frequencies, the system is capable of simultaneous detection of multiple materials of interest in the sample with high measurement sensitivity and high speed.

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