摘要:
Provided are methods of forming patterns of semiconductor devices, whereby patterns having various widths may be simultaneously formed, and a pattern density may be doubled by a double patterning process in a portion of the semiconductor device. A dual mask layer is formed on a substrate. A variable mask layer is formed on the dual mask layer. A first photoresist pattern having a first thickness and a first width in the first region, and a second photoresist pattern having a second thickness greater than the first thickness and a second width wider than the first width in the second region are formed on the variable mask layer. A first mask pattern and a first variable mask pattern are formed in the first region, and a second mask pattern and a second variable mask pattern are formed in the second region, by sequentially etching the variable mask layer and the dual mask layer by using, as etch masks, the first photoresist pattern and the second photoresist pattern. First spacers covering side walls of the first mask pattern and second spacers covering side walls of the second mask pattern are formed. The first mask pattern is removed, and then the substrate is etched in the first region and the second region by using the first spacers as an etch mask in the first region, and the second mask pattern and the second spacers as an etch mask in the second region.
摘要:
A mask pattern for semiconductor device fabrication comprises a resist pattern formed on a semiconductor substrate, and an interpolymer complex film formed on the resist pattern, wherein the interpolymer complex film includes a network formed by a hydrogen bond between a proton donor polymer and a proton acceptor polymer.
摘要:
Provided herein are gettering members that include a monitor substrate and a conditioning layer thereon. Also provided herein are methods of forming gettering layers and methods of performing immersion lithography processes using the same.
摘要:
Provided are a mask pattern including a self-assembled molecular layer, a method of forming the same, and a method of fabricating a semiconductor device. The mask pattern includes a resist pattern formed on a semiconductor substrate and the self-assembled molecular layer formed on at least a sidewall of the resist pattern. To form the mask pattern, first, the resist pattern is formed with openings on an underlayer covering the substrate to expose the underlayer to a first width. Then, the self-assembled molecular layer is selectively formed on a surface of the resist pattern to expose the underlayer to a second width smaller than the first width. The underlayer is etched using the resist pattern and the self-assembled molecular layer as an etching mask to obtain a fine pattern.
摘要:
A display system comprising a video signal supplier supplying a video signal with a first video signal standard comprising a predetermined sync signal and a data range; a display apparatus supporting one of the first video signal standard and a second video signal standard comprising a sync signal and a data range which are at least being partially different to the first video signal standard and a data range being equal to the first video signal standard and outputting the video signal from the video signal supplier; a selector selecting the display apparatus supporting one of the first video signal standard and the second video signal standard; and a sync signal converter receiving a sync signal in the video signal from the video signal supplier according to a selection of the selector and converts the received sync signal into either the first video signal standard or the second video signal standard, which the selected display apparatus supports, to output the selected display apparatus. With this configuration, the present invention provides a display system which can alternatively select a video signal of one of a first video signal standard and a second video signal standard, which have a different sync signal standard, to output according to a selection of a user and a method of converting a sync signal thereof.