APPARATUS AND METHODS FOR DETERMINING DATA STATES OF MEMORY CELLS

    公开(公告)号:US20200321065A1

    公开(公告)日:2020-10-08

    申请号:US16908832

    申请日:2020-06-23

    IPC分类号: G11C16/34 G11C16/26 G11C16/08

    摘要: Methods of operating a memory, as well as memory configured to perform such methods, might include determining a plurality of read voltages for a read operation during a precharge phase of the read operation, determining a pass voltage for the read operation during the precharge phase of the read operation, applying the pass voltage to each unselected access line of a plurality of access lines, and, for each read voltage of the plurality of read voltages, applying that read voltage to a selected access line of the plurality of access lines and sensing a data state of a memory cell connected to the selected access line.

    Methods of operating a memory device comparing input data to data stored in memory cells coupled to a data line

    公开(公告)号:US10529430B2

    公开(公告)日:2020-01-07

    申请号:US16180154

    申请日:2018-11-05

    摘要: Methods of operating a memory device include comparing input data to data stored in memory cells coupled to a data line, comparing a representation of a level of current in the data line to a reference, and determining that the input data potentially matches the data stored in the memory cells when the representation of the level of current in the data line is less than the reference. Methods of operating a memory device further include comparing input data to first data and to second data stored in memory cells coupled to a first data line or to a second data line, respectively, comparing representations of the levels of current in the first data line and in the second data line to a first reference and to a different second reference, and deeming one to be a closer match to the input data in response to results of the comparisons.

    Memory as a programmable logic device

    公开(公告)号:US10482972B2

    公开(公告)日:2019-11-19

    申请号:US16413708

    申请日:2019-05-16

    摘要: Memories include a data line, a plurality of strings of series-connected memory cells selectively connected to the data line, a plurality of first access lines each coupled to a control gate of a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells, and a plurality of second access lines each coupled to a control gate of a respective memory cell of a respective string of series-connected memory cells of the plurality of strings of series-connected memory cells.