Abstract:
A driving circuit comprising a low-voltage power supply line, a MOS transistor having a gate terminal and a drain terminal connected to a load and a control stage connected to the power supply line and to the gate terminal of the MOS transistor. In order to allow the MOS transistor to be switched on even when the voltage of the power supply line is lower than the threshold voltage of the MOS transistor, the driving circuit comprises a bipolar transistor connected in parallel to the MOS transistor and a voltage multiplier circuit connected between a common terminal of the MOS and bipolar transistors and the control stage. The control stage comprises comparators adapted to initially switch on the bipolar transistor so as to feed the multiplier circuit, which is thus capable of generating a voltage higher than the available supply voltage, and to subsequently switch off the bipolar transistor and switch on the MOS transistor when the voltage generated by the voltage multiplier has reached at least the threshold voltage of the MOS transistor.
Abstract:
The method consists of subjecting the semiconductor chips to chemical treatment with a silanizing agent immediately before testing to prevent superficial electrical discharges which can reduce the testing voltage which can be applied.
Abstract:
An integrated, low-pass filter of the first order made using the switched capacitors technique utilizes advantageously a single switched capacitor and only two switches in contrast to the filters of the prior art which utilize two switched capacitors and four switches. The filter of the invention requires a smaller integration area and moreover exhibits a greater precision of its DC gain.
Abstract:
A circuit for limiting the transient overvoltage across a power transistor connected in series with an inductive load between a supply rail and a ground rail of the circuit and operated to switch ON-OFF the inductive load utilizes a comparator circuit for switching-ON again the power transistor in order to discharge the energy stored in the load's inductance. The voltage across the power transistor is sensed by a first voltage divider, while a reference voltage is obtained by a second voltage divider connected between the supply and ground. The circuit is practically insensitive to temperature and to variations of the supply voltage and is easily implemented.
Abstract:
A non-volatile memory cell of the type which includes at least one floating gate transistor and which is realized over a semiconductor substrate includes a source region, and a drain region, separated by a channel region which is overlaid by a thin layer of gate oxide. The gate oxide isolates a floating gate region from the substrate. The floating gate region is coupled to a control gate terminal. The floating gate region of the memory cell develops a first potential barrier between the semiconductor substrate and the gate oxide layer, and a second different potential barrier between the floating gate region and the gate oxide.
Abstract:
Programming and reading management architecture, particularly for test purposes, for memory devices of the non-volatile type, comprising at least two memory half-matrices, a bidirectional internal bus for the transmission of data to and from the memory half-matrices, a programming unit for each one of the at least two memory half-matrices, and a data sensing unit. The programming units are adapted to program the at least two memory half-matrices and the data sensing unit and the programming units communicate with the bidirectional internal bus to reroute onto the bus reading data and programming data of the at least two memory half-matrices.
Abstract:
The invention relates to a row decoding circuit for an electrically programmable and erasable semiconductor non-volatile storage device of the type which includes a matrix of memory cells laid out as cell rows and columns and is divided into sectors, said circuit being input row decode signals and supply voltages in order to drive an output stage incorporating a complementary pair of high-voltage MOS transistors of the pull-up and pull-down type, respectively, which are connected to form an output terminal connected to the rows of one sector of the matrix, characterized in that a MOS transistor of the P-channel depletion type with enhanced gate oxide is provided between the output terminal and the pull-down transistor. The control terminal of the depletion transistor forms a further input of the circuit.
Abstract:
A high-speed bipolar-to-CMOS logic converter circuit, including an input stage, including a differential amplifier meant to be connected to a bipolar-logic circuit portion and to be supplied by the supply voltage of the bipolar-logic portion, and an output stage, which is supplied by the voltage of a CMOS-logic circuit portion, a dynamic level shifting circuit interposed between the input stage and the output stage, the output stage being connected to the CMOS-logic circuit portion.
Abstract:
A semiconductor integrated, storage circuit device having at least a first enable terminal for enabling the device, and a first number of address terminals for inputting an external address formed of a corresponding first number of bits. The device comprises a plurality of data storage elements which are addressable by an internal address formed of a second number of bits larger than said first number, and further comprises address storage elements which are coupleable with their inputs to the first enable terminal for storing additional address bits. Thus, the internal address is comprised of the external address and the additional address bits.
Abstract:
A gain modulated sense amplifier, particularly for memory devices, that comprises a virtual ground latch structure which has two output nodes and which includes equalization transistor of a first polarity which equalizes the two output nodes and is connected between a first branch and a second branch, in which the output nodes are arranged; the equalization transistor is driven by an equalization signal whose slope can be modulated as a function of conductivity of a memory cell of the memory device.