公开(公告)号：US20250020713A1

公开(公告)日：2025-01-16

申请号：US18769683

申请日：2024-07-11

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Sam J. Strickling ,  Kan Tan

IPC: G01R31/28

Abstract: A margin tester includes one or more ports to allow the margin tester to connect to a device under test (DUT), a memory, the memory containing a margin tester signature, a transmitter, a receiver to receive signals from the DUT, one or more processors configured to execute code that causes the one or more processors to: receive multiple signals from the receiver through the one or more ports, generate a performance indicator from the multiple signals, send the performance indicator and the margin tester signature to one or more machine learning networks, and receiving a result from the one or more machine learning networks containing a performance measurement prediction for the DUT.

公开(公告)号：US20240393369A1

公开(公告)日：2024-11-28

申请号：US18442359

申请日：2024-02-15

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: G01R13/02

Abstract: A test and measurement instrument has an input to receive a signal under test having a repeating pattern. one or more analog-to-digital converters (ADC) to sample the signal under test at a sample rate over many repeating patterns to digitize the signal, one or more processors configured to execute code to cause the one or more processors to: recover a clock from the sampled signal under test, use the clock to generate an original pattern waveform, interpolate and resample from the original pattern waveform to generate an evenly time-spaced pattern waveform, apply an equalizer to the evenly time-spaced pattern waveform to produce an equalized pattern waveform, interpolate and resample from the equalized pattern waveform to produce a new waveform having equalized samples at sample times of the sampled signal under test, recover an updated clock from the new waveform, and use the updated clock to produce an updated waveform.

公开(公告)号：US12146914B2

公开(公告)日：2024-11-19

申请号：US17745797

申请日：2022-05-16

Applicant: Tektronix, Inc.

Inventor： Maria Agoston ,  John J. Pickerd ,  Kan Tan

IPC: G01R31/319 ,  G01R31/26 ,  H04B17/00 ,  H04L1/20

Abstract: A test and measurement system includes a machine learning system, a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: acquire a waveform from the device under test (DUT), transform the waveform into a composite waveform image, and send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT. A method of determining a bit error ratio for a device under test (DUT), includes acquiring one or more waveforms from the DUT, transforming the one or more waveforms into a composite waveform image, and sending the composite waveform image to a machine learning system to obtain a bit error ratio (BER) value for the DUT.

公开(公告)号：US20240313795A1

公开(公告)日：2024-09-19

申请号：US18591468

申请日：2024-02-29

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H03M1/10

CPC classification number: H03M1/108 ,  H03M1/1014 ,  H03M1/1085

Abstract: A test and measurement instrument includes one or more channels to receive a signal under test, each channel comprising an input port, a filter, and a sampler, at least one analog-to-digital converter (ADC), the at least one ADC having two pipes connected to the sampler of one of the one or more channels, the at least one ADC to produce digital samples of the signal at a sample rate, and one or more processors configured to execute code that causes the one more processors to acquire a spectrum of the digital samples for each pipe in the at least one ADC, and use the spectrums of the digital samples for each pipe in the at least one ADC to reconstruct the spectrum of the signal under test. A method of operating a test and measurement instrument, and a method a method of calibrating a test and measurement instrument is included.

公开(公告)号：US20240235669A1

公开(公告)日：2024-07-11

申请号：US18582609

申请日：2024-02-20

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Evan Douglas Smith ,  Heike Tritschler ,  Williams Fabricio Flores Yepez

IPC: H04B10/073 ,  H04B10/077 ,  H04B10/572

CPC classification number: H04B10/0731 ,  H04B10/0775 ,  H04B10/572

Abstract: A test and measurement system includes a test and measurement instrument, including a port to receive a signal from a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: adjust a set of operating parameters for the DUT to a first set of reference parameters; acquire, using the test and measurement instrument, a waveform from the DUT; repeatedly execute the code to cause the one or more processors to adjust the set of operating parameters and acquire a waveform, for each of a predetermined number of sets of reference parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted optimal operating parameters; adjust the set of operating parameters for the DUT to the predicted optimal operating parameters; and determine whether the DUT passes a predetermined performance measurement when adjusted to the set of predicted optimal operating parameters.

公开(公告)号：US20240151753A1

公开(公告)日：2024-05-09

申请号：US18468523

申请日：2023-09-15

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: G01R23/02 ,  G01R13/02

CPC classification number: G01R23/02 ,  G01R13/0218 ,  G01R23/16

Abstract: A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.

公开(公告)号：US11898927B2

公开(公告)日：2024-02-13

申请号：US17735025

申请日：2022-05-02

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: G01R31/11 ,  G01M11/00 ,  G01R27/06

CPC classification number: G01M11/3118 ,  G01M11/3145 ,  G01R27/06

Abstract: A test and measurement device includes one or more ports configured to connect to a device under test (DUT), a time domain reflectometry (TDR) source configured receive a source control signal and to produce an incident signal to be applied to the DUT, one or more analog-to-digital converters (ADC) configured to receive a sample clock and sample the incident signal from the TDR source and a time domain reflection (TDR) signal or a time domain transmission (TDT) signal from the DUT to produce an incident waveform and a TDR/TDT waveform, one or more processors configured to execute code to cause the one or more processors to: control a clock synthesizer to produce the sample clock and the source control signal, and use a period of the TDR source, a period of the sample clock, and the number of samples to determine time locations for samples in the incident waveform and the TDR/TDT waveform, and a display configured to display the incident waveform and the TDR/TDT waveform. A method of sampling a waveform using a real-equivalent-time oscilloscope having a time domain reflectometry source, comprising: controlling a clock synthesizer to produce a sample clock and a source control signal; using a time domain reflectometry (TDR) source to receive the source control signal and to produce an incident signal to be applied to a device under test (DUT); receiving the sample clock at one or more analog-to-digital converters (ADC) and sampling the incident signal from the TDR source and a TDR/TDT signal from the DUT to produce an incident waveform and a TDR/TDT waveform; determining time locations for samples in the incident waveform and the TDR/TDT waveform, using a period of the TDR source, a period of the sample clock, and a number of samples; and displaying the incident waveform and the TDR/TDT waveform.

公开(公告)号：US20230409451A1

公开(公告)日：2023-12-21

申请号：US18211410

申请日：2023-06-19

Applicant: Tektronix, Inc.

Inventor： Justin E. Patterson ,  Kan Tan

IPC: G06F11/22

CPC classification number: G06F11/2268

Abstract: A system includes an input for accepting a dataset including at least two sets of data in a dataset domain and one or more processors configured to derive at least two principal components from the dataset using principal component analysis, the at least two principal components being orthogonal to one another, map the dataset to a principal component domain derived from the at least two principal components, generate additional data in the principal component domain, and remap the additional data in the principal component domain back to the dataset domain as a newly generated dataset. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.

公开(公告)号：US20230408550A1

公开(公告)日：2023-12-21

申请号：US18208562

申请日：2023-06-12

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G01R13/02 ,  G01R31/00 ,  G06N3/08

CPC classification number: G01R13/029 ,  G06N3/08 ,  G01R31/001

Abstract: A test and measurement instrument has an input port to allow the instrument to receive one or more waveforms from a device under test (DUT), one or more low pass filters to remove a portion of the noise from the one or more waveforms, and one or more processors to: select a waveform pattern from the waveforms, measure noise in the one or more waveforms and generate a noise representation of the noise removed, create one or more images using the waveform pattern and the one or more filtered waveforms, add the noise representation to the one or more images to produce at least one combined image, input the at least one combined image to one or more deep learning networks, and receive one or more predicted values for the DUT.

公开(公告)号：US20230370242A1

公开(公告)日：2023-11-16

申请号：US18141438

申请日：2023-04-30

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H04L7/00 ,  H04L25/03

CPC classification number: H04L7/0058 ,  H04L25/03038

Abstract: A test and measurement instrument has one or more input ports to connect the instrument to a device under test (DUT), one or more processors configured to execute code to cause the one or more processors to: receive an equalized waveform and an un-equalized waveform through the input port from the DUT, without any knowledge of a digital pattern that corresponds to the waveforms and without extracting the digital pattern from the waveforms, align the un-equalized waveform and the equalized waveform in time to produce an aligned un-equalized waveform and an aligned equalized waveform, and use the aligned equalized waveform and the aligned un-equalized waveform to determine equalizer tap values.