摘要:
The present disclosure relates to methods of manufacturing vehicle frame assemblies. Some of the disclosed methods include forming a key and receptor arrangement between an interconnecting member, having a first material composition, and a cross-member, having a second material composition; attaching the interconnecting member and cross-member via the key and receptor arrangement at one location; inserting the interconnecting member and cross-member in a side rail; and welding the interconnecting member to the side rail at another location.
摘要:
The present disclosure relates to various vehicle frame assemblies and methods of manufacturing the same. The vehicle frame assemblies have rails composed of dissimilar materials.
摘要:
Methods and apparatus for processing of GNSS data derived from multi-frequency code and carrier observations are presented which make available correction data for use by a rover located within the region, the correction data comprising: the ionospheric delay over the region, the tropospheric delay over the region, the phase-leveled geometric correction per satellite, and the at least one code bias per satellite. In some embodiments the correction data includes an ionospheric phase bias per satellite. Methods and apparatus for determining a precise position of a rover located within a region are presented in which a GNSS receiver is operated to obtain multi-frequency code and carrier observations and correction data, to create rover corrections from the correction data, and to determine a precise rover position using the rover observations and the rover corrections. The correction data comprises at least one code bias per satellite, a fixed-nature MW bias per satellite and/or values from which a fixed-nature MW bias per satellite is derivable, and an ionospheric delay per satellite for each of multiple regional network stations and/or non-ionospheric corrections. Methods and apparatus for encoding and decoding the correction messages containing correction data are also presented, in which network messages include network elements related to substantially all stations of the network and cluster messages include cluster elements related to subsets of the network.
摘要:
A photomask assembly and method for protecting the photomask assembly from contaminants generated during a lithography process are disclosed. A photomask assembly includes a pellicle assembly formed from a pellicle frame and a pellicle film coupled to a first surface of the pellicle frame. The pellicle frame further includes an inner wall and an outer wall. A photomask is coupled to a second surface of the pellicle frame opposite the pellicle film. A molecular sieve that prevents airborne molecular contaminants (AMCs) generated during a lithography process from contaminating the photomask is associated with the pellicle assembly.
摘要:
A method and apparatus evaluates the runability of a photomask inspection tool that inspects plural sets of die, each die having a standard simulated industrial device feature at plural technology nodes. A technology node size is determined for each feature at which inspection by the tool provides no false detection of faults. A sensitivity module included on a photomask test plate along with a runability module allows determination of inspection tool sensitivity and runability in a single test sequence.
摘要:
FIG. 1 is a perspective view of an LED flashlight, showing my new design; FIG. 2 is another perspective view thereof; FIG. 3 is a front view thereof; FIG. 4 is a rear view thereof; FIG. 5 is a left side side view thereof; FIG. 6 is a right side view thereof; FIG. 7 is a top plan view thereof; and, FIG. 8 is a bottom plan view thereof. The broken lines depict portions of the LED flashlight that form no part of the claimed design.
摘要:
A rapid and automatic virus imaging and analysis system includes (i) electron optical sub-systems (EOSs), each of which has a large field of view (FOV) and is capable of instant magnification switching for rapidly scanning a virus sample; (ii) sample management sub-systems (SMSs), each of which automatically loads virus samples into one of the EOSs for virus sample scanning and then unloads the virus samples from the EOS after the virus sample scanning is completed; (iii) virus detection and classification sub-systems (VDCSs), each of which automatically detects and classifies a virus based on images from the EOS virus sample scanning; and (iv) a cloud-based collaboration sub-system for analyzing the virus sample scanning images, storing images from the EOS virus sample scanning, and storing and analyzing machine data associated with the EOSs, the SMSs, and the VDCSs.
摘要:
The present invention provides an apparatus of charged-particle beam e.g. an electron microscope comprising an in-column plasma generator for selectively cleaning BSE detector and BF/DF detector. The plasma generator is located between a lower pole piece of objective lens and the BF/DF detectors, but outside trajectory area of the charged-particles from the sample stage to the BF/DF detector.
摘要:
The present invention provides a driving system comprising two actuators for moving a stage through two elastic connectors; and a general apparatus/device comprising such a driving system, such as a machine tool, an analytical instrument, an optical microscope, and an apparatus of charged-particle beam such as electron microscope and an electron beam lithographical apparatus. When used in an electron microscope, the stage can be used as a specimen stage or a plate having apertures for electron beam to pass through. The novel stage driving system exhibits numerous technical merits such as simpler structure, better manufacturability, improved cost-effectiveness, and higher reliability, among others.
摘要:
The present invention provides a digital high-resolution detector for detecting X-ray, UV light or charged particles. In various embodiments, the digital detector comprises an array of CMOS or CCD pixels and a layer of conversion material on top of the array designed for converting incident X-ray, UV light or charged particles into photons for CMOS or CCD sensors to capture. The thin and high-resolution detector of the invention is particularly useful for monitoring and aligning beams in, and optimizing system performance of, an apparatus of charged-particle beam e.g. an electron microscope.