摘要:
A compressor (20) is provided with compression mechanisms (61, 62) to have four compression chambers (61, 62, 63, 64) in total. In the compressor (20), the first compression chamber (61) and the second compression chamber (62) differ in the phase of capacity changing cycle from each other by 180° and the third compression chamber (63) and the fourth compression chamber (64) also differ in the phase of capacity changing cycle from each other by 180°. In a cylinder nonoperating mode, refrigerant is compressed in a single stage in each of the first compression chamber (61) and the second compression chamber (62) while the refrigerant compression operation is halted in the third compression chamber (63) and the fourth compression chamber (64). In a two-stage compression mode, refrigerant compressed in a single stage in each of the first compression chamber (61) and the second compression chamber (62) is further compressed in the third compression chamber (63) and the fourth compression chamber (64).
摘要:
There is provided a small-type semiconductor integrated circuit whose circuit area is small and whose wiring length is short. The semiconductor integrated circuit is constructed in a multi-layer structure and is provided with a first semiconductor layer, a first semiconductor layer transistor formed in the first semiconductor layer, a wiring layer which is deposited on the first semiconductor layer and in which metal wires are formed, a second semiconductor layer deposited on the wiring layer and a second semiconductor layer transistor formed in the second semiconductor layer. It is noted that insulation of a gate insulating film of the first semiconductor layer transistor is almost equal with that of a gate insulating film of the second semiconductor layer transistor and the gate insulating film of the second semiconductor layer transistor is formed by means of radical oxidation or radical nitridation.
摘要:
A spray nozzle, with which the position at which the spray fluid strikes a target does not change, includes an ejection port elongated from side to side, a flow path formed cylindrical between a supply port and the ejection port, the flow path having a taper section formed at the middle thereof to reduce the flow path cross-sectional area gradually toward the ejection port. The taper section has upper and lower apex ends at an end portion on the ejection port side that are offset with respect to each other in the direction of the axis of the flow path.
摘要:
A testing device for testing an electronic device is provided. The testing device includes: a deterministic jitter application unit for applying deterministic jitter to a given input signal without causing an amplitude modulation component and supplying the input signal with the deterministic jitter to the electronic device; a jitter amount controller for controlling the magnitude of the deterministic jitter generated by the deterministic jitter application unit; and a determination unit for determining whether or not the electronic device is defective based on an output signal output from the electronic device in accordance with the input signal.
摘要:
A surface modifying jig of an engine valve comprising a substantially circular ring portion for holding the valve head of an engine valve, a head holding portion having a diameter decreasing gradually downward from the inner circumferential side of the ring portion, and a stem holding portion formed below the head holding portion with a substantially constant diameter. When plasma nitriding is performed, the valve head comes into annular line contact with the ring portion and being held by the head holding portion while kept in annular plane contact therewith, and a valve stem is held by the stem holding portion while kept in annular plane contact therewith.
摘要:
There is provided a high-performance semiconductor integrated circuit whose circuit area is small and whose wiring length is short. The semiconductor integrated circuit is constructed in a multi-layer structure and is provided with a switch block for switching connections among a plurality of signal lines by means of a plurality of transistors formed respectively in a plurality of semiconductor layers and a plurality of logic blocks formed in each of the plurality of semiconductor layers and connected to each of the plurality of signal lines. The first switch block is a programmable switch block capable of changing the connection topology among the plurality of signal lines.
摘要:
A testing apparatus for testing an electronic device, includes a deterministic jitter applying means for applying deterministic jitter to a given input signal without any amplitude variation component occurring and supplying the input signal applied with the deterministic jitter to the electronic device, a jitter amount controlling means for controlling magnitude of the deterministic jitter to be applied by the deterministic jitter applying means and a judging means for judging quality of the electronic device based on an output signal outputted by the electronic device in response to the input signal.
摘要:
Timing jitter sequences Δφj[n] and Δφk[n] of respective clock signals under measurement xj(t) and xk(t) are estimated, and a timing difference sequence between those timing jitter sequences is calculated. In addition, initial phase angles φ0j and φ0k of linear instantaneous phases of the xj(t) and xk(t) are estimated, respectively. A sum of a difference between those initial angles and the timing difference sequence is calculated to obtain a clock skew sequence between the xj(t) and xk(t).
摘要:
There is provided a scaling operator for calculating a quotient in a first residue format obtained by dividing an input number in the first residue format by a second modulus in a residue number system for representing numbers by the first residue format of a set of residues obtained with respect to first modulus and residues obtained with respect to second modulus, having a subtracter for outputting inter-moduli values of difference which are values of difference between the residues obtained with respect to the first modulus and the residues obtained with respect to the second modulus and a quotient outputting section for outputting a set of residues of the quotient obtained with respect to the first modulus and residues of the quotient obtained with respect to the second modulus as the quotient based on the inter-moduli values of difference.