DRAM ARRAY ARCHITECTURE WITH ROW HAMMER STRESS MITIGATION

    公开(公告)号:US20200349999A1

    公开(公告)日:2020-11-05

    申请号:US16399283

    申请日:2019-04-30

    Abstract: An apparatus includes a plurality of main word line circuits. Each main word line circuit drives a respective global word line to one of an active state value, an intermediate voltage state, or a pre-charge state. The intermediate voltage state voltage is below the active state voltage and above the pre-charge state voltage. The memory device also includes a plurality of sub-word line drivers. Each sub-word line driver is connected to a corresponding global word line and configured to drive a respective local word line between the corresponding global word line voltage and a low voltage value. The apparatus further includes a plurality of phase drivers. Each phase driver is connected to a predetermined number of sub-word line drivers, where each of the predetermined number of sub-word line drivers connects to a different global word line.

    MAIN WORD LINE DRIVER CIRCUIT
    52.
    发明申请

    公开(公告)号:US20200349998A1

    公开(公告)日:2020-11-05

    申请号:US16399235

    申请日:2019-04-30

    Abstract: A main word line circuit provides a first and second row factor signals. The main word line circuit includes a pull-up circuit to drive a global word line to follow a first decoded address signal when the first row factor signal is at a first value. The main word line circuit includes an intermediate voltage circuit to drive the global word line to follow a value of the second row factor signal. A processing device drives the global word line to an active state by setting the first row factor signal to the first value when the first decoded address signal is at a high state, and drives the global word line to follow a value of the second row factor signal by setting the first row factor signal to the second value while the first decoded address signal is at the high state.

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