PROCESS FOR PRODUCING ACETYLENE COMPOUND
    62.
    发明申请
    PROCESS FOR PRODUCING ACETYLENE COMPOUND 失效
    生产乙烯化合物的方法

    公开(公告)号:US20060041031A1

    公开(公告)日:2006-02-23

    申请号:US10531458

    申请日:2003-09-26

    IPC分类号: C07C201/12

    CPC分类号: C07C201/12 C07C205/37

    摘要: There is provided a process for producing an acetylene compound useful as an intermediate of pharmaceuticals, from 4-nitrofluorobenzene, in industrially and economically advantageous manner. Concretely, it is a method for producing an acetylene compound of formula (3) characterized by reacting 4-nitrofluorobenzene of formula (1) with an alkoxide of 2-methyl-3-butyn-2-ol of formula (2) at −20 to 10° C.

    摘要翻译: 提供了从工业上和经济上有利的方式制备可用作4-硝基氟苯的药物中间体的乙炔化合物的方法。 具体地说,它是制备式(3)的炔属化合物的方法,其特征在于使式(1)的4​​-硝基氟苯与式(2)的2-甲基-3-丁炔-2-醇的醇盐在-20℃ 至10℃

    Reproduction color prediction apparatus and method
    64.
    发明申请
    Reproduction color prediction apparatus and method 失效
    复制色彩预测装置及方法

    公开(公告)号:US20050083346A1

    公开(公告)日:2005-04-21

    申请号:US10974888

    申请日:2004-10-28

    IPC分类号: G06K9/00 G09G5/02 H04N1/60

    CPC分类号: H04N1/6033

    摘要: A primary color dot gain correction unit corrects the spectral reflectance of each of a plurality of color agents on the basis of the dot quantity set for each color agent. An initial estimated value calculator estimates a mixed color by the KM theory using spectral reflectance data corrected by the primary color dot gain correction unit. An ink overlap correction coefficient storage unit stores correction coefficients, which are determined on the basis of errors between the actually measured values of spectral reflectance data of color patches obtained using the plurality of color agents, and estimated values estimated by the initial estimated value calculator based on the dot quantities of the respective color agents on the color patches. An ink overlap correction unit obtains the prediction result of a reproduction color by correcting the spectral reflectance data of the mixed color calculated by the initial estimated value calculator on the basis of the correction coefficients stored in the ink overlap correction coefficient storage unit.

    摘要翻译: 原色点增益校正单元基于为每个着色剂设定的点数来校正多个着色剂中的每一个的光谱反射率。 初始估计值计算器通过KM理论使用由原色网点增益校正单元校正的光谱反射率数据来估计混合色。 墨水重叠校正系数存储单元存储基于使用多个颜色剂获得的色标的光谱反射率数据的实际测量值与由初始估计值计算器估计的估计值之间的误差确定的校正系数 关于色块上各个着色剂的点数。 墨水重叠校正单元通过基于存储在墨水重叠校正系数存储单元中的校正系数校正由初始估计值计算器计算的混合颜色的光谱反射率数据来获得再现颜色的预测结果。

    Scanning electron microscope
    65.
    发明授权
    Scanning electron microscope 有权
    扫描电子显微镜

    公开(公告)号:US06872944B2

    公开(公告)日:2005-03-29

    申请号:US10699793

    申请日:2003-11-04

    摘要: The present invention relates to a scanning electron microscope employing a deceleration field forming technology (retarding), more particularly a scanning electron microscope which separates and detects secondary electrons at high efficiency.The object of the present invention is accomplished by providing an electron source, a lens for condensing the primary electron beam which is emitted from said electron source, a detector for detecting electrons which are generated by radiation of the primary electron beam onto a specimen, a first deceleration means for decelerating the primary electron beam which is radiated onto said specimen, a second deceleration means for decelerating electrons which are generated on the specimen, and a deflector for deflecting said electrons which are decelerated by said second decelerating means.

    摘要翻译: 本发明涉及一种采用减速场形成技术(延迟)的扫描电子显微镜,更具体地说,涉及一种以高效率分离和检测二次电子的扫描电子显微镜。本发明的目的是提供一种电子源, 用于冷凝从所述电子源发射的一次电子束的透镜,用于检测通过将一次电子束辐射到样本上而产生的电子的检测器,用于使被辐射到所述样本上的一次电子束减速的第一减速装置 ,用于使在试样上产生的电子减速的第二减速装置和用于使由所述第二减速装置减速的所述电子偏转的偏转器。

    Charged particle beam scanning type automatic inspecting apparatus
    66.
    发明授权
    Charged particle beam scanning type automatic inspecting apparatus 有权
    带电粒子束扫描式自动检测装置

    公开(公告)号:US06580075B2

    公开(公告)日:2003-06-17

    申请号:US10251749

    申请日:2002-09-23

    IPC分类号: G01N2300

    CPC分类号: H01J37/28 H01J2237/2817

    摘要: A charged particle beam scanning inspecting apparatus for irradiating a charged particle beam, fetching information of a subject to be inspected at a predetermined beam scanning position and performing an inspection by processing the information. The apparatus is a measurer which measures a scanning position of the beam and an inspection position on said inspection subject to calculate beam target coordinates corrected for an apparatus error, an error correction constant and a deflected distortion correction constant, and a deflection controller for scanning the beam. The deflection controller includes a deflection position operating circuit for performing an operation of the inspection position in a deflection coordinate system, a deflected distortion operating circuit. The deflection position operating circuit and deflected distortion operating circuit are constructed in a pipe line fashion.

    摘要翻译: 一种用于照射带电粒子束的带电粒子束扫描检查装置,在预定的束扫描位置获取要检查的对象的信息,并通过处理该信息进行检查。 该装置是测量光束的扫描位置和所述检查对象上的检查位置的计量器,用于计算针对装置误差校正的光束目标坐标,误差校正常数和偏转失真校正常数,以及用于扫描 光束。 偏转控制器包括用于在偏转坐标系中执行检查位置的操作的偏转位置操作电路,偏转失真操作电路。 偏转位置操作电路和偏转失真操作电路以管道方式构成。

    Mn-Zn ferrite and production process thereof
    67.
    发明授权
    Mn-Zn ferrite and production process thereof 失效
    锰锌铁氧体及其制备方法

    公开(公告)号:US06468441B1

    公开(公告)日:2002-10-22

    申请号:US09795133

    申请日:2001-03-01

    IPC分类号: C04B3526

    CPC分类号: C04B35/2658 C04B35/265

    摘要: The present invention provides a Mn—Zn ferrite having an electrical resistivity exceeding 1 &OHgr;m order and a low core loss in a high frequency region exceeding 1 MHz. A basic component composition of the Mn—Zn ferrite includes 44.0 to 49.8 mol % of Fe2O3, 6.0 to 15.0 mol % of ZnO (15.0 mol % is excluded), 0.1 to 3.0 mol % of CoO, 0.02 to 1.20 mol % of Mn2O3, and the remainder of MnO. The Mn—Zn ferrite achieves desired purposes by controlling Fe2O3 content to a range less than 50 mol % that is the stoichiometric composition, adding a proper amount of CoO, restraining amount of Mn2O3 formation to 1.20 mol % or less, and further setting their average grain sizes to less than 10 &mgr;m.

    摘要翻译: 本发明提供一种电阻率超过1欧姆等级的Mn-Zn铁氧体,超高于1MHz的高频区域的低铁损。 Mn-Zn铁氧体的基本成分组成包括Fe2O3为44.0〜49.8mol%,ZnO为6.0〜15.0mol%(不包括15.0mol%),CoO为0.1〜3.0mol%,Mn2O3为0.02〜1.20mol% 和剩余的MnO。 Mn-Zn铁氧体通过将Fe 2 O 3含量控制在化学计量组成小于50摩尔%的范围内,添加适量的CoO,抑制Mn2O3的形成量为1.20摩尔%以下,进一步设定其平均值 粒径小于10um。

    Mn-Zn ferrite and production process thereof
    68.
    发明授权
    Mn-Zn ferrite and production process thereof 失效
    锰锌铁氧体及其制备方法

    公开(公告)号:US06461531B2

    公开(公告)日:2002-10-08

    申请号:US09795116

    申请日:2001-03-01

    IPC分类号: C04B3526

    CPC分类号: C04B35/2658

    摘要: The present invention provides a Mn—Zn ferrite having an electrical resistivity exceeding 1 &OHgr;m order and having a low core loss in a high frequency region exceeding 1 MHz. The basic component composition of the Mn—Zn ferrite includes 44.0 to 49.8 mol % Fe2O3, 6.0 to 15.0 mol % ZnO (15.0 mol % is excluded), 0.1 to 4.0 mol % at least one of TiO2 and SnO2, and remainder MnO, wherein desired results are obtained by limiting Fe2O3 content to less than 50 mol % that is the stoichiometric composition and adding a proper amount of TiO2 or SnO2 and further controlling its average grain size to less than 10 &mgr;m.

    摘要翻译: 本发明提供一种具有超过1欧姆等级的电阻率并且在超过1MHz的高频区域具有低铁损的Mn-Zn铁氧体。 Mn-Zn系铁氧体的基本成分组成包括Fe2O3为44.0〜49.8mol%,ZnO为6.0〜15.0mol%(不包括15.0mol%),TiO 2和SnO 2中的至少一种为0.1〜4.0mol%,余量为MnO,其中, 通过将Fe 2 O 3含量限制为小于化学计量组成的50mol%并加入适量的TiO 2或SnO 2并进一步控制其平均晶粒尺寸小于10um而得到期望的结果。

    Test pattern generation apparatus and method for SDRAM
    70.
    发明授权
    Test pattern generation apparatus and method for SDRAM 失效
    用于SDRAM的测试图形生成装置和方法

    公开(公告)号:US6094738A

    公开(公告)日:2000-07-25

    申请号:US121954

    申请日:1998-07-24

    IPC分类号: G01R31/28

    CPC分类号: G01R31/28

    摘要: A test pattern generation apparatus and method for an SDRAM can easily generate a test pattern for a synchronous dynamic RAM (SDRAM) by having a specific wrap conversion circuit or an address conversion method. The wrap conversion circuit is provided to receive two types of address data from a pattern generator and converts the data through a specified logic circuit information. The test pattern generation method for the SDRAM is carried out by inputting column address data and wrap address data, and by generating output data which has been converted by a predetermined logic equation. The test pattern generation apparatus and method can also include an address inversion scramble for the converted output.

    摘要翻译: 用于SDRAM的测试图形生成装置和方法可以通过具有特定的卷绕转换电路或地址转换方法来容易地生成用于同步动态RAM(SDRAM)的测试模式。 提供包裹转换电路以从模式发生器接收两种类型的地址数据,并通过指定的逻辑电路信息转换数据。 通过输入列地址数据和包裹地址数据,并且通过产生已经通过预定逻辑等式转换的输出数据来执行用于SDRAM的测试图案生成方法。 测试模式生成装置和方法还可以包括用于转换的输出的地址反向加扰。