公开(公告)号：US20140301678A1

公开(公告)日：2014-10-09

申请号：US14131589

申请日：2012-07-11

申请人： Tetsuya Katsuta ,  Yasuhiro Mitsui

发明人： Tetsuya Katsuta ,  Yasuhiro Mitsui

IPC分类号： F16C29/00 ,  H04M1/02 ,  F16F3/02

CPC分类号： F16C29/002 ,  F16F3/02 ,  F16F3/023 ,  H04M1/0237

摘要： The present invention relates to a spring unit whose spring constant can be easily changed. The spring unit includes a plurality of wire springs each including a bent part formed in the middle of wire by bending, extending parts extending from the bent part, and end parts formed at ends of the extending parts. The wire springs are arranged side by side, and a deformed part protruding in a direction of arrangement of the wire springs is formed in one or more of the extending parts.

摘要翻译： 本发明涉及弹簧单元，其弹簧常数可以容易地改变。 弹簧单元包括多个线弹簧，每个线弹簧包括通过弯曲形成在电线中间的弯曲部分，从弯曲部分延伸的延伸部分和形成在延伸部分的端部处的端部部分。 线弹簧并排设置，并且在一个或多个延伸部分中形成沿线弹簧布置方向突出的变形部分。

公开(公告)号：US08714822B2

公开(公告)日：2014-05-06

申请号：US13808638

申请日：2011-06-30

申请人： Yasuhiro Mitsui

发明人： Yasuhiro Mitsui

IPC分类号： F16C17/26

CPC分类号： H04M1/0239 ,  E05D15/10 ,  E05F11/44 ,  E05Y2900/606 ,  G06F1/1624 ,  H04M1/0237

摘要： An opening/closing mechanism enabling a first housing and a second housing to open to a so-called fully flat state includes a fixed plate that is fixed to a first housing, a moving plate that is fixed to a second housing, an intermediate member that is slidably coupled to the fixed plate by way of a first slide mechanism, a slide member that is slidably coupled to the intermediate member by way of a second slide mechanism, and a raising/lowering mechanism that raises/lowers the moving plate relative to the slide member.

摘要翻译： 使第一壳体和第二壳体能够打开到所谓的完全平坦状态的打开/关闭机构包括固定到第一壳体的固定板，固定到第二壳体的移动板，中间构件， 通过第一滑动机构可滑动地联接到固定板，通过第二滑动机构可滑动地联接到中间构件的滑动构件，以及使移动板相对于第二滑动机构升高/降低的升降机构 幻灯片成员。

公开(公告)号：US08615848B2

公开(公告)日：2013-12-31

申请号：US13809213

申请日：2011-07-11

申请人： Yasuhiro Mitsui

发明人： Yasuhiro Mitsui

IPC分类号： E05D7/00 ,  E05D3/06

CPC分类号： G06F1/1681 ,  H04M1/022 ,  Y10T16/533 ,  Y10T16/541 ,  Y10T16/547

摘要： A hinge apparatus for an electronic device includes a cam unit and a gear unit provided at a connecting position of an upper plate and a lower plate. The cam unit includes a first cam mechanism for causing a first cam shaft connected to an upper plate to generate a torque and a second cam mechanism for causing a second cam shaft connected to a lower plate to generate a torque. Further, the gear unit includes a first gear shaft connected to the upper plate and a second gear shaft connected to the lower plate, a first gear provided in the first gear shaft, a first gear provided in the second gear shaft, and a gear mechanism that synchronizes and rotates the first gear shaft and the second gear shaft.

摘要翻译： 一种用于电子设备的铰链装置，包括设置在上板和下板的连接位置处的凸轮单元和齿轮单元。 凸轮单元包括：第一凸轮机构，用于使连接到上板的第一凸轮轴产生扭矩;以及第二凸轮机构，用于使连接到下板的第二凸轮轴产生转矩。 此外，齿轮单元包括连接到上板的第一齿轮轴和连接到下板的第二齿轮轴，设置在第一齿轮轴中的第一齿轮，设置在第二齿轮轴中的第一齿轮和齿轮机构 使第一齿轮轴和第二齿轮轴同步旋转。

公开(公告)号：US20130111704A1

公开(公告)日：2013-05-09

申请号：US13809213

申请日：2011-07-11

申请人： Yasuhiro Mitsui

发明人： Yasuhiro Mitsui

IPC分类号： G06F1/16

CPC分类号： G06F1/1681 ,  H04M1/022 ,  Y10T16/533 ,  Y10T16/541 ,  Y10T16/547

摘要： A hinge apparatus for an electronic device includes a cam unit and a gear unit provided at a connecting position of an upper plate and a lower plate. The cam unit includes a first cam mechanism for causing a first cam shaft connected to an upper plate to generate a torque and a second cam mechanism for causing a second cam shaft connected to a lower plate to generate a torque. Further, the gear unit includes a first gear shaft connected to the upper plate and a second gear shaft connected to the lower plate, a first gear provided in the first gear shaft, a first gear provided in the second gear shaft, and a gear mechanism that synchronizes and rotates the first gear shaft and the second gear shaft.

摘要翻译： 一种用于电子设备的铰链装置，包括设置在上板和下板的连接位置处的凸轮单元和齿轮单元。 凸轮单元包括：第一凸轮机构，用于使连接到上板的第一凸轮轴产生扭矩;以及第二凸轮机构，用于使连接到下板的第二凸轮轴产生转矩。 此外，齿轮单元包括连接到上板的第一齿轮轴和连接到下板的第二齿轮轴，设置在第一齿轮轴中的第一齿轮，设置在第二齿轮轴中的第一齿轮和齿轮机构 使第一齿轮轴和第二齿轮轴同步旋转。

公开(公告)号：US20130108196A1

公开(公告)日：2013-05-02

申请号：US13808638

申请日：2011-06-30

申请人： Yasuhiro Mitsui

发明人： Yasuhiro Mitsui

IPC分类号： H04M1/02 ,  E05F11/44 ,  E05D15/10

CPC分类号： H04M1/0239 ,  E05D15/10 ,  E05F11/44 ,  E05Y2900/606 ,  G06F1/1624 ,  H04M1/0237

摘要： The present invention relates to an opening/closing mechanism enabling a first housing and a second housing to open to a so-called fully flat state, and including a fixed plate that is fixed to a first housing, a moving plate that is fixed to a second housing, an intermediate member that is slidably coupled to the fixed plate by way of a first slide mechanism, a slide member that is slidably coupled to the intermediate member by way of a second slide mechanism, and a raising/lowering mechanism that raises/lowers the moving plate relative to the slide member.

摘要翻译： 本发明涉及使第一壳体和第二壳体能够打开到所谓的完全平坦状态的开/关机构，并且包括固定到第一壳体的固定板，固定到第一壳体的移动板 第二壳体，通过第一滑动机构可滑动地联接到固定板的中间构件，通过第二滑动机构可滑动地联接到中间构件的滑动构件和升高/降低机构， 相对于滑动构件降低移动板。

公开(公告)号：US20130077903A1

公开(公告)日：2013-03-28

申请号：US13701901

申请日：2011-06-02

申请人： Yasuhiro Mitsui

发明人： Yasuhiro Mitsui

IPC分类号： H05K5/02

CPC分类号： H05K5/0217 ,  G06F1/1624 ,  G06F1/1679 ,  H04M1/0237

摘要： A slide unit mechanism includes a sliding plate including slide parts and rattle preventing mechanisms that engage the sliding plate to prevent the sliding plate from rattling. Each of the rattle preventing mechanisms includes a recess; an opening positioned on a moving path of the slide part; a locking torsion spring disposed in the recess, one end of which is attached to an engaging part protruding from the opening on the moving path of the slide part; and an engaging recess formed in the slide part and configured to engage the engaging part. When the sliding plate is slid to the open position or the closed position, the engaging part engages the engaging recess and is biased by elastic force of the locking torsion spring toward the engaging recess.

摘要翻译： 滑动单元机构包括滑动板，其包括与滑动板接合的滑动部件和防撞击机构，以防滑板滑动。 每个防拨动机构包括凹槽; 位于所述滑动部的移动路径上的开口; 锁定扭力弹簧设置在所述凹部中，其一端附接到从所述滑动部分的移动路径上的开口突出的接合部分; 以及形成在所述滑动部中并且构造成与所述接合部接合的接合凹部。 当滑板滑动到打开位置或关闭位置时，接合部分接合接合凹部并被锁定扭转弹簧的弹性力朝向接合凹槽偏置。

公开(公告)号：US07553334B2

公开(公告)日：2009-06-30

申请号：US11976238

申请日：2007-10-23

申请人： Eiichi Hazaki ,  Yasuhiro Mitsui ,  Takashi Furukawa ,  Hiroshi Yanagita ,  Susumu Kato ,  Osamu Satou ,  Osamu Yamada ,  Yoshikazu Inada

发明人： Eiichi Hazaki ,  Yasuhiro Mitsui ,  Takashi Furukawa ,  Hiroshi Yanagita ,  Susumu Kato ,  Osamu Satou ,  Osamu Yamada ,  Yoshikazu Inada

IPC分类号： G01N13/10

CPC分类号： G01R31/2891 ,  G01N23/225 ,  G01R31/2887 ,  H01J37/20 ,  H01J37/226 ,  H01J37/28 ,  H01J2237/2007 ,  H01J2237/2008 ,  H01J2237/20221 ,  H01J2237/204 ,  H01J2237/24564 ,  H01J2237/2482

摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.

摘要翻译： 为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量 在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和 探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且第二位置处的测量精度优于 第一名

公开(公告)号：US07470918B2

公开(公告)日：2008-12-30

申请号：US11706356

申请日：2007-02-15

申请人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

发明人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

IPC分类号： H01J37/256 ,  G21N23/225

CPC分类号： H04L29/06 ,  G01N23/225 ,  H01J37/256 ,  H01J37/3056 ,  H01J2237/20 ,  H01J2237/202 ,  H01J2237/31745 ,  H04L67/16 ,  H04L69/329

摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.

公开(公告)号：US07297945B2

公开(公告)日：2007-11-20

申请号：US11002710

申请日：2004-12-03

申请人： Eiichi Hazaki ,  Yasuhiro Mitsui ,  Takashi Furukawa ,  Hiroshi Yanagita ,  Susumu Kato ,  Osamu Satou ,  Osamu Yamada ,  Yoshikazu Inada

发明人： Eiichi Hazaki ,  Yasuhiro Mitsui ,  Takashi Furukawa ,  Hiroshi Yanagita ,  Susumu Kato ,  Osamu Satou ,  Osamu Yamada ,  Yoshikazu Inada

IPC分类号： G01N23/00

CPC分类号： G01R31/2891 ,  G01N23/225 ,  G01R31/2887 ,  H01J37/20 ,  H01J37/226 ,  H01J37/28 ,  H01J2237/2007 ,  H01J2237/2008 ,  H01J2237/20221 ,  H01J2237/204 ,  H01J2237/24564 ,  H01J2237/2482

摘要： For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.

摘要翻译： 为了调整试样与探针之间的位置关系，通过它们之间的接触测量试样的电特性，将保持试样的试样台的基台和保持探针的探针架固定在第一位置，以测量 在第一位置处的探针和样本之间的位置关系，并且随后位于第二位置以测量其在第二位置处的位置关系，使得探针和样本在第二位置彼此接触，样本台和 探针支架能够在基台上在第一和第二位置中的每一个处相对于彼此移动，以调节探针与样本之间的位置关系，并且第二位置处的测量精度优于 第一名

公开(公告)号：US20070158564A1

公开(公告)日：2007-07-12

申请号：US11706356

申请日：2007-02-15

申请人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

发明人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

IPC分类号： G21K7/00

CPC分类号： H04L29/06 ,  G01N23/225 ,  H01J37/256 ,  H01J37/3056 ,  H01J2237/20 ,  H01J2237/202 ,  H01J2237/31745 ,  H04L67/16 ,  H04L69/329

摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.

摘要翻译： 本发明的目的是实现一种用于处理和观察微分样品的方法和装置，其能够以高分辨率，高精度和高产量在水平和垂直方向观察晶片的截面而不分裂任何作为样品的晶片 。 在本发明的装置中，在一个真空容器中包括聚焦离子束光学系统和电子光学系统，并且通过用带电粒子束的成形处理分离包含样品的所需区域的微小样品，并且在那里 被包括用于提取分离的微小样本的操纵器和用于独立于晶片样品台驱动操纵器的操纵器控制器。