摘要:
A cell in which the activity of a protein relating to transport of an intracellular sugar nucleotide, GDP-fucose, to the Golgi body is more decreased or deleted than its parent cell; a process for producing an antibody composition using the cell; a transgenic non-human animal or plant or the progenies thereof, in which genome is modified so as to have a decreased or deleted activity of a protein relating to transport of an intracellular sugar nucleotide, GDP-fucose, to the Golgi body; a process for producing an antibody composition from the animal or plant; and a medicament comprising the antibody composition.
摘要:
[Problem] To provide a coating composition capable of forming a hard coating on the surfaces of an optical base member such as a plastic lens featuring highly closely adhering property, excellent transparency and excellent scratch resistance.[Means for Solution] The coating composition comprise (a) a fine granular silica having a grain size of not larger than 30 nm; (b) organosilicon compound components containing an epoxy group-containing organosilicon compound (b1) and tetraalkoxysilane (b2) at a mass ratio (b1/b2) of 0.25 to 4.0; (c) water; and (d) a curing catalyst comprising a complex containing aluminum as a core metal, wherein the fine granular silica (a) is contained in an amount of 15 to 55 parts by mass, the water (c) is contained in an amount of 30 to 200 parts by mass and the curing catalyst (d) is contained in an amount of 0.1 to 5.0 parts by mass per the total amount of the fine granular silica (a) and the organosilicon compound components (b) of 100 parts by mass.
摘要:
A method of coating without permitting the coating solution to flow onto the side surfaces or the back surfaces of the lenses in the operation for applying the coating solution onto the lenses. A lens 15 is spin-coated with the coating solution having a particular viscosity. A side edge portion 121 of a spatula 119 is brought into contact with an upper edge portion of a side surface 15a of the lens 15 before the coating solution fed onto the surface of the lens arrives at the peripheral edge portion of the lens. The side edge portion 121 of the spatula 119 is so arranged that the upper end side of the spatula is tilted toward the center side of the lens 15 at an angle of 5 to 35 degrees with the vertical line as a reference. The coating solution applied onto the lens 15 that is rotating adheres onto the spatula 119 but does not adhere onto the side surface of the lens 15.
摘要:
A semiconductor memory device which has a normal memory cell array and a redundant memory cell array for replacing a failure bit in the normal memory cell array, having: a memory cell array having a plurality of word lines, a plurality of bit line pairs crossing the word lines, and a plurality of memory cells placed at the crossing positions; and a plurality of sense amplifier circuits which are placed between adjacent memory cell arrays and are shared by bit line pairs of memory cell arrays on both sides. And a current interrupting circuit for disconnecting the sense amplifier and the bit line pairs in a column having a failure is formed respectively between the sense amplifier circuit and the bit line pairs on both sides. By this current interrupting circuit, short-circuit current from the sense amplifier circuit to the shorted area can be suppressed.
摘要:
There is provided an animal feed, an anticoccidial agent, and an anticlostridial agent having less harm and an excellent prophylactic and/or therapeutic effect for coccidiosis and clostridial disease. Also provided is a prophylactic and/or therapeutic feed for coccidiosis containing pinene, thymol, eugenol, and limonene; an anticoccidial agent containing pinene, thymol, eugenol, and limonene as active ingredients; a clostridial disease prophylactic and/or therapeutic feed containing pinene, thymol, eugenol, and limonene; and an anticlostridial agent containing pinene, thymol, eugenol, and limonene as active ingredients.
摘要:
A semiconductor memory device which has a normal memory cell array and a redundant memory cell array for replacing a failure bit in the normal memory cell array, having: a memory cell array having a plurality of word lines, a plurality of bit line pairs crossing the word lines, and a plurality of memory cells placed at the crossing positions; and a plurality of sense amplifier circuits which are placed between adjacent memory cell arrays and are shared by bit line pairs of memory cell arrays on both sides. And a current interrupting circuit for disconnecting the sense amplifier and the bit line pairs in a column having a failure is formed respectively between the sense amplifier circuit and the bit line pairs on both sides. By this current interrupting circuit, short-circuit current from the sense amplifier circuit to the shorted area can be suppressed.
摘要:
The present invention provides a process for producing an antibody composition using a cell, which comprises using a cell into which an RNA having activity of suppressing the function of an enzyme relating to the modification of a sugar chain in which 1-position of fucose is bound to 6-position of N-acetylglucosamine in the reducing end through α-bond in a complex type N-glycoside-linked sugar chain is introduced; the RNA used in the production process; a DNA corresponding to the RNA; a cell in which the RNA or DNA is introduced or expressed; a process for producing the cell; and a method for suppressing the enzyme.
摘要:
A cell in which genome is modified so as to have a more decreased or deleted activity of an enzyme relating to modification of a sugar chain in which 1-position of fucose is bound to 6-position of N-acetylglucosamine in the reducing end through α-bond in a complex N-glycoside-linked sugar chain than its parent cell, and a process for producing an antibody composition using the cell.
摘要:
A redundancy memory circuit stores a defect address indicating a defective memory cell row. A redundancy control circuit disables the defective memory cell row corresponding to the defect address stored in the redundancy memory circuit and enables a redundancy memory cell row in the memory block containing the defective memory cell row. Moreover, in the other memory blocks, the redundancy control circuit disables memory cell rows corresponding to the defective memory cell row and enables redundancy memory cell rows instead of these memory cell rows. Consequently, not only the memory block having the defective memory cell row but one of the memory cell rows in the other memory blocks is always also relieved. Thus, the redundancy memory circuit can be shared among all the memory blocks with a reduction in the number of redundancy memory circuits. As a result, the semiconductor memory can be reduced in chip size.
摘要:
Upon receiving a level of a second node through a third switch in the first half of a first period, a holding circuit outputs it as a fuse signal indicating a blown-out state of a fuse. Since the third switch turns off in the second half of the first period, a change in level of the second node occurring thereafter will not affect data in the holding circuit, whereby prevents malfunction of a fuse circuit. With the fuse blown, a level of a first node gets fixed at that of a second power supply line after the first period. This eliminates a voltage difference between both ends of the fuse, thereby preventing a growback. No occurrence of growback makes just one fuse blowing sufficient for the fuse circuit even with the fuse not completely cut off. This consequently shortens a time for blowing the fuse in a test process.