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公开(公告)号：US11567107B2
公开(公告)日：2023-01-31
申请号：US17138977
申请日：2020-12-31
IPC分类号： G01R15/20
摘要： A system comprises first and second Hall-effect sensors and an amplifier. The first Hall-effect sensor has a first bias current direction parallel to a first direction, a pair of first bias input terminals spaced along the first direction, and a pair of first sense output terminals spaced along an orthogonal second direction. The second Hall-effect sensor has a second bias current direction parallel to the second direction, a pair of second bias input terminals spaced along the second direction, and a pair of second sense output terminals connected out of phase with the first sense terminals. The amplifier has a pair of amplifier input terminals coupled to the first and second sense terminals.
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公开(公告)号：US11002563B2
公开(公告)日：2021-05-11
申请号：US16844547
申请日：2020-04-09
摘要： A first amplifier has an input to receive a Hall-signal output current from a first Hall element and has an output to output feedback current in response to the received Hall-signal output current. The Hall-signal output current is impeded by an impedance of the first Hall element. The feedback current is coupled to counterpoise the Hall-signal output current at the input, and a voltage at the output is an amplified Hall output signal. A second amplifier generates a high-frequency portion output signal in response to a difference between the amplified Hall output signal and a Hall-signal output signal from a second Hall element. A filter reduces high-frequency content of the high-frequency portion output signal and generates an offset correction signal. A third amplifier generates a corrected Hall signal in response to a difference between the amplified Hall output signal and the offset correction signal.
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公开(公告)号：US10985729B2
公开(公告)日：2021-04-20
申请号：US16235512
申请日：2018-12-28
摘要： A pressure sensor apparatus is disclosed. The pressure sensor apparatus includes a bulk acoustic wave (BAW) die having a die interface side and a pressure contact side, a sensor BAW resonator and a reference BAW resonator disposed on the die interface side of the BAW die, a control circuit die coupled to the die interface side of the BAW die via an attachment layer, and an extended opening on the pressure contact side that extends into a depth of the BAW die and is generally aligned with the sensor BAW resonator, the extended opening being configured to translate an external pressure on the pressure contact side onto the sensor BAW resonator.
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公开(公告)号：US20210096442A1
公开(公告)日：2021-04-01
申请号：US16586644
申请日：2019-09-27
摘要： In described examples, a system (e.g., a security system or a vehicle operator assistance system) is configured to configure a phased spatial light modulator (SLM) to generate a diffraction pattern. A coherent light source is optically coupled to direct coherent light upon the SLM. The SLM is configured to project diffracted coherent light toward a region of interest. An optical element is configured to focus the diffracted coherent light toward the at least one region of interest.
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公开(公告)号：US10901034B2
公开(公告)日：2021-01-26
申请号：US16795842
申请日：2020-02-20
发明人： Lee D. Whetsei , Baher S. Haroun
IPC分类号： G01R31/3177 , G01R31/26 , G01R31/3185 , G01R31/317
摘要： This disclosure describes a novel method and apparatus for testing TSVs within a semiconductor device. According to embodiments illustrated and described in the disclosure, a TSV may be tested by stimulating and measuring a response from a first end of a TSV while the second end of the TSV held at ground potential. Multiple TSVs within the semiconductor device may be tested in parallel to reduce the TSV testing time according to the disclosure.
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公开(公告)号：US20200292681A1
公开(公告)日：2020-09-17
申请号：US16835432
申请日：2020-03-31
发明人： Nirmal C. Warke , David P. Magee , Baher S. Haroun
摘要： Described example aspects include an integrated circuit includes a timing controller configured to select a selected time slot in a measurement period having a plurality of time slots and a transmit driver configured to provide a transmit signal in accordance with the selected time slot, in which the transmit signal is transmitted to an optical transmitter. The integrated circuit also includes a range estimator configured to receive a received signal after the selected time slot from an optical receiver that is configured to receive a reflection of light transmitted by the optical transmitter off an object, the range estimator configured to determine an estimated distance of the object based on the received signal.
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公开(公告)号：US10698108B2
公开(公告)日：2020-06-30
申请号：US15681468
申请日：2017-08-21
发明人： David P. Magee , Nirmal C. Warke , Baher S. Haroun
IPC分类号： G01C3/08 , G01S17/10 , G01S17/42 , G01S17/26 , G01S7/484 , G01S7/4863 , G01S7/4865
摘要： An optical distance measuring system includes a transmitter and a receiver. The transmitter is configured to generate a first optical waveform and direct the first optical waveform toward a first scan point within a field of view (FOV). The receiver is configured to receive the first optical waveform reflected off a first object within the FOV, direct the first optical waveform reflected off the first object to a first photodiode group of an array of photodiode elements, and determine a distance to the first object based on a time of flight of the first optical waveform from the transmitter to the first object and back to the receiver.
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公开(公告)号：US10698066B2
公开(公告)日：2020-06-30
申请号：US15952521
申请日：2018-04-13
发明人： Arup Polley , Srinath Ramaswamy , Baher S. Haroun
摘要： In described examples, a Hall effect sensor includes a primary Hall effect sensor element and an auxiliary Hall effect sensor element. A known magnetic field is applied to the auxiliary Hall effect sensor to produce an auxiliary Hall voltage used in a feedback loop to control the bias current of the auxiliary Hall effect sensor to maintain the auxiliary Hall voltage approximately constant over a range of temperature and other factors. A bias current for the primary Hall effect sensor is controlled to track the bias current of the auxiliary Hall effect sensor to maintain the sensitivity of the primary Hall effect sensor approximately constant over the same range of temperature and other factors.
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公开(公告)号：US20190317175A1
公开(公告)日：2019-10-17
申请号：US15952521
申请日：2018-04-13
发明人： Arup Polley , Srinath Ramaswamy , Baher S. Haroun
摘要： In described examples, a Hall effect sensor includes a primary Hall effect sensor element and an auxiliary Hall effect sensor element. A known magnetic field is applied to the auxiliary Hall effect sensor to produce an auxiliary Hall voltage used in a feedback loop to control the bias current of the auxiliary Hall effect sensor to maintain the auxiliary Hall voltage approximately constant over a range of temperature and other factors. A bias current for the primary Hall effect sensor is controlled to track the bias current of the auxiliary Hall effect sensor to maintain the sensitivity of the primary Hall effect sensor approximately constant over the same range of temperature and other factors.
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公开(公告)号：US09817070B2
公开(公告)日：2017-11-14
申请号：US15134877
申请日：2016-04-21
发明人： Lee D. Whetsel , Baher S. Haroun , Brian J. Lasher , Anjali Vij
IPC分类号： G01R31/3177 , G01R31/3185 , G01R31/317
CPC分类号： G01R31/3177 , G01R31/31727 , G01R31/318555
摘要： IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.
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