摘要:
A device for delivering a medicament to a patient in need thereof includes: (a) an injector including a first end configured to remain outside a nasal passage of the patient and a second end configured for entry into the nasal passage of the patient, wherein the injector is moveable between a storage position and an engaging position; and (b) an introducer configured for engagement with a nostril of the patient, wherein the introducer includes a passageway configured for slidably receiving the injector, and wherein the introducer includes a curvature along a portion thereof adjacent to the passageway. Methods for ameliorating pain in a patient include (a) introducing the injector through the nasal passage of the patient into a region substantially medial and/or posterior and/or inferior to a sphenopalatine ganglion of the patient; and (b) delivering a medicament from the injector superiorly and/or laterally and/or anteriorly towards the sphenopalatine ganglion.
摘要:
A semiconductor die including a semiconductor chip and a test structure, located in a scribe area, is designed and manufactured. The test structure includes an array of complementary metal oxide semiconductor (CMOS) image sensors that are of the same type as CMOS image sensors employed in another array in the semiconductor chip and having a larger array size. Such a test structure is provided in a design phase by providing a design structure in which the orientations of the CMOS image sensors match between the two arrays. The test structure provides effective and accurate monitoring of manufacturing processes through in-line testing before a final test on the semiconductor chip.
摘要:
A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.
摘要:
A programmable jitter signal generator is provided that includes a jitter distribution control unit, a selection unit in signal communication with the jitter distribution control unit, and a delay unit in signal communication with the selection unit; and a corresponding method of generating a programmable jitter signal includes programming a control unit, receiving a reference signal, delaying the received reference signal by a multiple of a base time increment, and selecting a delayed reference signal delayed by a desired multiple of the base time increment in accordance with the programmed control unit.