Abstract:
A memory cell system including providing a substrate, forming a charge-storing stack having silicon-rich nitride on the substrate, and forming a gate on the charge-storing stack.
Abstract:
A memory device may include a source region and a drain region formed in a substrate and a channel region formed in the substrate between the source and drain regions. The memory device may further include a first oxide layer formed over the channel region, the first oxide layer having a first dielectric constant, and a charge storage layer formed upon the first oxide layer. The memory device may further include a second oxide layer formed upon the charge storage layer, a layer of dielectric material formed upon the second oxide layer, the dielectric material having a second dielectric constant that is greater than the first dielectric constant, and a gate electrode formed upon the layer of dielectric material.
Abstract:
A semiconductor device includes a substrate and a memory cell formed on the substrate. The memory cell includes a word line. The semiconductor device also includes a protection area formed in the substrate, a conductive structure configured to extend the word line to the protection area, and a contact configured to short the word line and the protection area.
Abstract:
A flash memory system configured in accordance with an example embodiment of the invention employs a virtual ground array architecture. During programming operations, target memory cells are biased with a positive source bias voltage to reduce or eliminate leakage current that might otherwise conduct through the target memory cells. A positive source bias voltage may also be applied to target memory cells during verification operations (program verify, soft program verify, erase verify) to reduce or eliminate leakage current that might otherwise introduce errors in the verification operations.
Abstract:
A flash memory system configured in accordance with an example embodiment of the invention employs a virtual ground array architecture. During programming operations, target memory cells are biased with a positive source bias voltage to reduce or eliminate leakage current that might otherwise conduct through the target memory cells. A positive source bias voltage may also be applied to target memory cells during verification operations (program verify, soft program verify, erase verify) to reduce or eliminate leakage current that might otherwise introduce errors in the verification operations.
Abstract:
Erasing wordlines at the same time can cause undesirable results because some wordlines are affected by electromagnetic waves of other wordlines. However, other wordlines are not affected because they are next to contacts. Therefore, it can be beneficial to erase wordlines in a multi-phase sequence that allows for erasing wordlines without an impact from other wordlines.
Abstract:
According to one exemplary embodiment, a method for fabricating a memory array includes forming a number of trenches in a substrate, where the trenches determine a number of wordline regions in the substrate, where each of the wordline regions is situated between two adjacent trenches, and where each of the wordline regions have a wordline region width. The memory array can be a flash memory array. The method further includes forming a number of bitlines in the substrate, where the bitlines are situated perpendicular to the trenches. The method further includes forming a dielectric region in each of the trenches. The method further includes forming a dielectric stack over the bitlines, wordline regions, and trenches. The method further includes forming a number of wordlines, where each wordline is situated over one of the wordline regions. The wordline region width determines an active wordline width of each of the wordlines.
Abstract:
Speech presence is detected by first bandpass filtering (141, 143, 145) the speech to split it into banks of sub-bands. A matrix of shift registers (150) store each sub-band of speech. A power determining circuit (259) then determines individual power measurements of the speech stored in each shift register element. A variance combining circuit (160) combines the individual power measurements to provide a variance for the individual shift registers. A comparator circuit (170) finally compares the variance with at least one threshold to indicate whether speech is detected.
Abstract:
An iron fortification complex which may be used to fortify foods and beverages with iron. The complex is formed of ferric ions and caseinate. The complex is sufficiently stable as to be suitable for use in retorted products. However, despite the stability, the iron in the complexes has substantially the same bioavailability as ferrous sulfate.
Abstract:
A process for replacing a first soft-top of a convertible-top of a motor vehicle with a second soft-top includes separating the first soft-top from a headliner of the convertible-top and removing the first soft-top from the convertible top. The second soft-top is selected. The second soft-top has a window at least as large as a window of the first soft-top. A plurality of receptacles are fixed to the second soft-top. The second soft-top is attached to the motor vehicle. The second soft-top is connected directly to the headliner by engaging headliner anchors with the receptacles fixed to the second soft-top.