SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

    公开(公告)号:US20240128349A1

    公开(公告)日:2024-04-18

    申请号:US18453336

    申请日:2023-08-22

    摘要: Provided is a semiconductor device including: a drift region of a first conductivity type provided in a semiconductor substrate; a collector region of a second conductivity type provided on a back surface of the semiconductor substrate; a cathode region of the first conductivity type provided on the back surface of the semiconductor substrate and having a higher doping concentration than the drift region; a plurality of trench portions provided on a front surface of the semiconductor substrate; and a lifetime control portion provided in the semiconductor substrate and containing a lifetime killer, in which the lifetime control portion includes: a main region provided in a diode portion; and a decay region provided to extend from the main region in a direction parallel to the front surface of the semiconductor substrate and having a lifetime killer concentration that has decayed more than a lifetime killer concentration of the main region.

    SEMICONDUCTOR MODULE
    53.
    发明公开

    公开(公告)号:US20240120249A1

    公开(公告)日:2024-04-11

    申请号:US18457987

    申请日:2023-08-29

    发明人: Hayato NAKANO

    摘要: [Problem] An object of the present invention is to provide a semiconductor module capable of preventing a wire wiring from being broken because of a crack having occurred in sealing resin.
    [Solution] A semiconductor module 1 includes semiconductor chips 14a to 14d, sealing resin 18 configured to seal the semiconductor chips 14a to 14d, a case 11 including a casting area 117u, first portions 111 and 112, and second portions 113 and 114, wire wirings 101a to 101j and 102a to 102i sealed in the sealing resin 18 while being located closer to the first portion 111 and connected to the semiconductor chips 14a to 14d, and recessed portions 131a, 131b, 132a, and 132b formed on the second portions 113 and 114 between a virtual surface VSu and the first portion 112.

    Power converter
    54.
    发明授权

    公开(公告)号:US11949338B2

    公开(公告)日:2024-04-02

    申请号:US17652162

    申请日:2022-02-23

    IPC分类号: H02M3/335 H02M1/32 H02M7/00

    摘要: A power converter includes a positive busbar electrically connected to a positive terminal and the first capacitor electrode, and includes a negative busbar electrically connected to a negative terminal and the second capacitor electrode. The power converter includes output busbars each electrically connected to a given output terminal among multiple output terminals, a given high-side switching element among a plurality of high-side switching elements, and a given low-side switching element among a plurality of low-side switching elements. The power converter includes a cooler that cools the high-side switching elements and the low-side switching elements. The power converter includes a housing that accommodates a supply tube and a discharge tube. The positive terminal, the negative terminal, the output terminals, the inlet port, and the outlet port are exposed on the housing. The inlet port, the outlet port, the supply tube, and the discharge tube are separate members from the housing.

    Vertical MOSFET having trench gate structure containing silicon carbide

    公开(公告)号:US11948976B2

    公开(公告)日:2024-04-02

    申请号:US17514673

    申请日:2021-10-29

    摘要: A vertical metal oxide semiconductor field effect transistor, including a starting substrate of a first conductivity type, a second first-conductivity-type epitaxial layer provided on a first surface of the starting substrate via a first first-conductivity-type epitaxial layer, a first semiconductor region of the first conductivity type provided as a portion of the second first-conductivity-type epitaxial layer, a second-conductivity-type epitaxial layer forming a pn junction interface with the second first-conductivity-type epitaxial layer and supplying a minority carrier to the second first-conductivity-type epitaxial layer, a plurality of second semiconductor regions of the first conductivity type selectively provided in the second-conductivity-type epitaxial layer, a plurality of trenches penetrating through the second semiconductor regions and the second-conductivity-type epitaxial layer, and a plurality of gate electrodes provided in the trenches via gate insulating films. A lifetime of the minority carrier of the first semiconductor region is shorter than that of the rest of the second first-conductivity-type epitaxial layer.

    SEMICONDUCTOR MODULE
    56.
    发明公开

    公开(公告)号:US20240097556A1

    公开(公告)日:2024-03-21

    申请号:US18236984

    申请日:2023-08-23

    发明人: Isao KAKEBE

    IPC分类号: H02M1/088 H02M1/00 H02M1/32

    摘要: An object of the present disclosure is to provide a semiconductor module capable of reducing variation in drive characteristics of each of plural semiconductor switching elements. A semiconductor module includes IGBTs configured to supply power to a load and gate driver circuits in which drive targets are set in a one-to-one relationship to the IGBTs and in which according to a positional relationship to, for example, the IGBT as the drive target, a driving capability of the gate driver circuit to drive the IGBT is set.

    SEMICONDUCTOR DEVICE
    57.
    发明公开

    公开(公告)号:US20240097025A1

    公开(公告)日:2024-03-21

    申请号:US18521509

    申请日:2023-11-28

    发明人: Akimasa KINOSHITA

    摘要: N+-type source regions, low-concentration regions, and p++-type contact regions are each selectively provided in surface regions of a semiconductor substrate, at a front surface thereof, and are in contact with a source electrode. The n+-type source regions and the low-concentration regions are in contact with a gate insulating film at sidewalls of a trench and are adjacent to channel portions of a p-type base region, in a depth direction. The p++-type contact regions are disposed apart from the trench. In surface regions of an epitaxial layer constituting the p-type base region, portions left free of the n+-type source regions and the p++-type contact regions configure the low-concentration regions of an n−-type or a p−-type. The low-concentration regions are disposed periodically along the trench, between the trench and the p++-type contact regions. By the described structure, short-circuit withstand capability may be increased without increasing the number of processes.

    Assembly jig set and manufacturing method of semiconductor module

    公开(公告)号:US11935774B2

    公开(公告)日:2024-03-19

    申请号:US17751617

    申请日:2022-05-23

    IPC分类号: H01L21/67 H01L21/68

    CPC分类号: H01L21/68

    摘要: Provided is an assembly jig set of semiconductor module having a plurality of semiconductor chips, the assembly jig set comprising: a first outer frame jig; and a plurality of inner piece jigs positioned by the first outer frame jig and each having a sectioned shape corresponding to the first outer frame jig, wherein one of the inner piece jigs has a plurality of opening portions for positioning the semiconductor chips. A manufacturing method of a semiconductor module using an assembly jig set is provided.

    SEMICONDUCTOR DEVICE
    59.
    发明公开

    公开(公告)号:US20240088221A1

    公开(公告)日:2024-03-14

    申请号:US18513685

    申请日:2023-11-20

    发明人: Kaname MITSUZUKA

    摘要: A semiconductor device includes: a gate trench portion provided in a semiconductor substrate; a first trench portion provided in the semiconductor substrate and adjacent to the gate trench portion; an emitter region of a first conductivity type provided to be in contact with the gate trench portion in a mesa portion between the gate trench portion and the first trench portion; a contact region of a second conductivity type provided to be in contact with the first trench portion in the mesa portion; a metal layer provided above the semiconductor substrate; and a resistance portion of the first conductivity type provided to be in contact with the metal layer and the emitter region and having a lower doping concentration than that of the emitter region.