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    Methods and devices for optically determining a characteristic of a substance
    61.
    发明授权
    Methods and devices for optically determining a characteristic of a substance 有权
    用于光学确定物质特征的方法和装置

    公开(公告)号：US09103767B2

    公开(公告)日：2015-08-11

    申请号：US14293654

    申请日：2014-06-02

    Applicant: Halliburton Energy Services, Inc.

    Inventor： Robert Freese ,  Christopher Michael Jones ,  David Perkins ,  Michael Simcock ,  William Soltmann

    IPC: G01N21/00 ,  G01N21/17 ,  G01J3/02 ,  G01J3/28 ,  G01N21/27 ,  G01N21/31 ,  G06E3/00 ,  G01J3/12

    CPC classification number: G01N21/17 ,  G01J3/0294 ,  G01J3/28 ,  G01J2003/1226 ,  G01N21/274 ,  G01N21/31 ,  G01N2021/3137 ,  G01N2021/3174 ,  G06E3/001

    Abstract: Using an optical computing device includes optically interacting electromagnetic radiation with a sample and a first integrated computational element arranged within a primary channel, optically interacting the electromagnetic radiation with the sample and a second integrated computational element arranged within a reference channel, producing first and second modified electromagnetic radiations from the first and second integrated computational elements, respectively, receiving the first modified electromagnetic radiation with a first detector, and receiving the second modified electromagnetic radiation with a second detector, generating a first output signal with the first detector and a second output signal with the second detector, and computationally combining the first and second output signals with a signal processor to determine the characteristic of interest of the sample.

    Abstract translation: 使用光学计算设备包括光学相互作用的电磁辐射与样品和布置在主通道内的第一集成计算元件，将电磁辐射与样品光学相互作用，以及布置在参考通道内的第二集成计算元件，产生第一和第二修改 分别从第一和第二集成计算元件接收第一修改的电磁辐射与第一检测器的电磁辐射，以及用第二检测器接收第二修改的电磁辐射，用第一检测器产生第一输出信号和第二输出信号 并且将第一和第二输出信号与信号处理器进行计算结合，以确定样本的感兴趣的特性。

    Optical module and electronic apparatus
    62.
    发明授权
    Optical module and electronic apparatus 有权
    光模块和电子设备

    公开(公告)号：US09019611B2

    公开(公告)日：2015-04-28

    申请号：US14260759

    申请日：2014-04-24

    Applicant: Seiko Epson Corporation

    Inventor： Kazunori Sakurai

    IPC: G02B27/00 ,  G02B5/28 ,  G01J3/50 ,  G01J3/51 ,  G02B26/00 ,  G01N21/3504 ,  G01N21/25 ,  G01N21/552 ,  G01N21/65 ,  G01J3/12

    CPC classification number: G02B5/28 ,  G01J3/50 ,  G01J3/51 ,  G01J2003/1226 ,  G01N21/251 ,  G01N21/255 ,  G01N21/3504 ,  G01N21/554 ,  G01N21/658 ,  G02B26/001

    Abstract: An optical module (colorimetry sensor) includes an interference filter, and a transparent substrate to which a first substrate of the interference filter is fixed, having a second thermal expansion coefficient which has a value different from a first thermal expansion coefficient. The interference filter is fixed to the transparent substrate through an adhesive layer made of gel-like resin, and the adhesive layer alleviates stress generated due to a difference in the thermal expansion coefficients between the interference filter and the transparent substrate.

    Abstract translation: 光学模块（比色度传感器）包括干涉滤光器和固定有干涉滤光器的第一基板的透明基板，具有与第一热膨胀系数不同的第二热膨胀系数。 干涉滤光器通过由凝胶状树脂制成的粘合层固定在透明基板上，并且粘合剂层减轻由于干涉滤光片和透明基板之间的热膨胀系数的差异而产生的应力。

    Filter wheel spectrometer
    64.
    发明授权
    Filter wheel spectrometer 有权
    过滤轮光谱仪

    公开(公告)号：US08937720B2

    公开(公告)日：2015-01-20

    申请号：US13916683

    申请日：2013-06-13

    Applicant: Koninklijke Philips N.V.

    Inventor： James Torrance Russell

    IPC: G01N21/25 ,  G01J3/02 ,  G01J3/36 ,  G01J3/12 ,  G01N21/35 ,  G01N21/31

    CPC classification number: G01N21/255 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0235 ,  G01J3/36 ,  G01J2003/1213 ,  G01J2003/1226 ,  G01N21/3504 ,  G01N2021/317

    Abstract: A filter wheel and a spectrometer including the filter wheel are disclosed. The filter wheel has a first support structure on which a first plurality of filters are mounted and a second support structure on which at least one filter is provided. A radiation source generates a radiation beam, and a beam splitter splits the radiation beam into a first detection path and a second detection path. The first plurality of filters are selectively movable into the first detection path. The at least one filter on the second support structure is arranged to be disposed in the second detection path. The spectrometer includes a first radiation detector that detects radiation that passes through the selected filter in the first detection path, and a second radiation detector that detects radiation passing through the filter in the second detection path.

    Abstract translation: 公开了一种滤光轮和包括滤光轮的光谱仪。 滤光轮具有第一支撑结构，第一多个滤光器安装在该第一支撑结构上，第二支撑结构设置有至少一个滤光片。 辐射源产生辐射束，并且分束器将辐射束分裂成第一检测路径和第二检测路径。 第一多个滤波器可选择性地移动到第一检测路径中。 第二支撑结构上的至少一个过滤器布置成设置在第二检测路径中。 光谱仪包括：第一辐射检测器，其检测穿过第一检测路径中的所选滤波器的辐射;以及第二辐射检测器，其检测通过第二检测路径中的滤波器的辐射。

    RADIATION THERMOMETER
    65.
    发明申请
    RADIATION THERMOMETER 审中-公开

    公开(公告)号：US20140346377A1

    公开(公告)日：2014-11-27

    申请号：US14365510

    申请日：2012-11-29

    Applicant: Land Instruments International Limited

    Inventor： Jonathan Raffe Willmott ,  Susan Fiona Turner ,  Malcolm Ian Gillott

    IPC: G01J5/08

    CPC classification number: G01J5/0806 ,  G01J3/50 ,  G01J3/51 ,  G01J5/0265 ,  G01J5/029 ,  G01J5/0809 ,  G01J5/0831 ,  G01J5/0834 ,  G01J5/0859 ,  G01J5/089 ,  G01J5/0896 ,  G01J2003/1226 ,  G01J2005/0077

    Abstract: A radiation thermometer is provided, comprising: a thermal radiation detector assembly having an operative surface area responsive to thermal radiation of a first wavelength; a focussing optics assembly adapted to focus both thermal radiation of the first wavelength and visible light of a second wavelength along an optical axis, the focussing optics assembly being configured to form a focussed image of the operative surface area of the thermal radiation detector assembly on a focal plane outside the radiation thermometer, the focussed image of the operative surface area defining a target region from which the thermal radiation detector assembly detects thermal radiation; a visible light source assembly adapted to exhibit an illuminated pattern of visible light of the second wavelength, the visible light source assembly comprising at least one visible light source and a mask through which light from the at least one visible light source is arranged to pass, the mask having one or more substantially opaque portions and one or more translucent portions arranged to define the illuminated pattern; and a radiation splitter adapted to deflect one of thermal radiation of the first wavelength and visible light of the second wavelength, and to transmit the other, or to deflect both wavelengths differently, the radiation splitter being configured so as to pass the thermal radiation along a first optical path from the focussing optics assembly to the thermal radiation detector assembly, and to pass the visible light along a second optical path from the visible light source assembly to the focussing optics assembly.The length of the first optical path is substantially equal to that of the second optical path, such that the focussing optics additionally forms a focussed image of the illuminated pattern of the visible light source assembly substantially on the focal plane, the illuminated pattern being configured to mark the location of the target region in the focal plane. The illuminated pattern includes a primary illumination region and at least one secondary illumination region, the primary illumination region having substantially the same lateral extent as the operative surface area of the thermal radiation detector assembly and being positioned such that the image of the primary illumination region formed at the focal plane falls substantially within and is substantially co-incident with the target region from which the thermal radiation detector assembly detects thermal radiation, and the at least one secondary illumination region being configured such that the image of the or each secondary illumination region formed at the focal plane is located outside the target region.

    Passive multi-band aperture filters and cameras therefrom
    68.
    发明授权
    Passive multi-band aperture filters and cameras therefrom 有权
    被动多频带孔径滤波器及相机

    公开(公告)号：US08749636B2

    公开(公告)日：2014-06-10

    申请号：US13181019

    申请日：2011-07-12

    Applicant: Kevin L. Brown

    Inventor： Kevin L. Brown

    IPC: H04N5/33 ,  F21V9/04

    CPC classification number: G01J3/2823 ,  G01J2003/1226 ,  H04N5/332

    Abstract: A multi-band aperture filter for optically coupling to a focal plane array (FPA) of a camera includes a substrate, and a first spectral coating on a first surface of the substrate that passes both a first longer and a second shorter wavelength band. A second spectral coating that passes the longer wavelength band and blocks the shorter wavelength band is on an outer annulus region, but not on an inner region on the first surface or a second surface of the substrate. The second spectral coating provides a larger aperture area for the longer wavelength band as compared to an aperture area for the shorter wavelength band to passively realize different F-numbers for the bands to provide substantially matched beam spot sizes on the detector array for the longer wavelength band and the shorter wavelength band, such as a long-wave infrared (LWIR) band and a mid-wave IR (MWIR) band.

    Abstract translation: 用于光学耦合到照相机的焦平面阵列（FPA）的多频带孔径滤光器包括基板和在基板的第一表面上通过第一较短波段和第二较短波长带的第一光谱涂层。 通过较长波长带并阻挡较短波长带的第二光谱涂层位于外环面区域上，而不在基板的第一表面或第二表面上的内部区域上。 与较短波长带的开口面积相比，第二光谱涂层为较长波长带提供较大的开口面积，以被动地实现波段的不同F数，以便在探测器阵列上为较长波长提供基本匹配的光束尺寸 带和较短的波长带，例如长波红外（LWIR）波段和中波IR（MWIR）波段。

    DEVICE FOR THE HIGH-RESOLUTION MAPPING AND ANALYSIS OF ELEMENTS IN SOLIDS
    69.
    发明申请
    DEVICE FOR THE HIGH-RESOLUTION MAPPING AND ANALYSIS OF ELEMENTS IN SOLIDS 审中-公开
    用于高分辨率映射和固体中元素分析的设备

    公开(公告)号：US20140085631A1

    公开(公告)日：2014-03-27

    申请号：US13820985

    申请日：2011-09-06

    Applicant: Jean-Luc Lacour ,  Nadége Caron ,  Kévin Beranger

    Inventor： Jean-Luc Lacour ,  Nadége Caron ,  Kévin Beranger

    IPC: G01N21/71

    CPC classification number: G01N21/718 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/443 ,  G01J2003/1226

    Abstract: A device is provided for mapping and for analysis of at least one element of interest included in a solid sample by laser-induced plasma optical emission spectrometry, enabling a high-resolution mapping, notably of elements such as hydrogen and oxygen, and is applicable to the fields of the nuclear industry and of aeronautics, and notably offers the advantage of not requiring costly installations. In one of the embodiments of the invention, a simultaneous mapping of elements such as hydrogen, oxygen and/or lithium is notably achievable.

    Abstract translation: 提供了一种用于通过激光诱导等离子体发射光谱法对固体样品中包含的至少一个感兴趣的元件进行映射和分析的装置，能够实现高分辨率的映射，特别是诸如氢和氧的元素，并且适用于 核工业和航空领域，并且特别提供了不需要昂贵的安装的优点。 在本发明的一个实施例中，特别可以实现诸如氢，氧和/或锂之类的元件的同时映射。

    IMAGING DEVICE AND IMAGING METHOD
    70.
    发明申请
    IMAGING DEVICE AND IMAGING METHOD 审中-公开
    成像装置和成像方法

    公开(公告)号：US20130321640A1

    公开(公告)日：2013-12-05

    申请号：US13875629

    申请日：2013-05-02

    Applicant: SONY CORPORATION

    Inventor： TATSUYA NAKATSUJI

    IPC: H04N5/238

    CPC classification number: H04N5/238 ,  G01J2003/1226 ,  G01J2003/1243 ,  G01J2003/1282 ,  H04N5/2254

    Abstract: There is provided an imaging device including an image sensor that performs photoelectric conversion on subject light to generate an image signal, a photographing optical system that forms an image of the subject light on the image sensor, and a first optical member that transmits the subject light incident on the image sensor via the photographing optical system. The first optical member changes transmittance of a first band of the subject light according to an angle with respect to an optical axis of the photographing optical system.

    Abstract translation: 提供了一种成像装置，其包括对被摄体光进行光电转换以产生图像信号的图像传感器，在图像传感器上形成被摄体光的图像的拍摄光学系统，以及透射被摄体光的第一光学部件 通过摄影光学系统对图像传感器发生事件。 第一光学构件根据相对于摄影光学系统的光轴的角度改变被摄体光的第一带的透射率。

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