公开(公告)号：US07704936B2

公开(公告)日：2010-04-27

申请号：US11424369

申请日：2006-06-15

申请人： Katsuyuki Iijima ,  Tetsuo Suzuki

发明人： Katsuyuki Iijima ,  Tetsuo Suzuki

IPC分类号： C11D7/06

CPC分类号： C23G1/22 ,  C23G1/00 ,  C23G1/12

摘要： A remover contains an alkaline component, a bivalent zinc ion, a ferric ion, a chelating agent, and a nitrate ion. By using this remover, an anodized film can be selectively removed from an aluminum or aluminum-alloy member.

摘要翻译： 去除剂含有碱性组分，二价锌离子，三价铁离子，螯合剂和硝酸根离子。 通过使用该去除剂，可以从铝或铝合金构件中选择性地除去阳极氧化膜。

公开(公告)号：US20090104853A1

公开(公告)日：2009-04-23

申请号：US12337205

申请日：2008-12-17

申请人： Tetsuo Suzuki ,  Yoshio Kawakami ,  Kazuhiro Nakiri

发明人： Tetsuo Suzuki ,  Yoshio Kawakami ,  Kazuhiro Nakiri

IPC分类号： B24B9/08

CPC分类号： G11B5/8404 ,  B24B9/065

摘要： A method of manufacturing a disk substrate includes a disk substrate forming step of forming a disk substrate; and an outer chamfering step of chamfering an outer edge of the disk substrate. The outer chamfering step includes chamfering the outer edge by bringing an end surface of a cylindrical-shaped outer chamfering grindstone having a hollow portion on its end into contact with the outer edge such that the hollow portion faces the outer edge while rotating each of the outer chamfering grindstone and the disk substrate.

摘要翻译： 盘状基板的制造方法包括形成盘基板的盘基板形成工序; 以及对盘基板的外缘进行倒角的外倒角工序。 外倒角步骤包括通过使其端部具有中空部分的圆柱形外倒角砂轮的端面与外边缘接触来使外边缘倒角，使得中空部分面向外边缘，同时使每个外部边缘 倒角磨石和盘基片。

公开(公告)号：US07452481B2

公开(公告)日：2008-11-18

申请号：US11129444

申请日：2005-05-16

申请人： Tetsuo Suzuki ,  Satoru Takada

发明人： Tetsuo Suzuki ,  Satoru Takada

IPC分类号： C09K13/00 ,  C09K13/06 ,  H01L21/461

CPC分类号： H01L21/3212 ,  C09G1/02 ,  C09K3/1463 ,  C09K13/08 ,  H01L21/02079

摘要： The polishing slurry contains monoclinic zirconium oxide particles having a crystallite size of 10 to 1,000 nm and an average particle diameter of 30 to 2,000 nm in an amount of 1 to 20 weight %, a carboxylic acid having three or more carboxyl groups in the molecule, and a quaternary alkylammonium hydroxide, and has a pH of 9 to 12. The method of reclaiming wafers comprises a step of polishing used test wafers by using the polishing slurry above and removing the films formed on the wafers and the degenerated layers formed on the wafer surfaces, a step of mirror-polishing at least one side of the wafers, and a step of cleaning the wafers.

摘要翻译： 研磨浆料含有微晶尺寸为10〜1000nm，平均粒径为30〜2000nm，分子量为1〜20重量％的羧酸的单斜晶氧化锆粒子， 和季铵烷基氢氧化铵，并且具有9至12的pH值。回收晶片的方法包括通过使用上述抛光浆料抛光所用测试晶片并除去形成在晶片上的膜和形成在晶片上的退化层的步骤 表面，对晶片的至少一侧进行镜面抛光的步骤，以及清洁晶片的步骤。

公开(公告)号：US06726378B2

公开(公告)日：2004-04-27

申请号：US10160560

申请日：2002-05-30

申请人： Tetsuo Suzuki

发明人： Tetsuo Suzuki

IPC分类号： G02B6255

CPC分类号： G02B6/2551

摘要： The connecting method of different kind optical fibers of the present invention is a connecting method able to improve the strength of connecting portions of the different kind optical fibers of different mode field diameters. In this connecting method, connecting ends of the different kind optical fibers removing their coating therefrom are mutually butted and fusion-spliced by gripping the coating in a step (S4). Next, the mode field diameters of different kind optical fiber connecting portions are conformed to each other by the heat treatment of a step (S5). This heat treatment is taken within a low dust space having a clean degree of 1000 or less in class. Thus, the heat treatment is taken under an environment in which foreign matters floated around the connecting portions of the different kind optical fibers are very small. Therefore, it is possible to restrain a crack from being caused by burning the foreign matters into the connecting portions. Accordingly, strength deterioration of the connecting portions of the different kind optical fibers caused by the crack can be prevented.

摘要翻译： 本发明的不同种类的光纤的连接方法是能够提高不同种类的场径的不同种类的光纤的连接部的强度的连接方法。 在该连接方法中，通过在步骤（S4）中夹持涂层，将不同种类的光纤的连接端相互对接并且被熔接。 接下来，通过步骤（S5）的热处理，不同种类的光纤连接部的模场直径相互一致。 该热处理在等级为1000以下的洁净度的低尘空间内进行。 因此，在不同种类的光纤的连接部分附近浮出的异物非常小的环境下进行热处理。 因此，能够通过将异物燃烧到连接部来抑制裂纹的发生。 因此，可以防止由裂纹引起的不同种类的光纤的连接部分的强度劣化。

公开(公告)号：US06684473B1

公开(公告)日：2004-02-03

申请号：US09671977

申请日：2000-09-27

申请人： Hiroaki Yamagishi ,  Tetsuo Suzuki ,  Katsuyuki Nakajima

发明人： Hiroaki Yamagishi ,  Tetsuo Suzuki ,  Katsuyuki Nakajima

IPC分类号： B23Q1700

CPC分类号： G01M13/023 ,  F16G5/16 ,  Y10T29/49764 ,  Y10T29/49771 ,  Y10T29/49908

摘要： A belt for use in a continuously variable transmission comprises an annular hoop of laminated metal elements each having a body and a head joined thereto with a pair of recesses defined therebetween, and a pair of rings inserted respectively in the recesses and each comprising a plurality of laminated metal web-shaped rings. The belt is manufactured by an element production line for producing the elements through a plurality of processes, a ring production line for producing the laminated rings through a plurality of processes parallel to the element production line, and a belt assembly line joined to the element production line and the ring production line, for bundling the elements with the laminated rings thereby to assemble the belt. The elements are inspected for a produced state thereof at a terminal end of the element production line and those elements which are judged as acceptable are sent to the belt assembly line. The laminated rings are inspected for a laminated state thereof at a terminal end of the ring production line and those laminated rings which are judged as acceptable are sent to the belt assembly line. Belts are inspected for an assembled state at the belt assembly line and those belts which are judged as acceptable are delivered as products.

摘要翻译： 一种用于无级变速器的传送带包括：环状的层叠金属元件，每个都具有一个主体和一个连接到其上的头部，其间限定有一对凹口，一对环分别插入凹槽中，每一个包括多个 层压金属网状环。 该带由用于通过多个工艺生产元件的元件生产线制造，用于通过与元件生产线平行的多个工艺来生产层压环的环形生产线和连接到元件生产的带组装线 线和环形生产线，用于将元件与层压环捆绑在一起，从而组装带。 在元件生产线的末端检查元件的生产状态，将被判断为可接受的元件发送到带装配线。 在环状生产线的末端检查层压环的层压状态，将判定为可接受的层压环送到带束装配线。 皮带在皮带装配线上经过组装状态检查，被认为可接受的皮带以产品形式交付。

公开(公告)号：US06599010B1

公开(公告)日：2003-07-29

申请号：US09517673

申请日：2000-03-02

申请人： Tetsuo Suzuki

发明人： Tetsuo Suzuki

IPC分类号： G01N300

CPC分类号： G01N3/18 ,  G01N3/02 ,  G01N2203/0208 ,  G01N2203/0222

摘要： A slit for probe-changing is provided above an opening for changing a test piece on a side of a test piece tube for installing test pieces. Probes are then taken out and inserted via this slit. Probes can therefore be changed without taking out the test piece tube or a thermocouple. This improves work efficiency and means that the work can be carried out in a confined space because the probes are pulled forward towards an operator and inserted in the opposite direction.

摘要翻译： 在用于安装试件的试件管一侧的试验片的开口部上方设置有用于探针变更的狭缝。 然后将探头从该狭缝中取出并插入。 因此，可以在不取出试管或热电偶的情况下更换探针。 这提高了工作效率，并且意味着工作可以在有限的空间中进行，因为探针向着向操作者向前拉并且沿相反方向插入。

公开(公告)号：US06427512B2

公开(公告)日：2002-08-06

申请号：US09788449

申请日：2001-02-21

申请人： Tetsuo Suzuki ,  Makoto Kobayashi ,  Takumitsu Tachibana

发明人： Tetsuo Suzuki ,  Makoto Kobayashi ,  Takumitsu Tachibana

IPC分类号： B21D2804

CPC分类号： B21D53/14 ,  F16G5/16 ,  Y10T83/02 ,  Y10T83/0529 ,  Y10T83/06 ,  Y10T83/6563

摘要： A metal sheet having a pair of thin portions on respective marginal edges thereof which are joined to a remaining portion of the metal sheet via respective corners is centered by positioning the center between the corners as the center of the metal sheet. Then, elements are blanked out of the metal sheet. The elements remain joined to the metal sheet by respective connectors which are formed in the respective thin portions of the metal sheet, the bodies having respective lower edges formed in the respective thin portions of the metal sheet. The elements are separated from the metal sheet by cutting off the connectors along the lower edges of the bodies.

摘要翻译： 在其各边缘上具有经由各个角部与金属板的剩余部分连接的一对薄壁部分的金属片通过将角部之间的中心定位为金属片的中心而居中。 然后，将元件从金属板上冲出。 这些元件通过形成在金属片的相应薄部分中的相应连接器保持接合到金属片，该主体具有形成在金属片的相应薄部分中的相应的下边缘。 通过沿着主体的下边缘切断连接器，元件与金属片分离。

公开(公告)号：US06384415B1

公开(公告)日：2002-05-07

申请号：US09597577

申请日：2000-06-20

申请人： Tetsuo Suzuki ,  Kunio Otsuka

发明人： Tetsuo Suzuki ,  Kunio Otsuka

IPC分类号： G01J502

CPC分类号： G01N21/9505 ,  G01N21/3563 ,  G01N2021/3568

摘要： A method of evaluating the quality of a silicon wafer is characterized by analyzing a silicon wafer by an infrared absorption spectrum, and then evaluating the quality of the silicon crystal based on an absorbance ratio represented by the following formula (1): {(Absorbance &agr;1 at an arbitrary wavenumber between 1055 and 1080 cm−1)−(Absorbance &agr;BL of base line)}/{(Absorbance &agr;2 at an arbitrary wavenumber between 1100 and 1120 cm−1)−(Absorbance &agr;BL of base line)}  (1) wherein absorbances &agr;1 and &agr;2 represent absorbances of the measured silicon wafer, and base line absorbance &agr;BL represents the absorbance of a base line of the measured silicon wafer, which is drawn from 1030 to 1170 cm−1. By using the quality evaluating method of the present invention, internal crystal defects of silicon can be precisely detected in a non-destructive manner. The method of the present invention thus has the advantages of improving productivity, decreasing reclaiming cost, etc.

摘要翻译： 评估硅晶片质量的方法的特征在于通过红外吸收光谱分析硅晶片，然后基于由下式（1）表示的吸光度比来评估硅晶体的质量：其中吸光度α1和 α2表示测量的硅晶片的吸光度，基线吸光度αBL表示从1030至1170cm -1绘制的测量的硅晶片的基线的吸光度。 通过使用本发明的质量评价方法，能够以非破坏性的方式精确地检测硅的内部晶体缺陷。 因此，本发明的方法具有提高生产率，降低回收成本等优点。

公开(公告)号：US06290170B1

公开(公告)日：2001-09-18

申请号：US09537766

申请日：2000-03-30

申请人： Tetsuo Suzuki ,  Hideki Shigematsu

发明人： Tetsuo Suzuki ,  Hideki Shigematsu

IPC分类号： B65H2304

CPC分类号： B21D43/023 ,  B21C47/34

摘要： A strip guiding device for guiding a strip longitudinally along a feed path has a limiting mechanism for limiting the strip transversely at opposite side edges thereof to cause the strip to pass through a predetermined position in the feed path. The limiting mechanism has a pair of abutment members having respective abutment surfaces for abutting against the side edges of the strip along the feed path. The abutment members are movable in first directions toward and away from the side edges of the strip, and normally urged by a spring assembly to move away from the strip. The limiting mechanism also has a pair of pressing members having respective slanted surfaces held in sliding contact with respective sliding surfaces of the abutment members remote from the abutment surfaces. The pressing members are movable in second directions transverse to the first directions. The pressing members press the abutment members toward the strip against the urging means by sliding contact of the slanted surfaces with the sliding surfaces in response to movement of the pressing members in one of the second directions. The limiting mechanism further includes a displacing mechanism for displacing the pressing members in the second directions to move the abutment members in the first directions.

摘要翻译： 用于沿着进给路径纵向引导条带的条带引导装置具有限制机构，用于在相对的两个侧边缘处横向地限制条带，以使条带穿过进给路径中的预定位置。 限制机构具有一对邻接构件，其具有相应的邻接表面，用于沿着进给路径抵靠条带的侧边缘。 邻接构件可沿第一方向朝向和远离条的侧边缘移动，并且通常由弹簧组件推动以远离带移动。 限制机构还具有一对按压构件，其具有保持与远离邻接表面的邻接构件的相应滑动表面滑动接触的相应倾斜表面。 按压构件可以在横向于第一方向的第二方向上移动。 按压构件响应于按压构件在第二方向之一的移动而将倾斜表面与滑动表面滑动接触，将邻接构件朝向推动装置压靠。 所述限制机构还包括用于沿所述第二方向移动所述按压构件的位移机构，以沿所述第一方向移动所述抵接构件。

公开(公告)号：US06260950B1

公开(公告)日：2001-07-17

申请号：US08634249

申请日：1996-04-18

申请人： Koichi Tanno ,  Tetsuo Suzuki ,  Haruyuki Yanagi ,  Hiroyuki Kinoshita

发明人： Koichi Tanno ,  Tetsuo Suzuki ,  Haruyuki Yanagi ,  Hiroyuki Kinoshita

IPC分类号： B41J224

CPC分类号： B41J25/34 ,  B41J2/1755 ,  B41J23/025 ,  B41J29/13

摘要： An ink jet printing member mounted on a scanning carriage to discharge ink for recording while traveling with the carriage includes an extrusion that engages with a hook of the scanning carriage when this member is mounted on the carriage. This extrusion is arranged to dually function to identify the kind of the mounted ink jet printing member in accordance with the location of the extrusion and to secure the printing member on the carriage. With this arrangement, the structure is simplified to reduce the manufacturing costs significantly, while preventing the user from erroneously mounting an ink jet recording member on the carriage for an intended recording.

摘要翻译： 安装在扫描托架上的喷墨印刷部件，用于在与滑架一起行进时排出用于记录的墨水，包括当该部件安装在滑架上时与扫描滑架的钩接合的挤出件。 这种挤压设置成根据挤出的位置来双重地识别所安装的喷墨印刷部件的种类，并将打印部件固定在滑架上。 利用这种布置，简化了结构以显着降低制造成本，同时防止用户将喷墨记录部件错误地安装在滑架上用于预期的记录。