Abstract:
A memory device includes at least one segmented writing line formed by at least one writing segment. A programming circuit is controlled by a line address circuit in a writing mode of the memory device to program at least one memory cell coupled to the segmented writing line. A reading bit line is connected to a reading circuit for reading the contents of the cell in a reading mode of the memory device. The reading bit line cooperates in writing mode with the line address circuit to control the programming circuit of the segmented writing line.
Abstract:
A random access memory array includes random access memory elements arranged in a rows and columns. The elements of each row have a word line and a write digit line and the elements of each column have a bit line and a write bit line. A first selection circuit/transistor for each row has a first source-drain path coupled in the write digit line and a gate terminal coupled to the word line. A second selection circuit/transistor for each column has a second source-drain path coupling in the write bit line and a gate terminal coupled to the bit line. A first write signal is applied to one word line to actuate the first selection circuit/transistor for the row corresponding to that one word line and cause a write current to flow through the first source-drain path of the actuated first selection circuit/transistor and the corresponding write digit line to write data into certain memory elements in that row. A second write signal is applied to one bit line to actuate the second selection circuit/transistor for the column corresponding to that one bit line and cause a write current to flow through the second source-drain path of the actuated second selection circuit/transistor and the corresponding write bit line to write data into at least one memory element in that column.
Abstract:
A switch arrangement for switching a node between three supply voltages based on two control signals. The switch arrangement includes three circuits for connecting an output node with one of three nodes, each of which is set to a different voltage. The switch arrangement is controlled by six control signals that establish mutually exclusive switching modes and avoid combinational currents. The switch arrangement is also designed to allow the use of MOS transistors having a low nominal voltage, with a value that is lower than the highest voltage to be switched. The switch arrangement is particularly adapted to supply power to non-volatile memory cells.
Abstract:
Control device for a generation circuit (REF) for reference voltages (VPOL1, VPOL2), includes a first P type MOS transistor (M12), connected between a node (N) to which a high voltage signal (EHV) is applied and a first intermediate node (A), a second P type MOS transistor (M13) connected between the first intermediate node (A) and a second intermediate node (B), and a third P type MOS transistor (M14) connected between the second node and the ground and with its grid connected to its drain, to supply a reference voltage (VPOL1, VPOL2) on one of the first and second intermediate nodes (A, B). The control device includes a controlling mechanism for controlling the reference transistors, either in a first or second operating mode.
Abstract:
A non-volatile memory cell includes a MOS transistor having a ring arrangement and comprising a floating gate, a center electrode at a center of the ring arrangement and surrounding the floating gate, and at least one peripheral electrode along a periphery of the ring arrangement.