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    System and Method for Virtual Control of Laboratory Equipment
    42.
    发明申请
    System and Method for Virtual Control of Laboratory Equipment 失效
    实验室设备虚拟控制系统与方法

    公开(公告)号：US20090259321A1

    公开(公告)日：2009-10-15

    申请号：US12103554

    申请日：2008-04-15

    申请人： Franco Stellari ,  Steven E. Steen ,  Peilin Song

    发明人： Franco Stellari ,  Steven E. Steen ,  Peilin Song

    IPC分类号： G05B15/00

    CPC分类号： G05B15/02 ,  G06F19/00

    摘要： A system for virtual control of electronic laboratory equipment includes a local computer system. One or more items of electronic laboratory equipment are connected to the local computer system. Each item of electronic laboratory equipment has a physical control panel including one or more displays or controls. A virtual control panel generation unit generates a virtual control panel accessible from a remote computer system. The virtual control panel is substantially similar to the physical control panel in appearance. A command interpretation unit monitors interaction between the remote user and the virtual control panel and generates electronic laboratory equipment commands for exploiting the functionality of the electronic laboratory equipment.

    摘要翻译： 用于虚拟控制电子实验室设备的系统包括本地计算机系统。 电子实验室设备的一个或多个项目连接到本地计算机系统。 电子实验室设备的每个项目都有一个包括一个或多个显示器或控件的物理控制面板。 虚拟控制面板生成单元生成可从远程计算机系统访问的虚拟控制面板。 虚拟控制面板在外观上基本类似于物理控制面板。 命令解释单元监视远程用户和虚拟控制面板之间的交互，并产生用于利用电子实验室设备的功能的电子实验室设备命令。

    On-chip power supply noise detector
    43.
    发明授权
    On-chip power supply noise detector 失效
    片上电源噪声检测器

    公开(公告)号：US07443187B2

    公开(公告)日：2008-10-28

    申请号：US11874528

    申请日：2007-10-18

    申请人： Keith A. Jenkins ,  Anuja Sehgal ,  Peilin Song

    发明人： Keith A. Jenkins ,  Anuja Sehgal ,  Peilin Song

    IPC分类号： G01R31/02

    CPC分类号： G01R31/3004 ,  G01R19/16552

    摘要： Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.

    摘要翻译： 公开了片上检测集成电路电源噪声的技术。 作为示例，用于监视集成电路中的电源线的技术包括以下步骤/操作。 第一信号和第二信号被预处理。 第一信号代表被监测的电源线的电压。 第二信号代表参考电源线的电压。 预处理包括移动电压的各个电平，使得电压在比较器电路的输入电压范围内。 然后，根据比较器电路对预处理的第一信号和预处理的第二信号进行比较。 比较包括检测预处理的第一信号的电压电平与预处理的第二信号的电压电平之间的差异。

    On-Chip Power Supply Noise Detector
    44.
    发明申请
    On-Chip Power Supply Noise Detector 审中-公开
    片上电源噪声检测器

    公开(公告)号：US20080258751A1

    公开(公告)日：2008-10-23

    申请号：US12166847

    申请日：2008-07-02

    申请人： Keith A. Jenkins ,  Anuja Sehgal ,  Peilin Song

    发明人： Keith A. Jenkins ,  Anuja Sehgal ,  Peilin Song

    IPC分类号： G01R31/02

    CPC分类号： G01R31/3004 ,  G01R19/16552

    摘要： Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.

    摘要翻译： 公开了片上检测集成电路电源噪声的技术。 作为示例，用于监视集成电路中的电源线的技术包括以下步骤/操作。 第一信号和第二信号被预处理。 第一信号代表被监测的电源线的电压。 第二信号代表参考电源线的电压。 预处理包括移动电压的各个电平，使得电压在比较器电路的输入电压范围内。 然后，根据比较器电路对预处理的第一信号和预处理的第二信号进行比较。 比较包括检测预处理的第一信号的电压电平与预处理的第二信号的电压电平之间的差异。

    On-chip detection of power supply vulnerabilities
    45.
    发明授权
    On-chip detection of power supply vulnerabilities 有权
    片上检测电源漏洞

    公开(公告)号：US07355435B2

    公开(公告)日：2008-04-08

    申请号：US11056822

    申请日：2005-02-10

    申请人： Frank D. Ferraiolo ,  Anuja Sehgal ,  Peilin Song ,  Michael A. Sperling

    发明人： Frank D. Ferraiolo ,  Anuja Sehgal ,  Peilin Song ,  Michael A. Sperling

    IPC分类号： G01R31/36 ,  G01R31/28 ,  H01L23/58

    CPC分类号： G01R31/30 ,  G01R31/2884 ,  G01R31/3016 ,  G01R31/31721

    摘要： On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.

    摘要翻译： 片上传感器检测电源漏洞。 片内传感器采用敏感延迟链和不敏感延迟链，以检测电源下冲和过冲，而无需外部片外部件。 检测到用户定义的阈值之外的下冲和超调。 下冲和过冲由两个延迟链的相位相对差异表示。 两个延迟链可编程，以检测各种频率。

    On-chip power supply noise detector
    46.
    发明授权
    On-chip power supply noise detector 失效
    片上电源噪声检测器

    公开(公告)号：US07355429B2

    公开(公告)日：2008-04-08

    申请号：US11089215

    申请日：2005-03-24

    申请人： Keith A. Jenkins ,  Anuja Sehgal ,  Peilin Song

    发明人： Keith A. Jenkins ,  Anuja Sehgal ,  Peilin Song

    IPC分类号： G01R31/02

    CPC分类号： G01R31/3004 ,  G01R19/16552

    摘要： Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an output voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.

    摘要翻译： 公开了片上检测集成电路电源噪声的技术。 作为示例，用于监视集成电路中的电源线的技术包括以下步骤/操作。 第一信号和第二信号被预处理。 第一信号代表被监测的电源线的电压。 第二信号代表参考电源线的电压。 预处理包括移动电压的各个电平，使得电压在比较器电路的输出电压范围内。 然后，根据比较器电路对预处理的第一信号和预处理的第二信号进行比较。 比较包括检测预处理的第一信号的电压电平与预处理的第二信号的电压电平之间的差异。

    ENHANCED SIGNAL OBSERVABILITY FOR CIRCUIT ANALYSIS
    47.
    发明申请
    ENHANCED SIGNAL OBSERVABILITY FOR CIRCUIT ANALYSIS 有权
    电路分析的增强信号可视性

    公开(公告)号：US20080079448A1

    公开(公告)日：2008-04-03

    申请号：US11949325

    申请日：2007-12-03

    申请人： Chandler McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan Weger

    发明人： Chandler McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan Weger

    IPC分类号： G01R31/303

    CPC分类号： G01R31/311

    摘要： Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vd, the enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.

    摘要翻译： 公开了利用例如皮秒成像电路分析（PICA）来增强响应于集成电路（IC）内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号，并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vd，相对于强度和能量增强光子发射。 因此，光子发射与噪声更为区别。 在许多实施例中，信标包括晶体管，并且在几个实施例中，信标包括启用和禁用来自信标的光子发射的启用装置。 此外，PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。

    ON-CHIP POWER SUPPLY NOISE DETECTOR
    48.
    发明申请
    ON-CHIP POWER SUPPLY NOISE DETECTOR 失效
    片上电源噪声检测器

    公开(公告)号：US20080036477A1

    公开(公告)日：2008-02-14

    申请号：US11874528

    申请日：2007-10-18

    申请人： Keith Jenkins ,  Anuja Sehgal ,  Peilin Song

    发明人： Keith Jenkins ,  Anuja Sehgal ,  Peilin Song

    IPC分类号： G01R27/08

    CPC分类号： G01R31/3004 ,  G01R19/16552

    摘要： Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.

    摘要翻译： 公开了片上检测集成电路电源噪声的技术。 作为示例，用于监视集成电路中的电源线的技术包括以下步骤/操作。 第一信号和第二信号被预处理。 第一信号代表被监测的电源线的电压。 第二信号代表参考电源线的电压。 预处理包括移动电压的各个电平，使得电压在比较器电路的输入电压范围内。 然后，根据比较器电路对预处理的第一信号和预处理的第二信号进行比较。 比较包括检测预处理的第一信号的电压电平与预处理的第二信号的电压电平之间的差异。