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41.发明授权Method and apparatus for diagnosing broken scan chain based on leakage light emission 失效基于泄漏光发射诊断断层扫描链的方法和装置公开(公告)号：US07788058B2
公开(公告)日：2010-08-31
申请号：US12115768
申请日：2008-05-06
申请人： Peilin Song , Tian Xia , Alan J. Weger , Franco Stellari , Stanislav V. Polonsky
发明人： Peilin Song , Tian Xia , Alan J. Weger , Franco Stellari , Stanislav V. Polonsky
IPC分类号： G06F19/00
CPC分类号： G01R31/318538 , G01R31/311
摘要： A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.
摘要翻译： 提供了一种基于泄漏光发射来诊断断层扫描链的机构。 图像捕获机构检测互补金属氧化物半导体（CMOS）器件中的泄漏电流的发光。 诊断机制识别具有意外发光的设备。 意外的发光量可能表明当它应该被打开时晶体管被关闭，反之亦然。 可以测试所有可能的输入以确定锁存器中的晶体管或时钟缓冲器中的晶体管是否存在问题。 然后可以基于意外光发射的位置来确定扫描链中的断点。
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42.发明授权System and method for estimation of integrated circuit signal characteristics using optical measurements 有权使用光学测量估计集成电路信号特性的系统和方法公开(公告)号：US07612571B2
公开(公告)日：2009-11-03
申请号：US12115658
申请日：2008-05-06
申请人： Franco Stellari , Alberto Tosi , Peilin Song
发明人： Franco Stellari , Alberto Tosi , Peilin Song
IPC分类号： G01R31/00
CPC分类号： G01R31/311 , Y10T29/49004
摘要： Systems and methods for making electrical measurements using optical emissions include positioning a sensor/photodetector to measure radiation emissions from devices to be tested. Radiation emission information is collected from the device to be tested during electrical operation. Characteristic features of the radiation emission information are determined, and differences between the characteristic features are deciphered. Based on the differences, models are employed to determine electrical properties of the device, especially operational characteristics.
摘要翻译： 使用光学发射进行电气测量的系统和方法包括定位传感器/光电检测器以测量待测装置的辐射发射。 在电气操作期间，从要测试的设备收集辐射发射信息。 确定辐射发射信息的特征，特征特征之间的差异被解密。 基于差异，使用模型来确定装置的电气特性，特别是操作特性。
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公开(公告)号：US07446550B2
公开(公告)日：2008-11-04
申请号：US11949325
申请日：2007-12-03
IPC分类号： G01R31/02
CPC分类号： G01R31/311
摘要： Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vdd, to enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.
摘要翻译： 公开了利用例如皮秒成像电路分析（PICA）来增强响应于集成电路（IC）内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号，并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vdd，以增强相对于强度和能量的光子发射。 因此，光子发射与噪声更为区别。 在许多实施例中，信标包括晶体管，并且在几个实施例中，信标包括启用和禁用来自信标的光子发射的启用装置。 此外，PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。
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公开(公告)号：US20060208753A1
公开(公告)日：2006-09-21
申请号：US11085734
申请日：2005-03-21
申请人： Alberto Tosi , Franco Stellari , Peilin Song
发明人： Alberto Tosi , Franco Stellari , Peilin Song
CPC分类号： G01R31/311 , G01R1/0408 , H01L25/16 , H01L2224/16225 , H01L2224/48091 , H01L2224/48227 , H01L2924/00011 , H01L2924/00014 , H01L2924/3011 , H01L2224/0401
摘要： Apparatus and methods are provided for packaging IC (integrated circuit) chips to enable both optical access to the back side of an IC chip and electrical access to the front side of the IC chip.
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45.发明申请公开(公告)号：US20060168793A1
公开(公告)日：2006-08-03
申请号：US11049324
申请日：2005-02-02
申请人： Franco Stellari , Alberto Tosi , Peilin Song
发明人： Franco Stellari , Alberto Tosi , Peilin Song
IPC分类号： G01R31/28
CPC分类号： G01R31/311 , Y10T29/49004
摘要： Systems and methods for making electrical measurements using optical emissions include positioning a sensor/photodetector to measure radiation emissions from devices to be tested. Radiation emission information is collected from the device to be tested during electrical operation. Characteristic features of the radiation emission information are determined, and differences between the characteristic features are deciphered. Based on the differences, models are employed to determine electrical properties of the device, especially operational characteristics.
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公开(公告)号：US20060028219A1
公开(公告)日：2006-02-09
申请号：US10912493
申请日：2004-08-05
CPC分类号： G01R31/311
摘要： Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vdd, to enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.
摘要翻译： 公开了利用例如皮秒成像电路分析（PICA）来增强响应于集成电路（IC）内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号，并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vdd，以增强相对于强度和能量的光子发射。 因此，光子发射与噪声更为区别。 在许多实施例中，信标包括晶体管，并且在几个实施例中，信标包括启用和禁用来自信标的光子发射的启用装置。 此外，PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。
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公开(公告)号：US20100050104A1
公开(公告)日：2010-02-25
申请号：US12195252
申请日：2008-08-20
申请人： Franco Stellari
发明人： Franco Stellari
CPC分类号： G06F9/4411 , G06F13/385 , G06F2213/0052
摘要： A method for automatic instrument address recognition includes requesting a list of instruments attached to a bus, collecting the list of instruments, querying each listed instrument for an identification string, comparing the identification string of each instrument to a matching pattern, and determining a match of the identification string with an instrument of interest, and selecting an address of the instrument having the identification string matching the matching pattern and returning the address for controlling the instrument of interest.
摘要翻译： 一种用于自动仪器地址识别的方法包括：请求附接到总线的仪器的列表，收集仪器列表，查询每个列出的仪器的识别串，将每个仪器的识别串与匹配模式进行比较，以及确定 所述识别字符串与感兴趣的工具相关，并且选择具有与匹配模式匹配的识别字符串的仪器的地址，并返回用于控制感兴趣的仪器的地址。
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公开(公告)号：US09229044B2
公开(公告)日：2016-01-05
申请号：US13463166
申请日：2012-05-03
IPC分类号： H03K19/00 , G01R31/26 , H03K19/094 , H03K19/14
CPC分类号： H04N17/002 , G01J1/44 , G01J11/00 , G01J2001/4238 , G01R31/26 , H03K19/094 , H03K19/14
摘要： PICA test methods are shown that includes forming semiconductor devices having proximal light emitting regions, such that the light emitting regions are grouped into distinct shapes separated by a distance governed by a target resolution size; forming logic circuits to control the semiconductor devices; activating the one or more semiconductor devices by providing an input signal; and suppressing light emissions from one or more of the activated semiconductor devices by providing one or more select signals to the logic circuits.
摘要翻译： 示出了PICA测试方法，其包括形成具有近端发光区域的半导体器件，使得发光区域被分组成由目标分辨率尺寸所控制的距离分开的不同形状; 形成逻辑电路以控制半导体器件; 通过提供输入信号来激活所述一个或多个半导体器件; 并且通过向逻辑电路提供一个或多个选择信号来抑制来自一个或多个激活的半导体器件的光发射。
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公开(公告)号：US08750595B2
公开(公告)日：2014-06-10
申请号：US12898867
申请日：2010-10-06
申请人： Franco Stellari
发明人： Franco Stellari
IPC分类号： G06K9/00
CPC分类号： G06T3/0081 , G06T7/30 , G06T2207/10056 , G06T2207/30148
摘要： A system and method for registering a layout to a measured image includes generating a predictive reference image from a layout design or portion thereof. The predictive reference image is correlated to a measured image obtained from a device having a corresponding structure for the layout design or the portion thereof. A best match transformation is computed between the predictive reference image and the measured image. The layout design or portion thereof is correlated with the measured image based upon the best match transformation.
摘要翻译： 用于将布局注册到测量图像的系统和方法包括从布局设计或其部分生成预测参考图像。 预测参考图像与从具有用于布局设计或其部分的相应结构的设备获得的测量图像相关。 在预测参考图像和测量图像之间计算最佳匹配变换。 基于最佳匹配变换，布局设计或其部分与测量图像相关。
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公开(公告)号：US20130280828A1
公开(公告)日：2013-10-24
申请号：US13463166
申请日：2012-05-03
IPC分类号： H01L21/66
CPC分类号： H04N17/002 , G01J1/44 , G01J11/00 , G01J2001/4238 , G01R31/26 , H03K19/094 , H03K19/14
摘要： PICA test methods are shown that includes forming semiconductor devices having proximal light emitting regions, such that the light emitting regions are grouped into distinct shapes separated by a distance governed by a target resolution size; forming logic circuits to control the semiconductor devices; activating the one or more semiconductor devices by providing an input signal; and suppressing light emissions from one or more of the activated semiconductor devices by providing one or more select signals to the logic circuits.
摘要翻译： 示出了PICA测试方法，其包括形成具有近端发光区域的半导体器件，使得发光区域被分组成由目标分辨率尺寸所控制的距离分开的不同形状; 形成逻辑电路以控制半导体器件; 通过提供输入信号来激活所述一个或多个半导体器件; 并且通过向逻辑电路提供一个或多个选择信号来抑制来自一个或多个激活的半导体器件的光发射。
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