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公开(公告)号:US11428790B2
公开(公告)日:2022-08-30
申请号:US15613835
申请日:2017-06-05
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Baher S. Haroun , Nirmal C. Warke , David P. Magee
IPC: G01S7/4861 , G01S7/4865 , G01S17/26
Abstract: An optical distance measurement system includes a transmission circuit and a receive circuit. The transmission circuit is configured to generate narrowband intensity modulated light transmission signals over a first band of frequencies and direct the narrowband light transmission signal toward a target object. The receive circuit is configured to receive reflected light off the target object, convert the reflected light into a current signal proportional to the intensity of the reflected light, filter frequencies outside a second band of frequencies from the current signal to create a filtered current signal, and convert the filtered current signal into a voltage signal. The second band of frequencies corresponds with the first band of frequencies.
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公开(公告)号:US11375429B2
公开(公告)日:2022-06-28
申请号:US15632858
申请日:2017-06-26
Applicant: Texas Instruments Incorporated
Inventor: Nirmal Chindhu Warke , Srinath Hosur , Martin J. Izzard , Siraj Akhtar , Baher S. Haroun , Marco Corsi
IPC: H04W40/06 , H04W40/00 , H01Q3/26 , H01Q21/00 , H04L49/00 , H04L49/40 , H04B17/336 , H01Q9/20 , H04B7/06 , H04L45/74 , H04W40/12
Abstract: Embodiments of the invention provide a system and method for chip to chip communications in electronic circuits. In one embodiment, a networking device includes an input port circuit having a transmitter circuit coupled one or more transmitter antennas, wherein the input port circuit transmits a data packet to a first output port circuit using millimeter wave signals. The networking device includes output port circuits including at least the first output port circuit, each of the output port circuits having a receiver circuit coupled to one or more receiver antennas. The networking device includes a beamforming circuit coupled to the one or more transmitter antennas of the input port circuit, wherein the beamforming circuit causes the one or more transmitter antennas to transmit an antenna beam directed at the one or more receiver antennas of the first output port circuit.
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公开(公告)号:US10267856B2
公开(公告)日:2019-04-23
申请号:US15845339
申请日:2017-12-18
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Lee D. Whetsel , Baher S. Haroun
IPC: G01R31/26 , G01R31/317 , G01R31/04 , G01R31/3177 , G01R31/3185
Abstract: This disclosure describes a novel method and apparatus for testing TSVs within a semiconductor device. According to embodiments illustrated and described in the disclosure, a TSV may be tested by stimulating and measuring a response from a first end of a TSV while the second end of the TSV held at ground potential. Multiple TSVs within the semiconductor device may be tested in parallel to reduce the TSV testing time according to the disclosure.
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公开(公告)号:US20190039091A1
公开(公告)日:2019-02-07
申请号:US16053662
申请日:2018-08-02
Applicant: Texas Instruments Incorporated
Inventor: Krishnaswamy Nagaraj , Asif Qaiyum , Baher S. Haroun
IPC: B06B1/02 , H03K17/687 , G01F1/66
Abstract: In described examples, a first and second driver each include a first-rail output transistor including a first terminal coupled to a first power rail and a second-rail output transistor including a first terminal coupled to a second power rail. The first-rail output transistor of each of the first and second drivers includes a second terminal coupled to a second terminal of the second-rail output transistor of an output node of each respective first and second driver. A resistive load includes a first terminal coupled to the first-driver output node and includes a second terminal coupled to the second-driver output node. A sampling circuit generates an indication of an impedance of at least one of the output transistors of the first and second drivers.
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公开(公告)号:US10187101B2
公开(公告)日:2019-01-22
申请号:US15384305
申请日:2016-12-19
Applicant: Texas Instruments Incorporated
Inventor: Swaminathan Sankaran , Bradley Allen Kramer , Baher S. Haroun
Abstract: A regenerative differential receiver includes, for example, a transformer arranged to receive a modulated differential signal. A first detector is arranged to source a first output current for indicating a first power level in response to falling voltage of a first line of the modulated differential signal. A second detector is arranged to sink a second output current for indicating a second power level in response to rising voltage of a first line of the modulated differential signal. A cross-coupled latch is arranged to latch a state in response to the first and second power levels. The cross-coupled latch provides, for example, weak non-linear regeneration for increasing receiver gain and maximum operating frequencies.
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公开(公告)号:US20180372508A1
公开(公告)日:2018-12-27
申请号:US16056275
申请日:2018-08-06
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Arup Polley , Srinath Ramaswamy , Baher S. Haroun , Rajarshi Mukhopadhyay
Abstract: A first amplifier has an input to receive a Hall-signal output current from a first Hall element and has an output to output feedback current in response to the received Hall-signal output current. The Hall-signal output current is impeded by an impedance of the first Hall element. The feedback current is coupled to counterpoise the Hall-signal output current at the input, and a voltage at the output is an amplified Hall output signal. A second amplifier generates a high-frequency portion output signal in response to a difference between the amplified Hall output signal and a Hall-signal output signal from a second Hall element. A filter reduces high-frequency content of the high-frequency portion output signal and generates an offset correction signal. A third amplifier generates a corrected Hall signal in response to a difference between the amplified Hall output signal and the offset correction signal.
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公开(公告)号:US20180175835A1
公开(公告)日:2018-06-21
申请号:US15384305
申请日:2016-12-19
Applicant: Texas Instruments Incorporated
Inventor: Swaminathan Sankaran , Bradley Allen Kramer , Baher S. Haroun
IPC: H03K3/356
CPC classification number: H04B1/24 , H04B1/18 , H04L25/026 , H04L25/0268
Abstract: A regenerative differential receiver includes, for example, a transformer arranged to receive a modulated differential signal. A first detector is arranged to source a first output current for indicating a first power level in response to falling voltage of a first line of the modulated differential signal. A second detector is arranged to sink a second output current for indicating a second power level in response to rising voltage of a first line of the modulated differential signal. A cross-coupled latch is arranged to latch a state in response to the first and second power levels. The cross-coupled latch provides, for example, weak non-linear regeneration for increasing receiver gain and maximum operating frequencies.
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公开(公告)号:US20180038912A1
公开(公告)日:2018-02-08
申请号:US15783365
申请日:2017-10-13
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vig
IPC: G01R31/3177 , G01R31/3185 , G01R31/317
CPC classification number: G01R31/3177 , G01R31/31727 , G01R31/318555
Abstract: IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.
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公开(公告)号:US20170363693A1
公开(公告)日:2017-12-21
申请号:US15186383
申请日:2016-06-17
Applicant: Texas Instruments Incorporated
Inventor: Arup Polley , Srinath Ramaswamy , Baher S. Haroun , Rajarshi Mukhopadhyay
CPC classification number: G01R33/0029 , G01R33/075 , H03F3/38 , H03F3/45995
Abstract: A high bandwidth Hall sensor includes a high bandwidth path and a low bandwidth path. The relatively high offset (from sensor offset) of the high bandwidth path is estimated using a relatively low offset generated by the low bandwidth path. The relatively high offset of the high bandwidth path is substantially reduced by combining the output of the high bandwidth path with the output of the low bandwidth path to generate a high bandwidth, low offset output. The offset can be further reduced by including transimpedance amplifiers in the high bandwidth sensors to optimize the frequency response of high bandwidth Hall sensor.
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公开(公告)号:US20170363445A1
公开(公告)日:2017-12-21
申请号:US15186394
申请日:2016-06-17
Applicant: Texas Instruments Incorporated
Inventor: Arup Polley , Srinath Ramaswamy , Baher S. Haroun , Rajarshi Mukhopadhyay
IPC: G01D5/14
CPC classification number: G01D5/142 , G01D3/0365 , G01D5/145
Abstract: A high bandwidth Hall sensor includes, for example, a Hall element for generating a first polarity Hall-signal output current. An amplifier receives, at a first input, the first polarity Hall-signal output current and outputs a feedback current of a second polarity opposite the first polarity in response. The feedback current is coupled to the first input, and the feedback current suppresses an instantaneous voltage generated by the first polarity first Hall element output current at the first input. In an embodiment, the feedback current suppresses the instantaneous voltage generated by first polarity Hall element output current such that the effects of the Hall element source impedance are reduced.
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